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Instruction Manual
IM3533
 
IM3533-01
LCR METER
September 2012 Revised edition 1 IM3533A981-01 12-09H

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Summary of Contents for Hioki IM3533

  • Page 1 Instruction Manual IM3533   IM3533-01 LCR METER September 2012 Revised edition 1 IM3533A981-01 12-09H...
  • Page 3: Table Of Contents

    When LCR Mode ....... 37  Setting the method for determining the When ANALYZER Mode measurement range (IM3533-01 only) ........ 39 (HOLD, AUTO, JUDGE SYNC) ....88  When TRANSFORMER Mode ... 41 ït Low Z High Accuracy Mode ..... 96 4.3.6 Setting the Measurement Speed ..98...
  • Page 4 Absolute Value (ABS) Chapter 5 ANALYZER Function (Absolute Value Mode) ......104  Setting the Upper or Lower Limit Value as a (IM3533-01) Percentage (%) Relative to a Reference Value (Percentage Mode) ...... 105 About ANALYZER function ....149 ...
  • Page 5 Contents 5.3.9 Disabling Key Operation Configuring CONTINUOUS (Key-lock Function) ......186 Measurement Application Settings .. 213 5.3.10Enabling Trigger Input for during Mea- 7.5.1 Setting the Display Timing ....213 surement and Setting the Valid Edge of 7.5.2 Setting the LCD to ON/OFF ..... 214 Trigger Input ........
  • Page 6 Signal function details ......316 12.2 Timing Chart ........318 Appendix1 Measurement Parameters and 12.2.1LCR Mode ........318 Calculation Formula ....A 1 12.2.2ANALYZER Mode (IM3533-01 only) 321 Appendix2 Measurement of High Impedance 12.2.3TRANSFORMER Mode ....322 Components ......A 3 12.2.4CONTINUOUS Measurement Mode 323 Appendix3 Measurement of In-circuit Compo- 12.3 Internal Circuitry .......325...
  • Page 7 Contents Appendix4.2Countermeasures Against Noise from the measurement Cables A 6 Appendix5 Supplying DC Bias....A 7 Appendix5.1How to Supply a DC Bias Voltage ........A 7 Appendix5.2How to Supply a DC Bias Current ........A 9 Appendix6 The Residual Charge Protection Function ........A 10 Appendix7 Series Equivalent Circuit Mode and Parallel Equivalent Circuit Mode........A 11...
  • Page 8 Contents...
  • Page 9: Introduction

    Introduction Introduction Thank you for purchasing the HIOKI Model IM3533, IM3533-01 LCR Meter. To obtain maximum perfor- mance from the instrument, please read this manual first, and keep it handy for future reference. Verifying Package Contents When you receive the instrument, inspect it carefully to ensure that no damage occurred during shipping.
  • Page 10 Verifying Package Contents Options For more information, contact the store (distributor) from which you purchased the instrument or your nearest HIOKI sales office. 9140-10 4-terminal Probe L2000 4-terminal Probe Alligator-clip-type measure- ment probes. These general- purpose dual-electrode clips fit a wide range of conductor thicknesses.
  • Page 11: Safety Information

    Safety Information Safety Information This instrument is designed to comply with IEC 61010 Safety Standards, and has been thoroughly tested for safety prior to shipment. However, mishandling during use could result in injury or death, as well as damage to the instrument. However, using the instrument in a way not described in this manual may negate the provided safety features.
  • Page 12 Safety Information Notation Symbols in this manual Indicates the prohibited action.  p. ) Indicates the location of reference information. Indicates that descriptive information is provided below. Menus, commands, dialogs, buttons in a dialog, and other names on the screen and the keys are indicated in brackets.
  • Page 13: Operating Precautions

    Preliminary Checks Before using the instrument for the first time, verify that it operates normally to ensure the no damage occurred during storage or shipping. If you find any damage, contact your authorized Hioki distributor or reseller. Before using the instrument, make sure that the insulation on the voltage cords is undamaged and that no bare conductors are improperly exposed.
  • Page 14 Operating Precautions Shipping precautions Hioki disclaims responsibility for any direct or indirect damages that may occur when this instrument has been combined with other devices by a systems integrator prior to sale, or when it is resold. Handling the Instrument •...
  • Page 15 Operating Precautions About Handling of Cords, Fixtures and Temperature probes • For safety reasons, disconnect the power cord when the instrument is not used.To avoid damaging the power cord, grasp the plug, not the cord, when unplugging it from the power outlet.
  • Page 16 Never use abrasives or solvent cleaners. • Hioki shall not be held liable for any problems with a computer system that arises from the use of this LCR Application Disk, or for any problem related to the purchase of a Hioki product.
  • Page 17: Chapter 1 Overview

    DC resistance measurement with temperature cor- rection, and a ANALYZER function (IM3533-01 only) make the IM3533 and IM3533-01 excellent choices for use in a wide range of applications, from transformer and coil production lines to research and development.
  • Page 18: Names And Functions Of Parts

    1.2 Names and Functions of Parts 1.2 Names and Functions of Parts Front (Example: IM3533) Measurement LEDs Judgment Result LCD Display Indication LEDs Lights during measurement. This is a touch panel display. Press the keys displayed on the Indicates the judgment results for screen to operate the instrument.
  • Page 19 1.2 Names and Functions of Parts Rear Interface port Power Switch EXT I/O Connector (Main power) Install optional interfaces. Connect to a PLC or I/O board to (p. 263), Communication Instruction Manual Turns the power on and off. control measurement start, and to (LCR Application Disk) (p.
  • Page 20: Screen Configuration And Operation

    1.3 Screen Configuration and Operation 1.3 Screen Configuration and Operation This instrument allows you to use a touch panel to set and change all measurement conditions. Gently touch a key on the screen to select the item or numerical value set for that key. A selected key turns black.
  • Page 21: Measurement Mode Selection Screen

    Displays the measurement screen for the selected mode. Select the measurement mode. LCR mode (p. 45) ANALYZER mode (IM3533-01 only) (p. 149) TRANSFORMER mode (p. 193) CONTINUOUS measurement mode (p. 209) After changing the measurement mode, check all settings (including compensation) before...
  • Page 22: Advanced Settings Screen

    Procedure Measurement Screen Press Configure settings for LCR mode, TRANSFORMER mode, and CONTINUOUS measurement mode. On the IM3533-01, you can also configure ANALYZER mode settings. LCR Mode Basic setting Measurement frequency setting (p. 50) Measurement signal level setting (p. 52) Voltage and current limit settings (p.
  • Page 23 1.3 Screen Configuration and Operation DC resistance measurement setting Temperature correction function setting (p. 81) DC delay setting (p. 83) Adjustment delay setting(p. 85) Line frequency setting (p. 87) Measurement range setting (p. 88) Measurement range setting (p. 97) Measurement speed setting (p. 98) LCR mode measurement screen is displayed.
  • Page 24 1.3 Screen Configuration and Operation Application settings Measurement result judgment setting (p. 100) Range synchronization function setting (p. 120) Waveform averaging function setting (p. 128) HIGH-Z reject function setting (p. 130) Contact check function setting (p. 132) I/O output setting of judgment results (p.
  • Page 25 1.3 Screen Configuration and Operation Checking the setting information You can check the settings on the measurement screen. The key display will vary depending on what type of information is being displayed. Displays information regarding the AC signal. Displays information regarding the DC signal.
  • Page 26 1.3 Screen Configuration and Operation ANALYZER Mode (IM3533-01 only) Basic setting Measurement parameter setting(p. 150) Trigger setting (p. 151) Display timing setting(p. 152) Trigger delay setting (p. 153) Sweep point setting (p. 155) Measurement signal level setting (p. 158) ANALYZER mode measurement screen is displayed.
  • Page 27 1.3 Screen Configuration and Operation Application settings Trigger synchronous output function (p. 171) Waveform averaging function setting (p. 173) HIGH-Z reject function setting (p. 175) Contact check function setting (p. 177) Save settings of measurement results (p. 177) AUTO range limit function (p. 180) Backlight setting (p.
  • Page 28 1.3 Screen Configuration and Operation TRANSFORMER Mode Basic setting Measurement frequency setting (p. 50) Measurement signal level setting (p. 52) Voltage and current limit settings (p. 56) Measurement range setting (p. 62) Measurement speed setting (p. 73) Average setting (p. 74) TRANSFORMER mode measurement screen is displayed.
  • Page 29 1.3 Screen Configuration and Operation Application settings Measurement result judgment setting (p. 199) Range synchronization function setting (p. 120) Waveform averaging function setting (p. 128) HIGH-Z reject function setting (p. 130) Contact check function setting (p. 132) I/O output setting of judgment results (p.
  • Page 30 1.3 Screen Configuration and Operation Checking the setting information You can check the settings on the measurement screen. Displays the transformer model. Displays information regarding the AC signal. The key display will vary depending on what type of information is being displayed. When displaying AC signal (AC) information When displaying a transformer model...
  • Page 31 1.3 Screen Configuration and Operation CONTINUOUS Measurement Mode Basic setting Removes item from targets for continuous measurement (p. 210) Sets item as target for continuous measurement (p. 210) Removes all items from targets for continuous measurement(p. 210) Sets all items as targets for continuous measurement (p.
  • Page 32: Compensation Settings Screen

    1.3 Screen Configuration and Operation 1.3.4 Compensation Settings Screen Procedure Measurement Screen Press Set the compensation condition. Open circuit compensation setting (p. 215) Short circuit compensation setting (p. 224) Load circuit compensation setting (p. 232) Cable length compensation setting (p. 245) Scaling setting (p.
  • Page 33: System Settings Screen

    1.3 Screen Configuration and Operation 1.3.5 System Settings Screen Procedure Measurement Screen Press To set the details of the system. Interface type settings RS-232C Setting (Ref to Communication Instruction Manual (LCR Application Disk)) (Setting only available when the Z3001 is installed.) GP-IB Setting (Ref to Communication Instruction Manual (LCR...
  • Page 34 1.3 Screen Configuration and Operation Check the version of the instrument (p. 264) Measurement screen is displayed. Checking the Display Screen Panel test (p. 265) Panel calibration (p. 266) Display test (p. 268) ROM/RAM test (p. 270) I/O test (p. 271) Measurement screen is displayed.
  • Page 35: Save Settings Screen

    1.3 Screen Configuration and Operation 1.3.6 Save Settings Screen Procedure Measurement Screen Press Set the save destination and type. Save the measurement condition Saves the setting conditions (p. 293) Switches operation buttons. (p. 275) Displays the screen immediately above (p. 275) Selects a file (p.
  • Page 36: Parameter Settings Screen

    1.3 Screen Configuration and Operation 1.3.7 Parameter Settings Screen This screen is for selecting the measurement parameters to display. "4.1.2 Setting Display Parameters" (p. 47), "Appendix7 Series Equivalent Circuit Mode and Parallel Equivalent Circuit Mode"(p. A11) Procedure Press the key to set. Select parameters.
  • Page 37: Chapter 2 Measurement Preparations

    2.1 Preparation Flowchart Installing the Instrument (p. 5) Connecting the Power Cord (p. 31) Connect measurement cables, optional Hioki probes or test fixture (p. 32) Check that the instrument’s power switch is turned off. 9478 Sheath Type Temperature Probe (Option)
  • Page 38: Pre-Operation Inspection

    (p. 5) before use. Before using the instrument for the first time, verify that it operates normally to ensure that no damage occurred during storage or shipping. If you find any damage, contact your authorized Hioki distributor or reseller.
  • Page 39: Connecting The Power Cord

    2.3 Connecting the Power Cord 2.3 Connecting the Power Cord Be sure to read the "Before Turning Power On" (p. 6), "About Handling of Cords, Fixtures and Temperature probes" (p. 7) before connecting power. Connect the power cord to the power inlet on the instrument, and plug it into an outlet. Power inlet Check that the instrument’s power switch is turned off.
  • Page 40: Connecting The Measurement Cables, Probes, Or Fixture

    Cables, Probes, or Fixture Be sure to read the "About Handling of Cords, Fixtures and Temperature probes" (p. 7) before connecting measurement cables, probes or test fixture. Connect your measurement cables, optional Hioki probes or test fixture to the measurement terminal Refer to for details.
  • Page 41: Connecting A Temperature Probe

    2.5 Connecting a Temperature Probe 2.5 Connecting a Temperature Probe Be sure to read the "About Handling of Cords, Fixtures and Temperature probes" (p. 7) before connecting measurement cables, probes or test fixture. Rear Check that the instrument’s power switch is turned off.
  • Page 42: Connecting An Interface

    2.6 Connecting an Interface 2.6 Connecting an Interface Be sure to read the "Input modules (option)" (p. 8) before connecting mea- surement cables, probes or test fixture. Read this section before installing or replacing an optional interface or removing the interface and using the instrument without it.
  • Page 43: Turning The Power On And Off

    2.7 Turning the Power On and Off 2.7 Turning the Power On and Off Connect the power cord and voltage and current measurement cables before turning the main power on. Power switch Turning main power on Turn the POWER switch on ( To ensure that measurements fulfill the degree of accuracy described in the...
  • Page 44 2.7 Turning the Power On and Off Be on standby ON the main power in the state, hold down the front Standby Key 2 seconds approximately. Lights red What is the standby state? The instrument is in the standby state when measurement has been stopped and the instrument is waiting for STANDBY key input to be detected.
  • Page 45: Chapter 3 Measurement Example

    3.1 When LCR Mode Measurement Chapter 3 Example This chapter provides example measurement scenarios for LCR mode, ANALYZER mode (IM3533-01 only), and TRANSFORMER mode. 3.1 When LCR Mode Measuring a Laminated Ceramic Capacitor Necessary items: 9263 SMD test fixture, Laminated ceramic capacity you want to measure Connect the 9263 SMD test fixture to the measurement terminals.
  • Page 46 3.1 When LCR Mode Connect the test sample to the 9263 SMD test fixture. For the connection procedure of the test sam- ple, refer to the instruction manual supplied with the fixture. Check the measurement results. • When you want to judge the measurement results See: "4.4.1 Judging with Upper and Lower Limit Values (Comparator Measurement Mode)"...
  • Page 47: When Analyzer Mode (Im3533-01 Only)

    3.2 When ANALYZER Mode (IM3533-01 only) In ANALYZER mode, you can sweep through a user-specified range of frequencies. "Chapter 5 ANALYZER Function (IM3533-01)" (p. 149) Measuring Element with Resonance Point Necessary items: 9262 Test fixture, Element you want to measure Connect the 9262 Test Fixture to the measurement terminals.
  • Page 48 3.2 When ANALYZER Mode (IM3533-01 only) Execute the sweep. The sweep is repeated since TRIG is set to REPEAT. • When you want to check the measurement values. See: "5.1.1 Measurement screen" (p. 149)
  • Page 49: When Transformer Mode

    3.3 When TRANSFORMER Mode 3.3 When TRANSFORMER Mode Measuring a transformer’s turn ratio You will need: Switch cable and transformer to measure Wire together the instrument and transformer together as shown below: Primary side Secondary side Primary side Secondary side Set the measurement parameter to Ls and the computation parameter to N (p.
  • Page 50 3.3 When TRANSFORMER Mode Wire together the primary side. Primary side Secondary side Primary side Secondary side Execute the TRIG1 command. Touch and measure the primary side of the transformer. Wire together the secondary side. Primary side Secondary side Primary side Secondary side Execute the TRIG2 command.
  • Page 51 3.3 When TRANSFORMER Mode Check the measurement results. • When you want to judge the measurement results See"6.3 Judging with Upper and Lower Limit Values (Comparator Measurement Mode)" (p. 199) • When you want to save the measurement results See"4.5.8 Saving Measurement Results (Memory function)" (p. 138)
  • Page 52 3.3 When TRANSFORMER Mode...
  • Page 53: Chapter 4 Lcr Function

    4.1 About LCR function Chapter 4 LCR Function 4.1 About LCR function The LCR function allows you to measure the impedance, phase angle, and other items by applying any fre- quency or level (effective value) signal to the element you want to measure. This function is suitable for evalu- ating the passive element of a capacitor, coil, or the like.
  • Page 54 4.1 About LCR function When a measurement value is outside the guaranteed accuracy range, “Reference Value” is displayed in the error display area. When this happens, the cause is likely to be one of the following. Check the guaranteed accuracy range in "14.2 Measurement Range and Accu- racy"...
  • Page 55: Setting Display Parameters

    4.1 About LCR function 4.1.2 Setting Display Parameters You can select up to four measurement parameters to display in any location from 16 types. "1.3.7 Parameter Settings Screen" (p. 28) "Appendix2 Measurement of High Impedance Components"(p. A3) "Appendix7 Series Equivalent Circuit Mode and Parallel Equivalent Circuit Mode"(p. A11) Procedure Example: The first parameter key: Capacitance Cs, The third parameter key: Loss coefficient D...
  • Page 56 4.1 About LCR function Parameter Setting Press Press to confirm the setting. LCR Measurement Screen are set as the parameters. is selected in the parameter setting, a measurement value is not displayed.
  • Page 57: Enlarging Display Of Measurement Values

    4.1 About LCR function 4.1.3 Enlarging Display of Measurement Values The measurement values and comparator decision results can be displayed in enlarged form. This function is convenient when the instrument is used under constant measurement conditions. If the power is turned off when is displayed, will be displayed when the instrument starts the next time you turn the power on.
  • Page 58: Setting Basic Settings Of Measurement Conditions

    4.2 Setting Basic Settings of Measurement Conditions 4.2 Setting Basic Settings of Measurement Conditions 4.2.1 Setting the Measurement frequency Set the frequency of the signal to apply to the test sample. For some test samples, the value may vary depending on the measurement frequency. Procedure Example: Measurement frequency: 1 MHz LCR Measurement Screen...
  • Page 59 4.2 Setting Basic Settings of Measurement Conditions Frequency Setting (Digits) Frequency Setting (Numeric Keypad) Use the numeric keypad to enter the to enter each digit of the frequency. frequency. If you make a mistake during input : Holding down a digit key changes the value continuously. Press the to cancel the input so far, and start again.
  • Page 60: Setting The Measurement Signal Level

    4.2 Setting Basic Settings of Measurement Conditions 4.2.2 Setting the Measurement signal level The value of the test signal level may change according to the sample which is being tested. This instrument is possible to vary the level of the test signal applied to the object under test over a wide range using the following three methods.
  • Page 61 4.2 Setting Basic Settings of Measurement Conditions Measurement Signal Mode Setting To select the measurement signal mode. Open circuit voltage (V) mode (p. 54) Constant voltage (CV) mode (p. 54) Constant current (CC) mode (p. 55) Measurement Signal Level Setting to enter the voltage or current value.
  • Page 62 4.2 Setting Basic Settings of Measurement Conditions About the test signal mode Relationship between the measurement signal mode of the instrument and the sample is as follows. Open circuit voltage (V) mode Constant current (CC) mode This voltage value is the value which is applied across the two terminals of You should select this if you wish the series combination of the object which is being tested and the output to set the current passing through...
  • Page 63 4.2 Setting Basic Settings of Measurement Conditions The impedance ' observed from the generator is as follows:    j15.9 : Output resistance (100 [ Accordingly, the voltage across both leads of the sample is as follows:   ...
  • Page 64: Limiting The Voltage And Current Applied To The Sample (Limit Values)

    4.2 Setting Basic Settings of Measurement Conditions 4.2.3 Limiting the Voltage and Current Applied to the Sample (Limit Values) Depending on the measurement signal level, in some cases it is possible to damage the sample which is being tested by applying to it a voltage or a current greater than its rated value. For this reason, set a limit value to restrict the voltage that can be applied to the test sample or current that can flow to the test sample.
  • Page 65 4.2 Setting Basic Settings of Measurement Conditions Current Limit Setting Select ON/OFF for the limit function. Disables the limit function. Enables the limit function. Current Limit Setting to enter the limit value. Limit range Measurement Limit set Setting range signal mode V, CV Current limit 0.01 mA to 100.00 mA...
  • Page 66: Setting The Dc Bias

    4.2 Setting Basic Settings of Measurement Conditions 4.2.4 Setting the DC bias You can superimpose a DC voltage on the measurement signal during capacitor measurement. Procedure LCR Measurement Screen LCR Basic Settings LCR Basic Settings Press DC Bias Setting Select ON/OFF for the DC bias. Disables DC bias.
  • Page 67 4.2 Setting Basic Settings of Measurement Conditions DC Bias Setting to set the DC level to superimpose. • Settable range : -5.00 V to 5.00 V (Normal mode) -2.50 V to 2.50 V (low Z high accuracy mode) • If you make a mistake during input: press to cancel the input and start again.
  • Page 68: Perform Measurements With User-Defined Timing (Trigger Measurement)

    4.2 Setting Basic Settings of Measurement Conditions 4.2.5 Perform Measurements with User-defined Timing (Trigger Measurement) Triggering is the process of controlling the start and stop of recording by specific signals or conditions (crite- ria). When recording is started or stopped by a specific signal, we say the trigger is "gapplied" or "triggering occurs".
  • Page 69 4.2 Setting Basic Settings of Measurement Conditions Trigger Setting Select the trigger type. Automatically repeats mea- Internal trigger surement. Input the trigger manually via External trigger EXT I/O or from the interface. When is selected There are the following three types of input method for a trigger. •...
  • Page 70: Setting The Measurement Range

    4.2 Setting Basic Settings of Measurement Conditions 4.2.6 Setting the Measurement Range Setting the method for determining the measurement range (AUTO, HOLD, JUDGE SYNC) There are the following three methods for setting the measurement range. The most suitable test range is set automatically. (This allows the most suitable measurement range to be set when measuring, AUTO for example, a test sample whose impedance varies greatly with frequency or...
  • Page 71 4.2 Setting Basic Settings of Measurement Conditions Setting AUTO Ranging Procedure LCR Measurement Screen LCR Basic Settings LCR Basic Settings Press Range Setting Press • The ranges that can be set vary with the fre- quency. (p. 67) • When you want to control the AUTO ranging range: "AUTO range limit function"...
  • Page 72 4.2 Setting Basic Settings of Measurement Conditions AUTO range limit function The AUTO range limit function allows you to limit the AUTO ranging range. Procedure LCR Measurement Screen LCR Basic Settings LCR Basic Settings Press Range Setting Press If the instrument is being used outside the limits of its specification, the suitable range may not be set in auto ranging function.
  • Page 73 4.2 Setting Basic Settings of Measurement Conditions Range Setting Press AUTO Range Limit Range Setting Select the AUTO range lower limit range. Touch to accept the lower limit range. step 4, touch Return to , and select the AUTO range upper limit range. Press to close the setting screen.
  • Page 74 4.2 Setting Basic Settings of Measurement Conditions Setting the Ranging to HOLD Procedure LCR Measurement Screen LCR Basic Settings LCR Basic Settings Press Range Setting Press...
  • Page 75 4.2 Setting Basic Settings of Measurement Conditions To select the measurement range. Range Selection The ranges that can be set vary with the frequency. Select- Frequency able Range Settings screen ranges Entire 0.001 Hz range 10.000 kHz  10.001 kHz 100 m ...
  • Page 76 4.2 Setting Basic Settings of Measurement Conditions • In the case of a test sample whose impedance changes according to the frequency, when testing is being performed with HOLD set, it may happen, when the frequency is changed over, that measurement cannot be continued to be performed upon the same test range. You should change the test range if this happens.
  • Page 77 4.2 Setting Basic Settings of Measurement Conditions Judgment synchronization setting When the judgment synchronization setting is enabled and you want to set the optimal range relative to the comparator or BIN measurement judgment standards, it is necessary to re-set the range with .
  • Page 78 4.2 Setting Basic Settings of Measurement Conditions Range Setting Turn the judgment synchronization setting on or off. Disables the judgment synchronization setting. Enables the judgment synchronization set- ting. Press to close the setting screen. • The ranges that can be set vary with the frequency. (p. 67) •...
  • Page 79: Low Z High Accuracy Mode

    4.2 Setting Basic Settings of Measurement Conditions Low Z High Accuracy Mode In low Z high accuracy mode, an output resistance of 25  is used so that adequate current can flow to the measurement sample, allowing highly accurate measurement. Procedure LCR Measurement Screen LCR Basic Settings...
  • Page 80 4.2 Setting Basic Settings of Measurement Conditions • Low Z high accuracy mode is only available for the 100 m and 1  ranges. Refer to the following. Measurement range to 1 kHz to 10 kHz to 100 kHz to 200 kHz ...
  • Page 81: Setting The Measurement Speed

    4.2 Setting Basic Settings of Measurement Conditions 4.2.7 Setting the Measurement speed The testing speed can be set. The slower the testing speed is, the more accurate are the results. Procedure LCR Measurement Screen LCR Basic Settings LCR Basic Settings Press Measurement Speed Setting To select the measurement speed.
  • Page 82: Displaying Average Values (Averaging Set)

    4.2 Setting Basic Settings of Measurement Conditions 4.2.8 Displaying Average Values (Averaging Set) With the averaging function, the measured values can be averaged. Using this function, it is possible to reduce fluctuations in the measured value display. A rolling average of the tested values over the set number of times for averaging is always calculated backwards from the present.
  • Page 83 4.2 Setting Basic Settings of Measurement Conditions Procedure LCR Measurement Screen LCR Basic Settings LCR Basic Settings Press Number of Averaging Times Setting to enter the number of aver- aging times. Settable range: 1 to 256 times When you want to turn off the averaging function: Press The number of averaging times is set to 001, and the...
  • Page 84: Setting The Delay Time Until Measurement Data Is Captured (Trigger Delay)

    4.2 Setting Basic Settings of Measurement Conditions 4.2.9 Setting the Delay Time until Measurement Data is Captured (Trigger Delay) The delay time period from input of the trigger signal to measurement can be set. With this function it is possi- ble to ensure that testing is started after the connection condition of the object being tested and the test cables has stabilized.
  • Page 85: Applying The Signal To The Sample During Measurement Only (Trigger Synchronous Output Function)

    4.2 Setting Basic Settings of Measurement Conditions 4.2.10 Applying the Signal to the Sample during Measurement Only (Trigger Synchronous Output Function) This function generates measurement signal output after trigger input and applies the signal to the sample only during measurement. You can also set a delay time to ensure that data is acquired after the sample sta- bilizes.
  • Page 86 4.2 Setting Basic Settings of Measurement Conditions Trigger Sync Setting to set the wait time from after the measurement signal is output by applying a trigger to the start of measurement. Settable range: 0.0010 s to 9.9999 s When you want to return the time to the ini- tial state: Press The set time is set to 0.0010 s.
  • Page 87 4.2 Setting Basic Settings of Measurement Conditions Trigger delays and the trigger synchronous output function The trigger delay function allows you to set a delay time from the time the trigger signal is input until measure- ment. The trigger synchronous output function outputs the measurement signal only during measurement and allows you to set a delay time that will be allowed to elapse before data is acquired.
  • Page 88: Setting Dc Resistance Measurement

    4.3 Setting DC Resistance Measurement 4.3 Setting DC Resistance Measurement The DC resistance can be measured by outputting a 2.0 V (fixed) DC signal. The measurement process is as follows: Measure the DC resistance with an applied voltage of 2.0 V. Measure the DC resistance with an applied voltage of 0 V and use the result as the offset value.
  • Page 89: Configuring The Temperature Correction Function

    4.3 Setting DC Resistance Measurement 4.3.1 Configuring the Temperature Correction Function The principle of temperature correction (see "Appendix9 Temperature Correction Function (TC)"(p. A13)) can be used to convert resistance values to a reference temperature value and display the results. Be sure to read the following when connecting the 9478 Sheath type temperature probe to the TC SENSOR terminal on the back of the instrument.
  • Page 90 4.3 Setting DC Resistance Measurement Temperature Correction Function Setting Turn the temperature correction function on or off. Disables the temperature correction func- tion. Enables the temperature correction func- tion. Reference Temperature Setting Press and use the numeric keypad to set the reference temperature. Settable range: -10C to 99.9C Press key to confirm the setting.
  • Page 91: Setting The Dc Measurement Delay Time (Dc Delay)

    4.3 Setting DC Resistance Measurement 4.3.2 Setting the DC Measurement Delay Time (DC Delay) This section describes how to set the time allowed to elapse before DC resistance measurement starts, for example when switching from measurement using an AC signal to DC resistance measurement. This delay time serves to delay measurement until the DC level stabilizes.
  • Page 92 4.3 Setting DC Resistance Measurement Rdc Basic Settings Press Delay Time Setting to enter the delay time. Settable range: 0 s to 9.9999 s When you want to cancel setting of the delay time: Press The set time is set to 0 s. Press to close the setting screen.
  • Page 93: Setting The Offset Measurement Delay Time (Adjustment Delay)

    4.3 Setting DC Resistance Measurement 4.3.3 Setting the Offset Measurement Delay Time (Adjustment Delay) This delay time serves to delay measurement until offset measurement (0 VDC) stabilizes. When number of averaging times is 1 Setting changed ADJ delay • Changed from AC measurement to DC delay Measure DC Measure offset...
  • Page 94 4.3 Setting DC Resistance Measurement Adjustment Delay Setting Set the offset measurement time with Settable range: 0.0030 s to 9.9999 s When you want to revert the offset measure- ment delay time to its default value: Press The set time is set to 0.0030 s. Press to close the setting screen.
  • Page 95: Setting The Line Frequency

    4.3 Setting DC Resistance Measurement 4.3.4 Setting the Line Frequency When performing DC resistance measurement, be sure to set the line frequency of the power supply being used. Procedure LCR Measurement Screen Rdc Basic Settings Rdc Basic Settings Press Line Frequency Setting Select the line frequency.
  • Page 96: Setting The Measurement Range

    4.3 Setting DC Resistance Measurement 4.3.5 Setting the Measurement Range Setting the method for determining the measurement range (HOLD, AUTO, JUDGE SYNC) There are the following three methods for setting the measurement range. The most suitable test range is set automatically. AUTO (This allows the most suitable measurement range to be set when, for example, measuring a test sample whose nature is unknown.)
  • Page 97 4.3 Setting DC Resistance Measurement Rdc Basic Settings Press Range Setting Press • When you want to limit the AUTO ranging range: "AUTO range limit function" (p. 90) • If the instrument is being used outside the limits of its specification, the suitable range may not be set in auto ranging function.
  • Page 98 4.3 Setting DC Resistance Measurement AUTO range limit function The following procedure describes how to limit the AUTO ranging range. Procedure LCR Measurement Screen LCR Basic Settings LCR Basic Settings Press Range Setting Press If the instrument is being used outside the limits of its specification, the suitable range may not be set in auto ranging function.
  • Page 99 4.3 Setting DC Resistance Measurement Range Setting Press AUTO Range Limit Range Setting Select the AUTO range lower limit range. Touch to accept the lower limit range. step 4, touch Return to , and select the AUTO range upper limit range. Press to close the setting screen.
  • Page 100 4.3 Setting DC Resistance Measurement Setting the Ranging to HOLD Procedure LCR Measurement Screen Rdc Basic Settings Rdc Basic Settings Press Range Selection Press...
  • Page 101 4.3 Setting DC Resistance Measurement Range Selection To select the measurement range. Accuracy Test range AUTO Ranging Range guaranteed range 100 M 8 M to 200 M 8 M or more 10 M 800k to 100M 800 k to 10 M 1 M...
  • Page 102 4.3 Setting DC Resistance Measurement Judgment synchronization setting When the judgment synchronization setting is enabled and you want to set the optimal range relative to the comparator or BIN measurement judgment standards, it is necessary to re-set the range with •...
  • Page 103 4.3 Setting DC Resistance Measurement Range Setting Turn the judgment synchronization setting on or off. Disables the judgment synchronization setting. Enables the judgment synchronization set- ting. Press to close the setting screen. Parameter combination conditions while the judgment synchronization setting is enabled The third parameter ...
  • Page 104: Low Z High Accuracy Mode

    4.3 Setting DC Resistance Measurement Low Z High Accuracy Mode Low Z high accuracy mode allows high-accuracy measurement by setting the output resistance to 25  to ensure adequate current flow to the measurement sample. Procedure LCR Measurement Screen Rdc Basic Settings Rdc Basic Settings Press Range Setting...
  • Page 105 4.3 Setting DC Resistance Measurement Low Z high accuracy mode is only available for the 100 m and 1  ranges. • Refer to the table below. Measurement range  100 M  10 M   100 k Normal mode only ...
  • Page 106: Setting The Measurement Speed

    4.3 Setting DC Resistance Measurement 4.3.6 Setting the Measurement Speed The testing speed can be set. The slower the testing speed is, the more accurate are the results. Procedure LCR Measurement Screen Rdc Basic Settings Rdc Basic Settings Press Measurement Speed Setting To select the measurement speed.
  • Page 107: Displaying Average Values (Average Set)

    4.3 Setting DC Resistance Measurement 4.3.7 Displaying Average Values (Average set) With the averaging function, the measured values can be averaged. Using this function, it is possible to reduce fluctuations in the measured value display. After the signal level and range are set, measurement is performed for the set number of averaging times and the measurement values are displayed.
  • Page 108: Judging Measurement Results

    4.4 Judging Measurement Results 4.4 Judging Measurement Results The measurement results are compared to an arbitrarily set reference and then the judgment results are dis- played. This function is useful for quality evaluation and the like. There is comparator measurement which compares one judgment reference and the measurement values, and BIN measurement which compares multiple judgment reference values (up to 10) and the measurement values.
  • Page 109 4.4 Judging Measurement Results Judgment Mode Setting To select the judgment mode. Disables comparator and BIN measurement. Enables comparator measurement (p. 102). Enables BIN measurement (p. 109). When comparator measurement and BIN measurement are performed, only the first and third parameters can be set.
  • Page 110: Judging With Upper And Lower Limit Values (Comparator Measurement Mode)

    4.4 Judging Measurement Results 4.4.1 Judging with Upper and Lower Limit Values (Comparator Measurement Mode) The comparator measurement allows you to do the following. • Preset a reference value and upper and lower limit values as the judgment reference, and display a judgment result as (higher than the upper limit value), (within the range set for the upper and...
  • Page 111 4.4 Judging Measurement Results 1: The following equation is used to calculate the comparison upper limit value and comparison lower limit value. (In the case of the comparison lower limit value, if a value that is lower than the reference value is set, the minus (-) sign is required for the percentage setting value.) Percentage set value Upper limit comparison value (Lower limit comparison value) = reference value + |reference value| ×...
  • Page 112: Setting The Upper Or Lower Limit Value As An Absolute Value (Abs) (Absolute Value Mode)

    4.4 Judging Measurement Results Setting the Upper or Lower Limit Value as an Absolute Value (ABS) (Absolute Value Mode) Procedure LCR Measurement Screen Press Comparator Condition Setting Press Upper Limit Value Setting Press and use the numeric keypad to set the upper limit value. Settable range: -9.99999 G to 9.99999 G ...
  • Page 113: Setting The Upper Or Lower Limit Value As A Percentage (%) Relative To A Reference Value (Percentage Mode)

    4.4 Judging Measurement Results Setting the Upper or Lower Limit Value as a Percentage (%) Relative to a Reference Value (Percentage Mode) Procedure LCR Measurement Screen Press Comparator Condition Setting Press Reference Value Setting Press and use the numeric keypad to set the reference value.
  • Page 114 4.4 Judging Measurement Results Upper Limit Value Setting Press and use the numeric keypad to set the upper limit value. Set the upper limit value as a percentage relative to the reference value. When you do not want to set the upper limit: Press •...
  • Page 115: Setting Upper And Lower Limit Values As (%) Values Relative To The Offset From The Reference Value (Deviation Percentage Mode)

    4.4 Judging Measurement Results  Setting Upper and Lower Limit Values as ( %) Values Relative to the Off- set from the Reference Value (Deviation Percentage Mode) Procedure LCR Measurement Screen Press • In the deviation percentage mode, the measurement ...
  • Page 116 4.4 Judging Measurement Results Upper Limit Value Setting Press and use the numeric keypad to set the upper limit value. Settable range: -999.999% to 999.999% When you do not want to set the upper limit: Press Press to confirm the upper limit value. Step 2 Return to , press...
  • Page 117: Classifying Measurement Results (Bin Measurement)

    4.4 Judging Measurement Results 4.4.2 Classifying Measurement Results (BIN Measurement) Set the upper and lower limit values for two parameters and display up to 10 classifications of judgment results.You can also output the judgment results to an external device. Select the judgment mode for BIN measurement (Front panel LEDs) before setting the judgment conditions (p.
  • Page 118 4.4 Judging Measurement Results The comparator decision mode can be set as one of the following: Absolute value (ABS) setting (p. 104) Set absolute values for the upper limit and lower limit values of upper limit value the measurement parameters. The measurement values displayed are the same as those of the measurement parameters.
  • Page 119: Setting The Upper Or Lower Limit Value As An Absolute Value (Abs) (Absolute Value Mode)

    4.4 Judging Measurement Results Setting the Upper or Lower Limit Value as an Absolute Value (ABS) (Absolute Value mode) Procedure LCR Measurement Screen Press BIN Settings Press The button display differs depending on the measurement parameter. BIN Mode Setting Press Press to return to the BIN setting screen.
  • Page 120 4.4 Judging Measurement Results BIN Settings to select the BIN number to set, and press Upper/Lower Limit Value Settings Press Upper Limit Value Setting Use the numeric keypad to input the upper limit value of the first parameter. Settable range: -9.99999G to 9.99999G Press to confirm the upper limit value.
  • Page 121 4.4 Judging Measurement Results step Return to , and set the upper and lower limit values of the third parameter in the same way. Press to return to the BIN setting screen. Press to close the setting screen.
  • Page 122: Setting The Upper Or Lower Limit Value As A Percentage (%) Relative To A Reference Value (Percentage Mode)

    4.4 Judging Measurement Results Setting the Upper or Lower Limit Value as a Percentage (%) Relative to a Reference Value (Percentage mode) Procedure LCR Measurement Screen Press BIN Settings Press The button display differs depending on the measurement parameter. BIN Mode Setting Press to select percentage mode.
  • Page 123 4.4 Judging Measurement Results Reference Value Setting Press Use the numeric keypad to enter the reference value and press Settable range: -9.99999G to 9.99999G BIN Mode Setting Press to return to the BIN setting screen. BIN Settings to select the BIN number to set, and press...
  • Page 124 4.4 Judging Measurement Results Upper/Lower Limit Value Settings Press Upper Limit Value Setting Use the numeric keypad to enter the upper limit value of the first parameter. Settable range: -999.999% to 999.999% Press to confirm the upper limit value. When you do not want to set the upper and lower limit values: Press step Return to...
  • Page 125: The Reference Value (Deviation Percentage Mode)

    4.4 Judging Measurement Results  Setting Upper and Lower Limit Values as ( %) Values Relative to the Off- set from the Reference Value (Deviation Percentage Mode) Procedure LCR Measurement Screen Press BIN Settings Press The button display differs depending on the measure- ment parameter.
  • Page 126 4.4 Judging Measurement Results Reference Value Setting Press Use the numeric keypad to enter the reference value and press Settable range: -9.99999G to 9.99999G BIN Mode Setting Press to return to the BIN setting screen. BIN Settings to select the BIN number to set, and press...
  • Page 127 4.4 Judging Measurement Results Upper/Lower Limit Value Settings Press Upper Limit Value Setting Use the numeric keypad to enter the upper limit value of the first parameter. Settable range: -999.999% to 999.999% Press to confirm the upper limit value. When you do not want to set the upper and lower limit values: Press step Return to...
  • Page 128: Setting Application Settings

    4.5 Setting Application Settings 4.5 Setting Application Settings 4.5.1 Setting Measurement Conditions for Individual Measurement Ranges (Range Synchronization Function) This section describes how to set measurement conditions for individual measurement ranges. Measurement speed (AC), averaging settings (AC), trigger delay, trigger BASIC synchronous output function Measurement speed (DC), averaging settings (DC)
  • Page 129 4.5 Setting Application Settings Range Synchronization Function Setting Turn the range synchronization function on or off. Disables the range synchronization function. Enables the range synchronization function. Press to close the setting screen.
  • Page 130 4.5 Setting Application Settings Range synchronization function settings (basic) When the range synchronization function is enabled (p. 120) Procedure LCR Measurement Screen LCR Basic Settings (Range Synchronization Function) LCR Basic Settings (Range Synchronization Function) Press Select the measurement range you wish to configure with and configure the associated functions.
  • Page 131 4.5 Setting Application Settings To apply settings to all ranges To apply the settings to all measurement ranges, enable and touch individual settings keys or the key to configure function settings. To configure settings for an individual measurement range, disable LCR Range Synchronization Function Settings Screen (Basic) Press...
  • Page 132 4.5 Setting Application Settings To configure all functions for a particular measurement range This function allows you to configure measurement conditions (measurement speed, averaging settings, trig- ger delay, and the trigger synchronous output function) on a single screen. Settings are the same as those described in "4.2 Setting Basic Settings of Measurement Conditions"...
  • Page 133 4.5 Setting Application Settings Range synchronization function settings (Rdc) When the range synchronization function is enabled (p. 120) Procedure LCR Measurement Screen Rdc Basic Settings Rdc Basic Settings (Range Synchronization Function) Press LCR Range Synchronization Function Settings Screen (Rdc) Select the measurement range you wish to configure with and configure the associated functions.
  • Page 134 4.5 Setting Application Settings To apply settings to all ranges When applying the settings to all measurement ranges, enable and use the settings keys or the key to configure the desired functionality. To apply settings to individual measurement ranges, disable LCR Range Synchronization Function Settings Screen (Rdc) Press...
  • Page 135 4.5 Setting Application Settings When configuring all functionality for a particular measurement range This function allows you to set measurement conditions (measurement speed and averaging settings) on a single screen. The settings are the same as described in "4.3 Setting DC Resistance Measurement" (p. 80). LCR Range Synchronization Function Settings Screen (Rdc) Select the measurement range you wish to...
  • Page 136: Setting The Detection Signal Waveform Averaging Count (Waveform Averaging Function)

    4.5 Setting Application Settings 4.5.2 Setting the Detection Signal Waveform Averag- ing Count (Waveform Averaging Function) The number of measurement waveforms for each frequency band is set for the measurement speed settings (FAST, MED, SLOW, SLOW2), and this function allows you to set the number of measurement waveforms for each frequency band.
  • Page 137 4.5 Setting Application Settings Waveform Averaging Function Settings Select the frequency band for which you wish to change the number of measurement wave- forms with and touch Reset the number of measurement waveforms for each measurement speed. Sets the number of measurement waveforms to 1 for all frequency bands.
  • Page 138: Detecting Open During 2-Terminal Measurement (High-Z Reject Function)

    4.5 Setting Application Settings 4.5.3 Detecting OPEN during 2-terminal Measurement (HIGH-Z Reject Function) This function is for outputting a measurement terminal connector error when the measurement result is high relative to the set judgment reference value. The setting value can be set as an absolute value, and the error is output via the Measurement Screen and EXT I/O.
  • Page 139 4.5 Setting Application Settings HIGH-Z Setting Select ON/OFF for the HIGH-Z reject function. Disables the HIGH-Z reject function. Enables the HIGH-Z reject function. HIGH-Z Setting to set the judgment reference value. Settable range: 0% to 30000% • A ratio is set using the range name as the refer- ence value.
  • Page 140: Checking Contact Defects And The Contact State (Contact Check Function)

    4.5 Setting Application Settings 4.5.4 Checking Contact Defects and the Contact State (Contact Check Function) This functionality allows you to detect contact defects between the terminals (H , and L and the sample during 4-terminal measurement. Contact check error display (p. 360) Procedure LCR Measurement Screen LCR Application Settings...
  • Page 141 4.5 Setting Application Settings Contact Check Settings Set the contact check threshold with Settable range : 1 to 5 Threshold Permissible Approx. Approx. Approx. Approx. Approx. contact  1000 resistance [ Press to close the setting screen. • Selecting as the contact check timing causes the trigger synchro- nous output function to be automatically turned on.
  • Page 142: Setting The Delay Time From The Output Of Comparator And Bin Judgment Results Until Output Of Eom (Low) And Resetting Judgment Results

    4.5 Setting Application Settings 4.5.5 Setting the Delay Time from the Output of Com- parator and BIN Judgment Results until Output of EOM (LOW) and Resetting Judgment Results You can set the delay time for the period from the output of the comparator and BIN judgment results until the output of EOM (LOW) from the EXT I/O.
  • Page 143 4.5 Setting Application Settings I/O Judgment Setting Select whether to reset the comparator and BIN judgment results when the signal changes to EOM (HIGH). Stores the last judgment results until the next judgment results are output. Resets the judgment results when the sig- nal changes to EOM (HIGH).
  • Page 144: Enabling Trigger Input For During Measurement And Setting The Valid Edge Of Trigger Input

    4.5 Setting Application Settings 4.5.6 Enabling Trigger Input for during Measurement and Setting the Valid Edge of Trigger Input You can select whether to enable or disable trigger input from the EXT I/O during measurement (while EOM (HI) is being output after the trigger is received). Erroneous input due to chattering can be prevented by dis- abling trigger input during measurement.
  • Page 145: Setting The Eom Output Method

    4.5 Setting Application Settings 4.5.7 Setting the EOM Output Method The higher the measurement frequency, the shorter the time that INDEX and EOM are high (off). When the high (off) time is too short due to characteristics of the input circuit, the instrument can be configured to maintain the low (on) state for a preset time once EOM changes to low (on) before reverting the signal to high (off) after the completion of measurement.
  • Page 146: Saving Measurement Results (Memory Function)

    4.5 Setting Application Settings 4.5.8 Saving Measurement Results (Memory function) You can save the measurement results inside the instrument (Up to 32,000 items).The saved measurement results can be saved to a USB flash drive. They can also be acquired using a communication command. The memory function setting is the same in mode, mode, and...
  • Page 147 4.5 Setting Application Settings Memory Function Setting Select ON/IN/OFF for the memory function. Disables the memory function. Saves the measurement results to memory only when a pass judgment is made for all of the parameters judged with the comparator and BIN functions.
  • Page 148: Setting The Number Of Display Digits

    4.5 Setting Application Settings 4.5.9 Setting the Number of Display Digits You can set the number of effective digits of the measurement value for each parameter. Procedure LCR Measurement Screen LCR Application Settings LCR Application Settings Press...
  • Page 149 4.5 Setting Application Settings No. of Display Digits Setting to set the number of display digits. (For each parameter) Settable range: 3 to 6 digits Setting Parameter Value   Other Up to three decimal places Up to five decimal places Up to second decimal place Up to three decimal places Up to 6 digits Up to second decimal places Up to four decimal places Up to one decimal place Up to second decimal place Up to 5 digits...
  • Page 150: 10Setting The Lcd To On/Off

    4.5 Setting Application Settings 4.5.10 Setting the LCD to ON/OFF You can turn the LCD ON/OFF. Setting the LCD to OFF saves power because the LCD turns off if the panel is not touched for 10 seconds. Procedure LCR Measurement Screen LCR Application Settings LCR Application Settings Press...
  • Page 151: 11Setting Operation Sounds (Beep Sounds)

    4.5 Setting Application Settings 4.5.11 Setting Operation Sounds (Beep Sounds) You can set the operation sound and each of the beep sounds for judgment results. Procedure LCR Measurement Screen LCR Application Settings LCR Application Settings Press Beep sound settings for when comparator judgment When a comparator judgment is made, no beep sound is emitted.
  • Page 152: 12Disabling Key Operation (Key-Lock Function)

    4.5 Setting Application Settings 4.5.12 Disabling Key Operation (Key-lock Function) When the key-lock function is enabled, all setting changes except canceling the key-lock are disabled to pro- tect the settings. You can also set a passcode (security code). Procedure LCR Measurement Screen LCR Application Settings LCR Application Settings Press...
  • Page 153 4.5 Setting Application Settings Setting the Passcode of the Key-lock Input Passcode Press when the key-lock setting is Use the numerical keypad to enter the pass- code, press , and then press Settable range: 1 to 4 digits Initial passcode: 3533 If a passcode is set, it needs to be entered to disable the key-lock.
  • Page 154 4.5 Setting Application Settings Key Lock Disable Error If the error indication shown on the left appears, check the following items. Cause Remedy Press and enter the passcode. was pressed before you entered the passcode. Press and enter the passcode again. The entered passcode is incorrect.
  • Page 155: 13Initializing (System Reset)

    4.5 Setting Application Settings 4.5.13 Initializing (System Reset) In the event of the instrument malfunctioning, check "Before returning for repair" (p. 355). If you do not know the cause of the problem, perform a system reset to restore the instrument to its factory default settings.
  • Page 156 4.5 Setting Application Settings...
  • Page 157: Chapter 5 Analyzer Function (Im3533-01)

    5.1 About ANALYZER function ANALYZER Function Chapter 5 (IM3533-01) 5.1 About ANALYZER function The ANALYZER function allows you to perform measurement while sweeping the measurement frequency, signal level, and DC bias level. Use this function for measuring frequency characteristics. •...
  • Page 158: Setting Basic Settings Of Measurement

    5.2 Setting Basic Settings of Measurement 5.2 Setting Basic Settings of Measurement 5.2.1 Setting the measurement parameter Set the measurement parameter for ANALYZER mode. DC resistance measurement cannot be performed in ANALYZER mode. Procedure ANALYZER Measurement Screen ANALYZER Basic Settings ANALYZER Basic Settings Press Measurement Parameter Setting...
  • Page 159: Setting The Trigger

    5.2 Setting Basic Settings of Measurement 5.2.2 Setting the Trigger Set the trigger. In ANALYZER mode, sweeping is performed in accordance with the trigger setting that is set for this item. The following three types of trigger can be set as the trigger setting. •...
  • Page 160: Setting The Display Timing

    5.2 Setting Basic Settings of Measurement 5.2.3 Setting the Display Timing Set the timing for drawing the list. If the display timing is set to , the time for one sweep becomes long because the screen is updated every time each sweep point is measured. If it is set to to give priority to the measurement time, the screen update time becomes short.
  • Page 161: Setting The Trigger Delay

    5.2 Setting Basic Settings of Measurement 5.2.4 Setting the Trigger Delay Set the delay time from the initial sweep point trigger input to the start of measurement. There are two delay settings: “Trigger Delay” and “Point Delay.” With this item, only the setting for the trigger delay is configured. When sequential sweep Trigger delay Point delay...
  • Page 162 5.2 Setting Basic Settings of Measurement Procedure ANALYZER Measurement Screen ANALYZER Basic Settings ANALYZER Basic Settings Press Trigger Delay Setting to set the delay time. • Settable range: 0 s to 9.9999 s with resolution of 0.1 ms • If you make a mistake during input: press cancel the input and start again.
  • Page 163: Setting Sweep Points

    5.2 Setting Basic Settings of Measurement 5.2.5 Setting Sweep Points Sets the start value and end value of the sweep. Each sweep point is automatically calculated from the number of sweep points. Start value 開始値 End value 終了値 Number of sweep points 掃引点数...
  • Page 164 5.2 Setting Basic Settings of Measurement Sweep Range Setting Press and use the numeric keypad to set the start value of the sweep. • Settable range: 1 mHz to 200 kHz • If you make a mistake during input: press to cancel the input and start again.
  • Page 165 5.2 Setting Basic Settings of Measurement Sweep Range Setting Select the setting method for sweep points. The sweep points are calculated linearly from the setting values of , and The sweep points are calculated logarithmi- cally from the setting values of , and Reverts the number of sweep points to its original value and closes the Settings...
  • Page 166: Setting The Measurement Signal Level

    5.2 Setting Basic Settings of Measurement 5.2.6 Setting the Measurement Signal Level The value of the test signal level may change according to the sample which is being tested. This instrument is possible to vary the level of the test signal applied to the object under test over a wide range using the following three methods.
  • Page 167 5.2 Setting Basic Settings of Measurement Measurement Signal Mode Settings Select the measurement signal level. Open circuit voltage (V) mode (p. 54) Constant voltage (CV) mode (p. 54) Constant current (CC) mode (p. 55) Measurement Signal Level Setting to enter the voltage or current value.
  • Page 168: Setting The Measurement Range

    5.2 Setting Basic Settings of Measurement 5.2.7 Setting the Measurement Range When measuring a sample whose impedance varies greatly with frequency or a sample whose characteristics are unknown, you can have the instrument automatically select the optimal measurement range. Alternately, you can perform high-speed measurement by fixing the range with the HOLD function.
  • Page 169 5.2 Setting Basic Settings of Measurement Range Setting Press If the instrument is being used outside the lim- its of its specification, the suitable range may not be set in auto ranging function. In this case, check the accuracy assured ranges in "14.2 Measurement Range and Accuracy"...
  • Page 170 5.2 Setting Basic Settings of Measurement Setting the Ranging to HOLD Procedure ANALYZER Measurement Screen ANALYZER Basic Settings ANALYZER Basic Settings Press Measurement Range Selection Press...
  • Page 171 5.2 Setting Basic Settings of Measurement Measurement Range Selection To select the measurement range. Test Accuracy guar- Auto ranging range anteed range range 100 M 8 M to 200 M 8 M or more 10 M 800k to 100M 800 k to 10 M 1 M...
  • Page 172: Low Z High Accuracy Mode

    5.2 Setting Basic Settings of Measurement Low Z high accuracy mode In low Z high accuracy mode, an output resistance of 25  is used so that adequate current can flow to the measurement sample, allowing highly accurate measurement. Procedure ANALYZER Measurement Screen Analyzer Basic Settings ANALYZER Basic Settings...
  • Page 173 5.2 Setting Basic Settings of Measurement Low Z high accuracy mode is only available for the 100 m and 1  ranges. See the following table: Measurement range  100 M  10 M   100 k Normal mode only ...
  • Page 174: Setting The Measurement Speed

    5.2 Setting Basic Settings of Measurement 5.2.8 Setting the Measurement Speed The testing speed can be set. The slower the testing speed is, the more accurate are the results. Procedure ANALYZER Measurement Screen ANALYZER Basic Settings ANALYZER Basic Settings Press Measurement Speed Setting To select the measurement speed.
  • Page 175: Displaying As Average Values (Average Set)

    5.2 Setting Basic Settings of Measurement 5.2.9 Displaying as Average Values (Average set) With the averaging function, the measured values can be averaged. Using this function, it is possible to reduce fluctuations in the measured value display. The measurement values are averaged by arithmetic mean during ANALYZER measure- ment regardless of the trigger setting (p.
  • Page 176: 10Setting The Point Delay

    5.2 Setting Basic Settings of Measurement 5.2.10 Setting the Point Delay For the point delay setting, set the delay time for each sweep point. In sweep measurement, some measurement samples may require time for the measured value to stabilize due to transient response. In this case, set a point delay time. "5.2.4 Setting the Trigger Delay"...
  • Page 177: 11Setting The Dc Bias

    5.2 Setting Basic Settings of Measurement 5.2.11 Setting the DC Bias For the DC bias setting, set the DC bias value for when sweep measurement is performed. If the DC bias is set, a DC signal can be superimposed on the measurement signal during capacitor measure- ment.
  • Page 178 5.2 Setting Basic Settings of Measurement DC Bias Setting to set the DC bias. • Settable range: -5.00 V to 5.00 V (Normal mode) -2.50 V to 2.50 V (Low Z high accuracy mode) • If you make a mistake during input: press to cancel the input and start again.
  • Page 179: Application Settings

    5.3 Application Settings 5.3 Application Settings 5.3.1 Applying the Signal to the Sample Only during Measurement (Trigger Synchronous Output Function) This function enables the measurement signal to be output after measurement is triggered for the initial sweep point only, ensuring that the signal is applied to the sample during measurement only. Thus reducing the generation of heat in the sample and decreasing electrode wear.
  • Page 180 5.3 Application Settings Trigger Sync Setting to set the wait time from after the measurement signal is output by applying a trigger to the start of measurement. Settable range: 0.0010 s to 9.9999 s When you want to return the time to the ini- tial state: Press The set time is set to 0.0010 s.
  • Page 181: Setting The Detection Signal Waveform Averaging Count (Waveform Averaging Function)

    5.3 Application Settings 5.3.2 Setting the Detection Signal Waveform Averag- ing Count (Waveform Averaging Function) The number of measurement waveforms for each frequency band is set for the measurement speed settings (FAST, MED, SLOW, SLOW2), and this function allows you to set the number of measurement waveforms for each frequency band.
  • Page 182 5.3 Application Settings Select the frequency band for which you wish Waveform Averaging Function Settings to change the number of measurement wave- forms with and touch Reset the number of measurement waveforms for each measurement speed. Sets the number of measurement waveforms to 1 for all frequency bands.
  • Page 183: Detecting Open During 2-Terminal Measurement (High-Z Reject Function)

    5.3 Application Settings 5.3.3 Detecting OPEN during 2-terminal Measurement (HIGH-Z Reject Function) This function is for outputting a measurement terminal connector error when the measurement result is high relative to the set judgment reference value. The setting value can be set as an absolute value, and the error is output via the measurement screen and EXT I/O.
  • Page 184 5.3 Application Settings HIGH-Z Setting Select ON/ OFF for the HIGH-Z reject function. Disables the HIGH-Z reject function. Enables the HIGH-Z reject function. HIGH-Z Setting to set the judgment reference value. Settable range: 0% to 30000% • A ratio is set using the range name as the reference value.
  • Page 185: Checking Contact Defects And The Contact State (Contact Check Function)

    5.3 Application Settings 5.3.4 Checking Contact Defects and the Contact State (Contact Check Function) This functionality allows you to detect contact defects between the terminals (H , and L and the sample during 4-terminal measurement. Procedure ANALYZER Measurement Screen ANALYZER Application Settings ANALYZER Application Settings Press Contact Check Settings...
  • Page 186 5.3 Application Settings Contact Check Settings Set the contact check threshold with Settable range : 1 to 5 Threshold Permissible Approx. Approx. Approx. Approx. Approx. contact 1000  resistance [ Press to close the setting screen. • Selecting as the contact check timing causes the trigger synchro- nous output function to be automatically turned on.
  • Page 187: Saving Measurement Results (Memory Function)

    5.3 Application Settings 5.3.5 Saving Measurement Results (Memory function) You can save the measurement results inside the instrument. (Up to 32,000 items) The saved measurement results can be saved to a USB flash drive. They can also be acquired using a communication command. Memory function settings apply to mode, mode, and mode.
  • Page 188 5.3 Application Settings Memory Function Setting After touching to disable the mem- ory function, use to set the num- ber of measurement results. Settable range: 1 to 32000 The number of measurement results can only be set when the memory function is set to OFF. Memory Function Setting Select ON/OFF for the memory function.
  • Page 189 5.3 Application Settings Saving Data in Instrument Memory to USB Flash Drive Memory Function Setting Connect a USB flash drive (p. 273). Press to save the data in the instru- ment memory to a USB flash drive. When this function is used to save the data in the in- strument memory to a USB flash drive, the data is cleared from the instrument memory automatically.
  • Page 190: Auto Range Limit Function

    5.3 Application Settings 5.3.6 AUTO Range Limit Function The AUTO range limit function allows you to limit the AUTO ranging range. Procedure ANALYZER Measurement Screen ANALYZER Application Settings ANALYZER Application Settings Press Range Settings Select the lower limit range.
  • Page 191 5.3 Application Settings Upper and Lower Range Settings Select the upper limit range. Press to close the setting screen. Screen displayed when the AUTO range limit function has been enabled Operation is only enabled within the set AUTO ranging range. Example: When the upper limit range is set to 1 k...
  • Page 192: Setting The Lcd To On/Off

    5.3 Application Settings 5.3.7 Setting the LCD to ON/OFF You can turn the LCD ON/ OFF. Setting the LCD to OFF saves power because the LCD turns off if the panel is not touched for 10 seconds. Procedure ANALYZER Measurement Screen ANALYZER Application Settings ANALYZER Application Settings Press...
  • Page 193: Setting Operation Sounds (Beep Sounds)

    5.3 Application Settings 5.3.8 Setting Operation Sounds (Beep Sounds) You can set the operation sound and each of the beep sounds for judgment results. Procedure ANALYZER Measurement Screen ANALYZER Application Settings ANALYZER Application Settings Press Beep Sound Settings Beep sound setting for when key pressed When a key is pressed, no beep sound is emitted.
  • Page 194: Disabling Key Operation (Key-Lock Function)

    5.3 Application Settings 5.3.9 Disabling Key Operation (Key-lock Function) When the key-lock function is enabled, all setting changes except canceling the key-lock are disabled to pro- tect the settings. You can also set a passcode (security code). Procedure ANALYZER Measurement Screen ANALYZER Application Settings ANALYZER Application Settings Press...
  • Page 195 5.3 Application Settings Setting the Passcode of the Key-lock Passcode Setting Press when the key-lock setting is Use the numerical keypad to enter the pass- code, press , and then press Settable range: 1 to 4 digits Default passcode: 3533 Disabling the Key-lock Disable Key Lock Press...
  • Page 196 5.3 Application Settings Key Lock Disable Error If the error indication shown on the left appears, check the following items. Cause Remedy Press and enter the passcode. was pressed before you entered the passcode. Press and enter the passcode again. The entered passcode is incorrect.
  • Page 197: 10Enabling Trigger Input For During Mea- Surement And Setting The Valid Edge Of Trigger Input

    5.3 Application Settings 5.3.10 Enabling Trigger Input for during Measurement and Setting the Valid Edge of Trigger Input You can select whether to enable or disable trigger input from the EXT I/O during measurement (during EOM (HI) output after trigger is received). Erroneous input due to chattering can be prevented by disabling trigger input during measurement.
  • Page 198: 11Setting The Eom Output Method

    5.3 Application Settings 5.3.11 Setting the EOM Output Method The higher the measurement frequency, the shorter the time that INDEX and EOM are high (off). When the high (off) time is too short due to characteristics of the input circuit, the instrument can be configured to main- tain the low (on) state for a preset time once EOM changes to low (on) before reverting the signal to high (off) after the completion of measurement.
  • Page 199: 12Initializing (System Reset)

    5.3 Application Settings 5.3.12 Initializing (System Reset) In the event of the instrument malfunctioning, check "Before returning for repair" (p. 355). If you do not know the cause of the problem, perform a system reset to restore the instrument to its factory default settings.
  • Page 200 5.3 Application Settings...
  • Page 201: Chapter 6 Transformer Function

    6.1 About TRANSFORMER function TRANSFORMER Chapter 6 Function 6.1 About TRANSFORMER function The TRANSFORMER function allows you to perform inductance measurement twice in order to calculate the winding ratio, mutual inductance, and inductance difference. Settings apply to LCR mode, ANALYZER mode, and TRANSFORMER mode. 6.1.1 Measurement screen When the instrument is turned back on, the screen will display the measurement mode in use when it was last turned off.
  • Page 202: Measurement Methods

    6.1 About TRANSFORMER function 6.1.2 Measurement Methods Winding ratio and inductance difference Touch after connecting the wiring to the coil’s primary side. Then touch after connect- ing the wiring to the secondary side to display the wiring ratio and inductance difference. Procedure TRANSFORMER Measurement Screen Measure the coil’s primary side with...
  • Page 203 6.1 About TRANSFORMER function Mutual inductance Connect the two sides in phase and in series and touch . Then connect them in reverse phase and in series and touch to display the mutual inductance. Procedure TRANSFORMER Measurement Screen Connect the two sides in phase and in series as In-phase, in-series shown below and measure with measurement value...
  • Page 204: Setting The Measurement Parameter

    6.1 About TRANSFORMER function 6.1.3 Setting the measurement parameter This section describes how to select Ls or Lp as the measurement parameter. "1.3.7 Parameter Settings Screen" (p. 28) "Appendix1 Measurement Parameters and Calculation Formula"(p. A1) "Appendix7 Series Equivalent Circuit Mode and Parallel Equivalent Circuit Mode"(p. A11) Procedure TRANSFORMER Measurement Screen Touch the measurement parameter key on the...
  • Page 205: Setting Calculation Parameters

    6.1 About TRANSFORMER function 6.1.4 Setting Calculation Parameters This section describes how to select winding ratio (N), mutual inductance (M), or inductance difference (L) as the calculation parameter. "6.1.2 Measurement Methods" (p. 194) Procedure TRANSFORMER Measurement Screen Touch the calculation parameter key on the measurement screen.
  • Page 206: Setting Basic Settings Of Measurement Conditions

    6.2 Setting Basic Settings of Measurement Conditions 6.2 Setting Basic Settings of Measurement Conditions Basic settings apply to LCR mode, ANALYZER mode, and TRANSFORMER mode. Procedure TRANSFORMER Measurement Screen TRANSFORMER Basic Settings Select the setting you wish to configure. TRANSFORMER Basic Settings Sets the measurement frequency (p.
  • Page 207: Judging With Upper And Lower Limit Values (Comparator Measurement Mode)

    6.3 Judging with Upper and Lower Limit Values (Comparator Measurement Mode) 6.3 Judging with Upper and Lower Limit Val- ues (Comparator Measurement Mode) This function compares calculation parameter calculation results to a user-specified reference and displays a judgment result. In TRANSFORMER mode, only comparator measurement, which compares one judgment reference and the calculated values, is available.
  • Page 208 6.3 Judging with Upper and Lower Limit Values (Comparator Measurement Mode) The following three judgment methods are available: Absolute value (ABS) setting (p. 202) Set absolute values for the upper limit and lower limit val- upper limit value ues of the calculation parameter. The calculated values displayed are the same as those of the calculation parameter.
  • Page 209 6.3 Judging with Upper and Lower Limit Values (Comparator Measurement Mode) Configuring comparator measurement Procedure TRANSFORMER Measurement Screen TRANSFORMER Application Settings TRANSFORMER Application Settings Press Comparator Measurement Settings Turn comparator measurement on or off. Disables comparator measurement. Enables comparator measurement. Press to close the setting screen.
  • Page 210: Setting The Upper Or Lower Limit Value As An Absolute Value (Abs) (Absolute Value Mode)

    6.3 Judging with Upper and Lower Limit Values (Comparator Measurement Mode) Setting the Upper or Lower Limit Value as an Absolute Value (ABS) (Absolute Value Mode) Procedure TRANSFORMER Measurement Screen Press Comparator Condition Setting Press Upper Limit Value Setting Press and use the numeric keypad to set the upper limit value.
  • Page 211: Setting The Upper Or Lower Limit Value As A Percentage (%) Relative To A Reference Value (Percentage Mode)

    6.3 Judging with Upper and Lower Limit Values (Comparator Measurement Mode) Setting the Upper or Lower Limit Value as a Percentage (%) Relative to a Reference Value (Percentage Mode) Procedure TRANSFORMER Measurement Screen Press Comparator Condition Setting Press Reference Value Setting Press and use the numeric keypad to set the reference value.
  • Page 212 6.3 Judging with Upper and Lower Limit Values (Comparator Measurement Mode) Upper Limit Value Setting Press and use the numeric keypad to set the upper limit value. Set the upper limit value as a percentage relative to the reference value. When you do not want to set the upper limit: Press •...
  • Page 213: Setting Upper And Lower Limit Values As (%) Values Relative To The Offset From The Reference Value (Deviation Percentage Mode)

    6.3 Judging with Upper and Lower Limit Values (Comparator Measurement Mode)  Setting Upper and Lower Limit Values as ( %) Values Relative to the Off- set from the Reference Value (Deviation Percentage Mode) Procedure TRANSFORMER Measurement Screen Press • In the deviation percentage mode, the calculated ...
  • Page 214 6.3 Judging with Upper and Lower Limit Values (Comparator Measurement Mode) Upper Limit Value Setting Press and use the numeric keypad to set the upper limit value. Settable range: -999.999% to 999.999% When you do not want to set the upper limit: Press Press to confirm the upper limit value.
  • Page 215: Setting Application Settings

    6.4 Setting Application Settings 6.4 Setting Application Settings Basic settings apply to LCR mode, ANALYZER mode, and TRANSFORMER mode. Procedure TRANSFORMER Measurement Screen TRANSFORMER Application Settings Select the setting you wish to configure. TRANSFORMER Application Settings Measurement result judgment setting (p. 199) Range synchronization function setting (p.
  • Page 216 6.4 Setting Application Settings...
  • Page 217: Chapter 7 Continuous Measurement Function

    Function The CONTINUOUS measurement function loads measurement conditions saved using the panel save func- tion in order and performs a series of measurements. LCR mode and ANALYZER mode (IM3533-01 only) measurement conditions can be mixed. Up to 60 (IM3533-01: up to 62) continuous measurements can be performed.
  • Page 218: Configuring Continuous Measurement Basic Settings

    Measurement Basic Settings Before you perform continuous measurement, set which panels are target for continuous measurement. Save the measurement conditions with the panel save function in LCR mode or ANALYZER mode (IM3533- 01 only) in advance. "9.1 Saving Measurement Conditions (Panel Save Function)" (p. 251)
  • Page 219: Performing Continuous Measurement

    7.3 Performing CONTINUOUS Measurement 7.3 Performing CONTINUOUS Measurement Execute CONTINUOUS Measurement Panels that were set to in the setting screen are displayed in the list. Press Stop CONTINUOUS Measurement When you want to stop continuous measurement: Press...
  • Page 220: Checking Continuous Measurement Results

    Displays the judgment result. panel number. surement value. LCR mode: The first parameter, The third parameter Example: To check measurement results in ANALYZER mode (IM3533-01 only) Select the ANALYZER mode panel with and touch To return to the list of measurement results: Press LCR mode measurement values are displayed for the first and third parameters only.
  • Page 221: Configuring Continuous Measurement Application Settings

    7.5 Configuring CONTINUOUS Measurement Application Settings 7.5 Configuring CONTINUOUS Measurement Application Settings 7.5.1 Setting the Display Timing Set the display timing for during continuous measurement. If the display timing is set to , the time for continuous measurement becomes long because the screen is updated every time measurement is performed.
  • Page 222: Setting The Lcd To On/Off

    7.5 Configuring CONTINUOUS Measurement Application Settings 7.5.2 Setting the LCD to ON/OFF You can turn the LCD ON/OFF. Setting the LCD to OFF saves power because the LCD turns off if the panel is not touched for 10 seconds. Procedure CONTINUOUS Measurement Screen CONTINUOUS Measurement Application Settings CONTINUOUS Measurement Application Settings...
  • Page 223: Chapter 8 Error

    8.1 Setting Open Circuit Compensation Error Chapter 8 Compensation Compensate for errors caused by a fixture or measurement cable. 8.1 Setting Open Circuit Compensation With open circuit compensation, it is possible to reduce the influence of the floating impedance of the test cables and thereby to enhance the accuracy of measurement.
  • Page 224: All Compensation

    8.1 Setting Open Circuit Compensation 8.1.1 All Compensation Simultaneously acquire the open compensation values for all measurement frequencies. “To limit the compensation frequency range for all compensation” (p. 218) Procedure LCR Measurement Screen Compensation Screen Open Compensation Press Open Compensation Setting Select and press to close...
  • Page 225 8.1 Setting Open Circuit Compensation The compensation values from last time are dis- Open Compensation (All Compensation) played in a confirmation screen. (If compensation has never been performed, the compensation values become 0.) Check that the measurement cable is in an open circuit state.
  • Page 226 8.1 Setting Open Circuit Compensation Compensation range limitation function In "ALL" compensation, compensation is performed for the entire frequency range. By setting the minimum and maximum compensation frequencies with this function, you can reduce the time required to perform the compensation process.
  • Page 227 8.1 Setting Open Circuit Compensation Minimum Compensation Frequency Setting Press • Settable range: 20.000 Hz to 200 kHz • If you make a mistake during input: press cancel the input and start again. Minimum Compensation Frequency Setting Press a instrument key to confirm the setting. •...
  • Page 228: Spot Compensation

    8.1 Setting Open Circuit Compensation 8.1.2 Spot Compensation Acquire the compensation values at the set measurement frequencies. Measurement frequencies can be set for up to five points. Procedure Open Compensation Setting Select in the open circuit compensa- tion screen, and press to confirm the selection.
  • Page 229 8.1 Setting Open Circuit Compensation The compensation values from last time are dis- Open Compensation (Spot Compensation) played in a confirmation screen. (If compensation has never been performed, the compensation values become 0.) Check that the measurement cable is in an open circuit state.
  • Page 230 8.1 Setting Open Circuit Compensation When Normal Compensation Values were Not Acquired A window such as the following will be displayed if the instrument was unable to acquire normal compensation values. If this occurs, the acquired compensation values can be enabled by touching However, those values are not guaranteed.
  • Page 231 8.1 Setting Open Circuit Compensation When Open Compensation Failed A window such as the following will be displayed if the compensation process fails. If an error message is displayed and compensation canceled (if you touch ), open compensation will be disabled. Error The open circuit compensation process is quite sensitive to noise - both noise originating externally and induced noise.Therefore, if open circuit compensation has been interrupted with a fault, you should check...
  • Page 232: Short Circuit Compensation

    8.2 Short Circuit Compensation 8.2 Short Circuit Compensation With short circuit compensation, it is possible to reduce the influence of the residual impedance of the test cables and thereby to enhance the accuracy of measurement. It is effective for test samples whose impedance is relatively low. The comparator decision mode can be set as one of the following: Compensation values are obtained for all test frequencies (p.
  • Page 233 8.2 Short Circuit Compensation Before Performing Screen Operations Necessary item: Shorting bar This shorting bar is for short circuiting together the ends of the test leads. Use an object whose impedance is as low as possible. If you use a metallic wire or the like as a shorting bar, try to ensure that it is as thick and short as possible.
  • Page 234: All Compensation

    8.2 Short Circuit Compensation 8.2.1 All Compensation Simultaneously acquire the short compensation values for all measurement frequencies. “To limit the compensation frequency range for all compensation” (p. 218) Procedure LCR Measurement Screen Compensation Screen Short Compensation Press Short Compensation Setting Select and press to close...
  • Page 235 8.2 Short Circuit Compensation The compensation values from last time are dis- Short Compensation (All Compensation) played in a confirmation screen. (If compensation has never been performed, the compensation values become 0.) Check that the measurement cable is in a short-circuit state.
  • Page 236: Spot Compensation

    8.2 Short Circuit Compensation 8.2.2 Spot Compensation Acquire the compensation values at the set measurement frequencies. Measurement frequencies can be set for up to five points. Procedure Short Compensation Setting Select in the short circuit compen- sation screen, and press to confirm the selection.
  • Page 237 8.2 Short Circuit Compensation The compensation values from last time are dis- Short Compensation (Spot Compensation) played in a confirmation screen. (If compensation has never been performed, the compensation values become 0.) Check that the measurement cable is in a short-circuit state.
  • Page 238 8.2 Short Circuit Compensation When Normal Compensation Values were Not Acquired A window such as the following will be displayed if the instrument was unable to acquire normal compen- sation values. If this occurs, the acquired compensation values can be enabled by touching However, those values are not guaranteed.
  • Page 239 8.2 Short Circuit Compensation When You Want to Make Short Circuit Compensation Data Invalid step 3 Select of [Short Compensation Setting] (p. 226) and touch to disable the acquired compensation data. Short Compensation Setting The compensation values that are stored internally are not cleared by the operation described above.
  • Page 240: Compensating Values To Match Reference Values (Load Compensation)

    8.3 Compensating Values to Match Reference Values (Load Compensation) 8.3 Compensating Values to Match Reference Values (Load Compensation) Compensate measurement values to match the element that will be the reference. With load compensation it is possible to calculate the compensation coefficient by measuring a reference sample with known data and perform the compensation for the test data obtained from the target sample.
  • Page 241 8.3 Compensating Values to Match Reference Values (Load Compensation) • Be sure to set the cable length before performing load compensation. See"8.4 Compensating Measurement Cable Errors (Cable Length Compensation)" (p. 245) • Load compensation is enabled when the current measurement conditions match all com- pensation conditions.
  • Page 242 8.3 Compensating Values to Match Reference Values (Load Compensation) Procedure LCR Measurement Screen Compensation Screen Load Compensation Press Load Compensation Setting Select , and press confirm the selection.
  • Page 243 8.3 Compensating Values to Match Reference Values (Load Compensation) Load Compensation to select the number of the load compensation condition to set. Press Set the compensation condition. • Compensation frequency (p. 237) • Compensation cannot be performed if all settings •...
  • Page 244 Compensating Values to Match Reference Values (Load Compensation) 8 .3 Load Compensation Press , the compensation values are acquired. • When data acquisition is completed, the reference sample compensation data is displayed on the screen. • When an error occurs during data acquisition, a “beep”...
  • Page 245 8.3 Compensating Values to Match Reference Values (Load Compensation) LCR Measurement Screen When the load compensation is valid for the set measurement conditions, ON appears on the LOAD parameter in the measurement Screen. When the same compensation frequency has been set to multiple load compensation groups, only the group with the smallest number will be valid.
  • Page 246 8.3 Compensating Values to Match Reference Values (Load Compensation) Setting the Compensation Range Load Compensation Setting Press Compensation Range Setting Select the range for compensation. The range that can be set varies depending on the com- pensation frequency. Ranges Frequency that can Range Settings screen be set...
  • Page 247 8.3 Compensating Values to Match Reference Values (Load Compensation) Setting the measurement signal mode and value for the compensation signal level Load Compensation Setting Press Level Setting Select the measurement signal mode for the compensa- tion signal level. Open circuit voltage (V) mode (p. 54) Constant voltage (CV) mode (p.
  • Page 248 8.3 Compensating Values to Match Reference Values (Load Compensation) Setting the DC Bias Load Compensation Setting Press DC Bias Setting Select ON/OFF for the DC bias. Sets the DC bias to OFF. Sets the DC bias to ON. to enter the DC bias value. Settable range: -5.00 V to 5.00 V (Normal mode) -2.50 V to 2.50 V (low Z high accuracy mode)
  • Page 249 8.3 Compensating Values to Match Reference Values (Load Compensation) Setting of Parameter to Use for Reference Value Load Compensation Setting Press Parameter Setting Select the parameter mode of the reference value to be set. Press to close the setting screen. "1.3.7 Parameter Settings Screen"...
  • Page 250 8.3 Compensating Values to Match Reference Values (Load Compensation) Reference Value Settings Load Compensation Setting Press (reference value1). Reference Value Setting Use the numeric keypad to enter the reference value. Press a instrument key to confirm the setting. Press to confirm the setting. Also set (reference value2) in the same way.
  • Page 251 8.3 Compensating Values to Match Reference Values (Load Compensation) When You Want to Reset All Settings You can clear all settings and repeat the configuration process from the compensation frequency setting by touching Load Compensation Setting When You Want to Use the Current Measurement Conditions as the Load Compensation Conditions You can load the current measurement conditions (frequency, range, measurement signal mode and value for the measurement signal level, and DC bias setting) as the load compensation conditions by...
  • Page 252 8.3 Compensating Values to Match Reference Values (Load Compensation) When Load Compensation Failed If compensation fails, a window like the following appears. An error message is displayed, and if compen- sation is cancelled with , load compensation is turned OFF. Screen When Compensation Failed When You Want to Disable Load Compensation Press...
  • Page 253: Compensating Measurement Cable Errors (Cable Length Compensation)

    Cable length coefficient (p. 345) • When manufacturing your own cables, make sure that the cable length matches the length set with the instrument. (IM3533: 1 m, IM3533-01: 1 m/ 2 m/ 4 m) See: "Points to pay attention to when making your own probe" (p. 32) •...
  • Page 254: Calculating Values (Scaling)

    8.5 Calculating Values (Scaling) 8.5 Calculating Values (Scaling) Scaling applies a compensation function to the measurement value.This function can be used to provide com- patibility among measurement devices. Set the compensation coefficients a and b for the measurement val- ues of the first to fourth parameters to compensate by the following expression. In transformer mode, the compensation coefficients a and b are set relative to the calculation parameter cal- culated value, and compensation is applied using the following expression: "Appendix1 Measurement Parameters and Calculation Formula"(p.
  • Page 255 8.5 Calculating Values (Scaling) Scaling Compensation Setting Select the compensation coefficient of the parameter you want to change. The parameters and compensation coefficient numbers correspond as shown below. Parameter 1 Parameter 2 Parameter 3 Parameter 4 Compensation Coefficient Setting Press When you want to revert the settings to their default values: Press...
  • Page 256 8.5 Calculating Values (Scaling) Compensation Coefficient Setting Touch and use the numeric keypad to set compensation coefficient in the same way as for A. Then touch to accept com- pensation coefficient B. Settable range: -9.99999G to 9.99999G To return to the previous screen without making any change to the set value, press the key when the screen is in the state with nothing being displayed (the...
  • Page 257: Chapter 9 Saving And Loading Panel Information

    • When the life of the built-in battery ends, the measurement conditions will no longer be able to be saved. Ask the store (distributor) from which you purchased the instrument or the nearest HIOKI sales office to replace the instrument’s battery.
  • Page 258 64 to 127 Panels for both LCR and TRANSFORMER measurement modes are included under "LCR". *Because this manual uses screenshots from the IM3533 in this description, "ANALYZER" is not shown. Indicates basic information on the saved panels. In order from the left...
  • Page 259: Saving Measurement Conditions (Panel Save Function)

    Total of up to 60 items Measurement Condition ANALYER Measurement Condition Up to 2 items (IM3533-01 only) Compensation Value Up to 128 items Although only one panel is saved when the save type is set to , that data counts as one measurement condition and one compensation value.
  • Page 260 Press to close the setting screen. When ANALYZER mode (IM3533-01 only) You can save a panel in the same way in ANALYZER mode. ANALYZER Initial Screen Common Settings...
  • Page 261 9.1 Saving Measurement Conditions (Panel Save Function) Saving measurement conditions Procedure LCR measurement Screen LCR Application Settings LCR Application Settings Press Panel Main Screen to select the number of the panel to save. • Display range: No. 001 to No. 128 •...
  • Page 262 9.1 Saving Measurement Conditions (Panel Save Function) When is selected You can check the information of a saved panel: Panel Information Confirmation to switch to the information of the previous or next panel. When you want to return to the Panel Main screen: Press Panel Save The save name and the measurement condition to be...
  • Page 263 9.1 Saving Measurement Conditions (Panel Save Function) step 4 After you enter the save name, press to return to , and press confirm saving. Panel Overwrite Confirmation When saving to a panel that has already been saved, a window confirming that you wish to overwrite the existing data will be displayed.
  • Page 264: Loading Measurement Conditions (Panel Load Function)

    9.2 Loading Measurement Conditions (Panel Load Function) 9.2 Loading Measurement Conditions (Panel Load Function) You can read saved measurement conditions with the panel load function. Procedure LCR measurement Screen LCR Application Settings LCR Application Settings Press Panel Main Screen to select the number of the panel to load.
  • Page 265 9.2 Loading Measurement Conditions (Panel Load Function) When is selected You can check the information of a saved panel: Panel Information Confirmation to switch to the information of the previous or next panel. When you want to return to the Panel Main screen: Press Panel Load Confirmation...
  • Page 266: Changing A Panel Name

    9.3 Changing a Panel Name 9.3 Changing a Panel Name You can change the name of a panel saved to the instrument. Procedure LCR Measurement Screen LCR Application Settings LCR Application Settings Press Panel Main Screen to select the number of the panel to rename.
  • Page 267 9.3 Changing a Panel Name Panel Main Screen Press Change Panel Name Change Panel Name Enter the save name. (Up to 10 characters) Deletes all input characters. Deletes the last character. Changes the keyboard type. Change Panel Name After you enter the new save name, press to confirm the name.
  • Page 268: Deleting A Panel

    9.4 Deleting a Panel 9.4 Deleting a Panel You can delete a panel saved to the instrument. Procedure LCR Measurement Screen LCR Application Settings LCR Application Settings Press Panel Main Screen to select the number of the panel to delete. Press...
  • Page 269 9.4 Deleting a Panel Panel Main Screen Press Some of the information saved to the panel is displayed. Panel Delete Confirmation Check the information saved to the panel. A panel cannot be restored once it is deleted. When you want to cancel deletion: Press Press Press...
  • Page 270 9.4 Deleting a Panel...
  • Page 271: Chapter 10 Setting The System

    10.1 Setting the Interface Setting the Chapter 10 SYSTEM 10.1 Setting the Interface You can control the instrument from a computer via the USB, GP-IB, RS-232C and LAN interfaces. Printing can also be performed with RS-232C printer. • The GP-IB, RS-232C, and LAN settings can only be configured when the optional Z3000 (GP- IB), Z3001 (RS-232C), or Z3002 (LAN) is installed.
  • Page 272: Checking The Version Of The Instrument

    10.2 Checking the Version of the Instrument 10.2 Checking the Version of the Instrument Procedure You can check the version in mode, mode, or mode. LCR Measurement Screen Instrument Info Instrument Info Check the version of the instrument. Press to close the setting screen.
  • Page 273: Self Checks (Self Diagnosis)

    Perform panel compensation (p. 266) if they are not highlighted or the red appears. If there is still problem after performing panel calibration, the panel may be malfunctioning. Contact your autho- rized Hioki distributor or reseller.
  • Page 274 10.3 Self Checks (Self Diagnosis) Panel Compensation You can perform position compensation of the touch panel. Procedure You can perform this compensation procedure in mode, mode, or mode. LCR Measurement Screen Self Checks Self Checks Press Panel Compensation Press in the location of continuously until the green appears.
  • Page 275 10.3 Self Checks (Self Diagnosis) Panel Compensation Complete Press to close the setting screen. Press to start panel compensation from the beginning. If the indication does not appear, the instru- ment needs to be repaired. Contact your authorized Hioki distributor or reseller.
  • Page 276 10.3 Self Checks (Self Diagnosis) Screen Display Test Check the display state of the screen and lighting state of the LEDs. Procedure You can check the display state and lighting state in mode, mode, or mode. LCR Measurement Screen Self Checks Self Checks Press...
  • Page 277 LEDs do not turn on as All LEDs turn on shown in the figure on the left, the instrument needs to be repaired. Contact your authorized Hioki distributor or re- seller. All LEDs turn off Green...
  • Page 278 If the overall judgment result indication is , the in- the test ended normally. strument needs to be repaired.Contact your authorized Hioki distributor or reseller. ROM/RAM Test (When IM3533) ROM/RAM Test (When IM3533-01) Overall judgment result Press to close the setting screen.
  • Page 279 10.3 Self Checks (Self Diagnosis) I/O Test Check whether an output signal is output normally from the EXT I/O, and whether an input signal is read nor- mally. Procedure You can perform the I/O test in mode, mode, or mode. LCR Measurement Screen Self Checks Self Checks...
  • Page 280: Setting The Date And Time

    10.4 Setting the Date and Time 10.4 Setting the Date and Time You can set the date and time of the instrument. Data is recorded and managed based on the set date and time. Procedure You can set the date and time in mode, mode, or mode.
  • Page 281: Drive

    Compatible USB device USB Mass Storage Class • Hioki cannot recover data from damaged or faulty storage media resulting from abnor- malities. We are also unable to provide compensation for such data loss,regardless of the contents or cause of the failure or damage. We recommend making a backup of all important data such as a computer.
  • Page 282: Inserting And Removing Usb Flash Drive

    11.1 Inserting and Removing USB flash drive 11.1 Inserting and Removing USB flash drive Inserting a USB flash drive Front Inert the USB flash drive into the USB port on the front panel of the instrument. • Do not insert a USB flash drive that is not Mass Storage Class compatible. •...
  • Page 283: About The File Operation Screen

    11.2 About the File Operation Screen 11.2 About the File Operation Screen This screen displays a list of the files saved in the USB flash drive. It also allows you to perform file operations such as creating a folder and deleting a file. The instrument can rec- ognize file names of up to 127 single-byte characters.
  • Page 284: About The File Save Setting Screen

    11.3 About the File Save Setting Screen 11.3 About the File Save Setting Screen You can configure settings such as the file save format, save destination, and text save format. Check the settings before using the file save function. Procedure Insert the USB flash drive into the USB port (front panel).
  • Page 285: Saving Measurement Data

    DATE: ON, SET: ON, PARA: ON, DELIM: " , " (comma), QUOTE: " (double quotation mark) When LCR mode When ANALYZER mode When TRANSFORMER mode (IM3533-01 only) "HIOKI E.E. CORPORATION","IM3533-01","Ver. 1.00", "HIOKI E.E. CORPORATION","IM3533","Ver. 1.00", "HIOKI E.E. CORPORATION","IM3533","Ver. 1.00", "Serial No. 123456789" "Serial No. 123456789" "Serial No. 123456789"...
  • Page 286 11.4 Saving Measurement Data Procedure Insert the USB flash drive into the USB port (front panel). LCR Measurement Screen File Save Setting Screen File Save Setting Screen Press File Type Setting Enable the text file type. Disables the text file type. Saves measurement values as text data.
  • Page 287 Does not record the save date and time. Records the save date and time. Press to close the setting screen. When OFF When ON "HIOKI E.E. CORPORATION","IM3533","Ver. 1.00", "HIOKI E.E. CORPORATION","IM3533","Ver. 1.00", "Serial No. 123456789" "Serial No. 123456789" "DATE","11-11-30" "FREQ","1.0000E+03","Hz"...
  • Page 288 Select ON/OFF for the measurement condition setting. Does not record the measurement condition. Records the measurement condition. Press to close the setting screen. When ON When OFF "HIOKI E.E. CORPORATION","IM3533","Ver. 1.00", "HIOKI E.E. CORPORATION","IM3533","Ver. 1.00", "Serial No. 123456789" "Serial No. 123456789" "DATE","11-11-30" "DATE","11-11-30" "TIME","10:10:06"...
  • Page 289 Select ON/OFF for measurement parameter recording. Does not record the measurement parameter. Records the measurement parameter. Press to close the setting screen. When ON When OFF "HIOKI E.E. CORPORATION","IM3533","Ver. 1.00", "HIOKI E.E. CORPORATION","IM3533","Ver. 1.00", "Serial No. 123456789" "Serial No. 123456789" "DATE","11-11-30" "DATE","11-11-30" "TIME","10:10:06"...
  • Page 290 Sets the delimiter to a semicolon (;). Sets the delimiter to a space. Press to close the setting screen. When comma When tab "HIOKI E.E. CORPORATION" "IM3533" "Ver. 1.00" "HIOKI E.E. CORPORATION","IM3533","Ver. 1.00", "Serial No. 123456789" "Serial No. 123456789" "DATE" "11-11-30" "DATE","11-11-30"...
  • Page 291 Sets the quotation mark to a double quotation mark ("). Sets the quotation mark to a single quotation mark ('). Press to close the setting screen. When OFF When double quotation mark HIOKI E.E. CORPORATION,IM3533,Ver. 1.00, "HIOKI E.E. CORPORATION","IM3533","Ver. 1.00", Serial No. 123456789 "Serial No. 123456789" DATE,11-11-30 "DATE","11-11-30"...
  • Page 292 11.4 Saving Measurement Data Press USB Flash Drive Recognition Press in the measurement screen. The measurement data is saved. When is pressed, a folder is automatically created in the USB flash drive and the file is saved. • The date is used for the name of the folder cre- ated when you press •...
  • Page 293 11.4 Saving Measurement Data Error measurement results When LCR mode, ANALYZER mode, CONTINUOUS measurement mode When saved by the memory function Measurement Values Comparator (Upper Portion: When text save, Measure- Measurement Measurement Error Screen Indication the memory function (short Format), ment Lower Portion: When the memory function Each...
  • Page 294 11.4 Saving Measurement Data When TRANSFORMER mode When saved by the memory function Measurement Values (Upper Portion: When text save, Measurement Error Screen Indication the memory function (short Format), Lower Portion: When the memory function Comparator Measurement (Long Format)) 999999E+28 Outside of display range*1 9999999999E+28...
  • Page 295: Saving A Copy Of The Screen

    11.4 Saving Measurement Data Saving a Copy of the Screen You can save the screen currently displayed to the USB flash drive in bmp file format (256 colors or mono- chrome [2 colors]). The file extension is [.bmp]. Procedure Insert the USB flash drive into the USB port (front panel). LCR Measurement Screen File Save Setting Screen File Save Setting Screen...
  • Page 296 11.4 Saving Measurement Data USB Flash Drive Recognition Press in the [Measurement Screen]. A copy of the screen is saved. When is pressed, a folder is automatically created in the USB flash drive and the file is saved. • The date is used for the name of the folder cre- ated when you press •...
  • Page 297 11.4 Saving Measurement Data Example of screen copy When LCR mode When ANALYZER mode (IM3533-01 only) When TRANSFORMER mode...
  • Page 298: Checking The Contents Of Files

    11.4 Saving Measurement Data Checking the Contents of Files You can check files saved to a USB flash drive in text format ([TXT], [CSV]) and BMP format on the screen. Procedure Insert the USB flash drive into the USB port (front panel). LCR Measurement Screen File List Screen File Selection...
  • Page 299: Changing The Save Folder

    11.4 Saving Measurement Data Changing the Save Folder You can set the save destination for data automatically or set the desired folder. Procedure Insert the USB flash drive into the USB port (front panel). LCR Measurement Screen File Save Setting Screen File Save Setting Screen Press Save Folder Setting...
  • Page 300 11.4 Saving Measurement Data The following restrictions apply to the folder that can be selected with • The folder name must be all single-byte characters (a folder name containing Japanese or other double-byte characters cannot be specified). • The folder name must be no more than 12 characters. Press to close the setting screen.
  • Page 301: Saving Instrument Settings

    11.5 Saving Instrument Settings 11.5 Saving Instrument Settings Saving Instrument Settings Save various setting information of the instrument as a setting file to the USB flash drive. The extension of the setting file is “.SET.” This function is convenient for when you want to back up the setting state of the instrument.
  • Page 302 11.5 Saving Instrument Settings Save Instrument Settings Press in the save confirmation screen. The measurement data is saved. [SETTING] • The setting file is saved to the folder in the USB flash drive. • The date and time are automatically assigned to the file name.
  • Page 303: Saving Instrument Settings

    11.5 Saving Instrument Settings Saving All Settings of Instrument (ALL SAVE Function) Save various setting information of the instrument including the panel save information as a setting file to the USB flash drive. The extension of the setting file is “.SET.” The extension of the panel save is “.PNL.” For the settings that are saved, refer to "Appendix12 Initial Settings Table"(p.
  • Page 304 11.5 Saving Instrument Settings File List Screen Press Save All Instrument Settings Press in the save confirmation screen. The measurement data is saved. • The setting file and panel save data are saved to a folder of the save date and time that is created [SETTING] automatically in the folder.
  • Page 305: Loading Instrument Settings

    11.6 Loading Instrument Settings 11.6 Loading Instrument Settings Loading instrument settings Read a setting file or panel save file that is saved to the USB flash drive, and restore the settings. Procedure Insert the USB flash drive into the USB port (front panel). LCR Measurement Screen File List Screen Folder Selection...
  • Page 306 11.6 Loading Instrument Settings Setting File Selection to select the setting file or panel save file to read. When you want to check a saved file’s contents: Press Press When is selected Step You can check the contents of the file selected in Instrument Settings Confirmation screen When you want to return to the Setting File Selection screen:...
  • Page 307 11.6 Loading Instrument Settings When the Read Confirmation Screen Appears Setting File Load Error If an error appears when is pressed, one of the following are likely to be cause. • The setting file is damaged. • The file is not a setting file that can be read by the instrument.
  • Page 308: Loading All Settings Saved On A Usb Flash Drive

    11.6 Loading Instrument Settings Loading all settings saved on a USB flash drive (ALL LOAD Function) Load and restore instrument settings, including panels saved to USB memory using the all save function. "Saving All Settings of Instrument (ALL SAVE Function)" (p. 295) Procedure Insert the USB flash drive into the USB port (front panel).
  • Page 309 11.6 Loading Instrument Settings Folder Selection Using the buttons, select the folder to which settings were saved with the all save function. Setting File Selection Using the buttons, set [TYPE] [ALL] files. Press Read Settings Press in the read confirmation screen.
  • Page 310: File And Folder Operations

    11.7 File and Folder Operations 11.7 File and Folder Operations You can edit files and folders saved to the USB flash drive. Formatting a USB Flash Drive Perform this operation if the USB flash drive to be used is not formatted (initialized). Insert the USB flash drive to be formatted into the USB port (on the front panel) (p.
  • Page 311 11.7 File and Folder Operations Press Format USB Flash Drive A confirmation screen appears. Press When you want to cancel the format: Press Formatting No operation is possible during formatting. When formatting ends, the file list screen is redisplayed. • When you perform a format, all of the data saved to the USB flash drive is deleted and cannot be restored.
  • Page 312: Deleting Files And Folders

    11.7 File and Folder Operations Deleting Files and Folders You can delete a file or folder saved to the USB flash drive. Procedure Insert the USB flash drive into the USB port (front panel). LCR Measurement Screen File List Screen File List Screen Select the file or folder you wish to delete with and touch...
  • Page 313 11.7 File and Folder Operations Creating Folders Procedure Insert the USB flash drive into the USB port (front panel). LCR Measurement Screen File List Screen File List Screen Press File List Screen Press...
  • Page 314 11.7 File and Folder Operations Input Folder Name Input Folder Name Enter the save name. (Up to 12 characters) Deletes all input characters. Deletes the last character. Changes the keyboard type. Input Folder Name Press to create a folder. Press to close the setting screen.
  • Page 315: Displaying The Usb Flash Drive Information

    11.7 File and Folder Operations Displaying the USB Flash Drive Information You can check the usage rate and file system of the USB flash drive. Procedure Insert the USB flash drive into the USB port (front panel). LCR Measurement Screen File List Screen File List Screen Press the part indicating the disc information.
  • Page 316 11.7 File and Folder Operations...
  • Page 317: External Input/Output Connector And Signals

    12.1 External Input/Output Connector and Signals Chapter 12 External Control The EXT I/O connector on the rear of the instrument supports external control by providing output of the end- of-measurement and comparator decision signals, and accepting input of measurement trigger and panel load signals. All signals are isolated by optocouplers (inputs and outputs share a common signal ground (ISO_COM signal ground).) Confirm input and output ratings, understand the safety precautions for connecting a control system, and use accordingly.
  • Page 318: Connector Type And Signal Pinouts

    • DCSP-JB37PR (pressure weld type) Japan Aviation Electronics Industry Ltd. EXT I/O Connector (Instrument Side) LCR mode (p. 318) ANALYZER mode (IM3533-01 only) (p. 322) TRANSFORMER mode (p. 322) CONTINUOUS measurement mode (p. 323) The connector shell is conductively connected to the metal instrument chassis and the...
  • Page 319 12.1 External Input/Output Connector and Signals LCR mode Signal name Function Logic TRIG External trigger (p. 316) Pos/ Edge (Unused) (Unused) Select panel number (p. 316) Level Select panel number (p. 316) Level Select panel number (p. 316) Level (Unused) ISO_5V Isolated 5 V power output ISO_COM...
  • Page 320 Outputs LO comparator judgment results for the No. 3 parameter. BIN8 Level BIN judgment results BIN10 Level BIN judgment results (Unused) (Unused) (Unused) ANALYZER mode (IM3533-01 only) Signal name Function Logic TRIG External trigger (p. 316) Pos/ Edge (Unused) (Unused) Select panel number (p.
  • Page 321 12.1 External Input/Output Connector and Signals Signal name Function Logic Signal indicating that A/D conversion for the measurement cir- INDEX cuit has completed: When this signal changes from high (off) to Edge low (on), the sample may be changed. (Unused) (Unused) (Unused) (Unused)
  • Page 322 12.1 External Input/Output Connector and Signals Signal name Function Logic LD_VALID Level Execute panel load (p. 316) ISO_COM Isolated common signal ground Measurement complete signal: When this signal is output, the Edge comparator judgment results have been finalized. Signal indicating that A/D conversion for the measurement cir- INDEX cuit has completed: When this signal changes from high (off) to Edge...
  • Page 323 12.1 External Input/Output Connector and Signals Signal name Function Logic (Unused) (Unused) (Unused) (Unused) (Unused) (Unused) (Unused) ISO_COM Isolated common signal ground Measurement complete signal: When this signal is output, the Edge comparator judgment results have been finalized. Signal indicating that A/D conversion for the measurement cir- INDEX cuit has completed: When this signal changes from high (off) to Edge...
  • Page 324: Signal Function Details

    12.1 External Input/Output Connector and Signals Signal function details You can select rising or falling for the valid edge of a trigger. "Enabling Trigger Input for during Measurement and Setting the Valid Edge of Trigger Input" (p. 136) Input TRIG •...
  • Page 325 12.1 External Input/Output Connector and Signals Error output Comparator Measurement BIN Measurement Logical Each Parameter Measurement Product BIN1 to BIN10, Pin No. 10 Pin Error Display Judgment Result OUT_OF_BINS Error Nos. 11 to 15 and Pin Nos. 11, 12, 13, Pin No.
  • Page 326: Timing Chart

    12.2 Timing Chart 12.2 Timing Chart 12.2.1 LCR Mode If you set the judgment condition for the comparator (the trigger setting is external trigger) and then in that state a trigger signal is input from the EXT I/O or is pressed in the screen, the judgment result is output from the signal line for comparator result output of the EXT I/O after measurement ends.
  • Page 327 12.2 Timing Chart Timing Chart Interval Descriptions Time Interval Description (Approximate)  From Comparator, BIN Judgement Result to EOM (LOW): Setting value for delay time  From EOM width (LOW) to TRIG (LOW): Minimum time from end of measurement to next trigger From TRIG(LOW) to INDEX (HIGH): Time from trigger to circuit response 1 ms INDEX width (HIGH): Minimum chuck time, switching chuck with INDEX (LOW) is possible...
  • Page 328 12.2 Timing Chart • The shorter the measurement time, the shorter the time that INDEX and EOM are high (off). When the high (off) time is too short due to characteristics of the input circuit, the instru- ment can be configured to maintain the low (on) state for a preset time once EOM changes to low (on) before reverting the signal to high (off) after the completion of mea- surement.
  • Page 329: Analyzer Mode (Im3533-01 Only)

    12.2 Timing Chart 12.2.2 ANALYZER Mode (IM3533-01 only) Touching on the screen asking whether to input the trigger signal from EXT I/O in ANALYZER mode will result in the following output. Furthermore, if the panel number is selected with the panel load signal when a trigger signal is input from the EXT I/O, the measurement condition of that panel number is loaded and then measurement is performed.
  • Page 330: 3Transformer Mode

    12.2 Timing Chart 12.2.3 TRANSFORMER Mode If you set the judgment condition for the comparator and then in that state a trigger signal is input from the EXT I/O or is pressed in the screen, the judgment result is output from the signal line for compar- ator result output of the EXT I/O after measurement ends.
  • Page 331: 4Continuous Measurement Mode

    12.2 Timing Chart 12.2.4 CONTINUOUS Measurement Mode Inputting a trigger signal from EXT I/O or touching on the screen in CONTINUOUS measurement mode will cause the No. 1 and No. 3 parameter judgment results for the first and second items to be output from the EXT I/O comparator result output signal lines after measurement of all panel numbers set to be exe- cuted on the screen.
  • Page 332 12.2 Timing Chart • In the continuous measurement screen, comparator result output signals other than AND and panel load signals (LD-VALID, LD0 to LD6) cannot be used. See: "Chapter 7 CONTINUOUS Measurement Function" (p. 209) • Whether the comparator judgment results are reset when the signal changes to EOM (HIGH) or updated when measurement completes can be selected on the instrument or using a communica- tion command.
  • Page 333: Internal Circuitry

    12.3 Internal Circuitry 12.3 Internal Circuitry Input Circuit PLC, etc. Internally Isolated 5 V Output Common Internally Isolated Common Signal Ground Do not apply external power Output Circuit PLC, etc. Internally Isolated 5 V Input Zener Voltage Common Internally Isolated Common Signal Ground...
  • Page 334: Electrical Specifications

    12.3 Internal Circuitry Electrical Specifications Input Signals Input type Optocoupler-isolated, non-voltage contact inputs (source input, active-low) Input asserted (ON) voltage 1 V or less Input de-asserted (OFF) voltage Open or 5 to 30 V Input asserted (ON) current 3 mA/ch Maximum applied voltage 30 V Output Signals...
  • Page 335: Internal Circuitry

    12.3 Internal Circuitry Connection Examples Input Circuit Connection Examples Input Input Switch Connections Relay Connections Common Input Output Input Output Common PLC Output (Sink Output) Connections PLC Output (Source Output) Connections Output Circuit Connection Output Output Examples LED Connection Relay Connections Output Output Active-Low...
  • Page 336: External I/O Settings

    12.4 External I/O Settings 12.4 External I/O Settings There are the following setting items for the output timing of the judgment result output signal and the logic of the trigger signal. Setting Delay Time from Output of Comparator and BIN Judgment Results until Output of EOM (LOW) The delay time for the period from the output of the comparator and BIN judgment results until the output of EOM (LOW) from the EXT I/O can be set on the instrument or by a communication command.
  • Page 337: External Control Q&A

    12.5 External Control Q&A 12.5 External Control Q&A Common Questions Answers Connect the (active low) TRIG input pin to an ISO_COM pin using a switch How do I connect external trigger input? or open-collector output. Which pins are common ground for The ISO_COM pins.
  • Page 338 12.6 Measurement Using a Computer...
  • Page 339: Chapter 13 Printing

    13.1 Connecting the Printer Chapter 13 Printing Printing (p. 334) Connecting the printer Make instrument Make printer • Measurement values and to the instrument settings (p. 333) settings comparator decisions • Statistical calculation results 13.1 Connecting the Printer Connecting the Printer Because electric shock and instrument damage hazards are present, always follow the steps below when connecting the printer.
  • Page 340: Connecting The Printer To The Instrument

    13.1 Connecting the Printer Connecting the Printer to the Instrument Procedure Confirm that the instrument and Printer are turned off. AC Adapter Printer Connect the AC Adapter to the Printer, and insert the power plug into an outlet. Connect the RS-232C Cable to the RS-232C connectors on the instrument and printer.
  • Page 341: Instrument And Printer Settings

    Prints the screen. Manual Print Outputs the measurement values only when of the measure- ment screen is pressed. In ANALYZER mode (IM3533-01 only), [TYPE] cannot be selected. Auto Print Only the screen can printed. Outputs the measurement values af- ter measurement finishes.
  • Page 342: Printing

    • When set to use an external trigger, pressing causes the measurement data to be printed. When the Printing Method is Set to Prints the state when is pressed in the measurement screen. When LCR Mode When ANALYZER Mode (IM3533-01 only) When TRANSFORMER Mode...
  • Page 343 When the display is enlarged, the print type is text even when [TYPE] is set to When ANALYZER Mode (IM3533-01 only) In ANALYZER mode, the [TYPE] setting can only be set to a copy of the screen. When TRANSFORMER Mode...
  • Page 344 [TYPE] setting is When measurement values are being displayed, they are printed as text. When ANALYZER (IM3533-01 only) results are being displayed, they are printed as a copy of the Measurement value display ANALYZER result display The printer cannot be configured in CONTINUOUS measurement mode. To change the printer settings, place the instrument in LCR mode, ANALYZER mode (IM3533-01 only), or TRANSFORMER mode.
  • Page 345: Chapter 14 Specifications

    (4) CONTINUOUS measurement mode: Continuous measurement of saved conditions • LCR mode ....Up to 60 • ANALYZER mode ..Up to 2 (IM3533-01 only) * Continuous measurement using mixed LCR mode and ANALYZER mode operation is also supported (IM3533-01 only).
  • Page 346: Basic Specifications

    14.1 General Specifications 1.Basic Specifications    ± Output impedance Normal mode: 100    ± (Hc terminal, when 1 kHz) Low impedance accuracy mode: 25 Measurement signal level (1) Open circuit terminal voltage (V) mode and constant voltage (CV) mode •...
  • Page 347 14.1 General Specifications 1.Basic Specifications Period of guaranteed 1 year accuracy Warm-up time At least 60 minutes Measurement time Approx. 2.0 ms (1 kHz, FAST, no screen display) Measurement speed FAST, MED, SLOW, SLOW2 Terminal structure 4-terminal structure   Backup battery life Approx.
  • Page 348 • Open and short circuit compensation • Load circuit compensation • Cable length compensation IM3533: 0 m, 1 m (Guaranteed accuracy up to 4 m) IM3533-01: 0 m, 1 m, 2 m, 4 m Correlation compensation Enter the compensation coefficients a and b of the following expression.
  • Page 349 14.1 General Specifications 3.Interface Display 5.7-inch color TFT, touch panel Handler interface Equipped as standard USB interface Equipped as standard, full speed/hi speed compatible USB memory Measurement conditions, measurement values, and screens can be saved. Measurement conditions can be loaded. Supported operations: display of saved measurement values and screens, file deletion, fold- er creation, and formatting Optional units...
  • Page 350: Measurement Range And Accuracy

    14.2 Measurement Range and Accuracy 14.2 Measurement Range and Accuracy Impedance measurement The measurement accuracy is calculated from a basic accuracy, which is based on the accuracy for  ° impedance Z (% rdg.) and phase angle ), and the following coefficients. Measurement accuracy = Basic accuracy ×...
  • Page 351 14.2 Measurement Range and Accuracy Accuracy table (IM3533 and IM3533-01)  ° Upper portion: Impedance Z (Unit: %) Lower portion: Phase angle (Unit: 1 mHz to 100.00 Hz to 1.0000 kHz to 10.001 kHz to 100.01 kHz to Range 99.999 Hz 999.99 Hz...
  • Page 352 14.2 Measurement Range and Accuracy Measurement speed coefficient The coefficient corresponding to the setting for measurement speed is obtained from the measurement speed coefficient table and then multiplied by the basic accuracy. When the measurement frequency is 0.001 Hz to 0.999 Hz, the SLOW2 coefficient is used, regardless of the measurement speed.
  • Page 353 Cable length  coefficient 100 k range or greater ------ - ------ - IM3533-01 fm: Measurement frequency [kHz] IM3533 guaranteed accuracy range (frequency)   Cable length 10 k range or less 100 k range or greater Up to 200 kHz...
  • Page 354 14.2 Measurement Range and Accuracy Guaranteed Accuracy Range The guaranteed accuracy range is as follows. The guaranteed accuracy range varies with the sample’s impedance. 0.001 Hz to 100.00 Hz to 1.0000 kHz to 10.001 kHz to 100.01 kHz to Range Sample impedance 99.999 Hz 999.99 Hz...
  • Page 355 14.2 Measurement Range and Accuracy Example calculation of basic accuracy  • Impedance (Z=50 ) basic accuracy (For example) Measurement conditions: measurement frequency=10 kHz, measurement speed=SLOW2 Accuracy table (p.343) 1.0000 kHz to range 10.000 kHz 10 k A= 0.15 B= 0.02 100 ...
  • Page 356 14.2 Measurement Range and Accuracy • Capacitance (Cs=160 nF) basic accuracy (For example) Measurement conditions:measurement frequency=1 kHz, measurement speed=SLOW2 Accuracy table (p.343) 1.0000 kHz to range 10.000 kHz 100 k A= 0.05 B= 0.02 10 k  A= 0.03 B= 0.02 1 k...
  • Page 357 Conversion table from C and L to |Z| Frequency (Hz) Temperature measurement Pt sensor Sheath-type temperature probe HIOKI 9478 Measurement conditions At least 60 min. after power supply activation Temperature and humidity: 23±5°C, 80% rh or less Accuracy Guaranteed accuracy range -10.0°C to 99.9°C...
  • Page 358: About Measurement Times And Measurement Speed

    14.3 About Measurement Times and Measurement Speed 14.3 About Measurement Times and Measurement Speed Measurement times differ depending on the measurement conditions. Refer to the following values. All of the values are reference values. Note that they may differ depending on the condi- tions of use.
  • Page 359 14.3 About Measurement Times and Measurement Speed Measurement times (EOM) Measurement times= INDEX + A + B + C + D + E + F Calculation time (no OPEN /SHORT/ LOAD compensation, HOLD range, no screen display nor- mal measurement) FAST SLOW SLOW2...
  • Page 360 14.3 About Measurement Times and Measurement Speed Wait time • When the frequency is changed: When the frequency is changed, the wait time is 1 ms. However, a 3 ms wait time will be used if the measurement frequency change spans the two ranges of (1 mHz to 39.999 Hz) and (40 Hz to 200 kHz).
  • Page 361: Chapter 15 Maintenance And Service

    Hioki representative. However, in the following cases, immediately stop using the instrument, unplug the power cord and contact your authorized Hioki distributor or reseller. • When the nature of the damage is clearly evident • When measurement is impossible •...
  • Page 362 15.1 Inspection, Repair and Cleaning Transporting the instrument • Pack the instrument so that it will not sustain damage during shipping, and include a description of existing damage. We do not take any responsibility for damage incurred during shipping. • Use the original packing materials when transporting the instrument, if possible. Cleaning •...
  • Page 363: Troubleshooting

    15.2 Troubleshooting 15.2 Troubleshooting Before returning for repair In the event of the instrument malfunctioning, check the following items. Symptom Check Item, or Cause Remedy and Reference The display does not Confirm that the power cord is properly con- Is the power cord unplugged? appear when you turn nected.
  • Page 364 15.2 Troubleshooting Symptom Check Item, or Cause Remedy and Reference Change the signal level setting. Is the signal level setting too low? See (p. 52) Check the item indicated by the error display, address the cause, and then perform measure- ment.
  • Page 365 15.2 Troubleshooting Symptom Check Item, or Cause Remedy and Reference Check the item indicated by the error dis- Is an error from "15.3 Error display" (p. 360) be- play, address the cause, and then perform ing displayed? measurement. See (p. 360) If the range is not appropriate: Change to an appropriate range or perform measurement using auto ranging.
  • Page 366 15.2 Troubleshooting Symptom Check Item, or Cause Remedy and Reference The LCD appears Press the LCD screen gently. Slight blurring Are you pressing the LCD screen too hard? blurred. may occur but this is normal. Use guarding. Is a high-impedance element which is influenced by AUTO ranging is un- noise being measured? See (p.A3)
  • Page 367 • When you have forgotten the passcode for the key lock. If the instrument still does not operate normally after the full reset, it needs to be repaired. Contact your dealer, or a Hioki representative if you are not sure where the instrument was purchased. Opening Screen Connect the power cable.
  • Page 368: Error Display

    Error display Description Remedy and Reference The instrument needs to be repaired. The life of the RAM backup battery has Contact your authorized Hioki distributor ended. or reseller. Increase the measurement signal level This is displayed when a measurement or change the measurement range to...
  • Page 369 15.3 Error display Error display Description Remedy and Reference • Because the instrument’s H ter- minal output switch has been turned This is displayed when an overcurrent is off, no current will flow. To resume detected while the DC bias setting is on. measurement, input a trigger.
  • Page 370: Discarding The Instrument

    15.4 Discarding the Instrument 15.4 Discarding the Instrument When disposing of this instrument, remove the lithium battery and dispose of battery and instrument in accordance with local regulations. • To avoid electric shock, turn off the power switch and disconnect the power cord and measurement cables before removing the lithium battery.
  • Page 371: Appendix

    Appendix1 Measurement Parameters and Calculation Formula Appendix Appendix1 Measurement Parameters and Calculation Formula In general, impedance is used to evaluate the characteristics of, for example, circuit components. Measure voltage and current vectors for circuit components relative to AC measurement frequency sig- ...
  • Page 372: Appendix1 Measurement Parameters And Calculation Formula

    Appendix1 Measurement Parameters and Calculation Formula From the voltage which is applied between the terminals of the sample under test, the current I which  flows through the test sample at this time, the phase angle between this voltage and this current I, ...
  • Page 373: Appendix2 Measurement Of High Impedance Components

    Appendix2 Measurement of High Impedance Components Appendix2 Measurement of High Impedance Components The measured value obtained when testing a high impedance element (such as, for example, a resistor with  resistance higher than 100 k ) is sometimes unreliable, because such an element is vulnerable to the effects of external interference and the like.
  • Page 374: Appendix3 Measurement Of In-Circuit Compo- Nents

    Appendix3 Measurement of In-circuit Components Appendix3 Measurement of In-circuit Compo- nents Measure an in-circuit component after providing guarding.  --------------------------------- - Referring to the following figure, when measuring a resistance value for the resistor 2 , even if the tips of the two probes are contacted against the ends of the resistor 2 , considering the sum of the cur- rent flowing through the resistor...
  • Page 375: Appendix4 Countermeasures Against Incorpo- Ration Of External Noise

    Appendix4 Countermeasures Against Incorporation of External Noise Appendix4 Countermeasures Against Incorpora- tion of External Noise The unit is designed to be resistant to errors caused by interference from the test cables or the power supply line. However, if the level of the interference is particularly large, this can cause measurement errors or faulty operation.
  • Page 376 Appendix4 Countermeasures Against Incorporation of External Noise Attaching an EMI Suppression Ferrite Core to the Power Cord Pass the power cord through a commercially available EMI suppression ferrite core and secure the core as close as possible to the AC power inlet of the unit in order to suppress the incorporation of noise from the power line.
  • Page 377: Appendix5 Supplying Dc Bias

    DC Bias Voltage Circuit R or L (>>Z) Capacitor DC voltage source IM3533 Sample to be tested GUARD • Use a resistance (R) or inductance (L) which has a large enough impedance with reference to the sample under test (Z).
  • Page 378 Appendix5 Supplying DC Bias • In order to avoid electric shock accident, be absolutely sure not to touch the test termi- nals while the DC bias voltage is being supplied to them. • If you disconnect the sample under test from the test terminals with the DC bias voltage still being supplied, then the test sample is left charged, which is very dangerous.
  • Page 379: Appendix5.2How To Supply A Dc Bias Current

    Choke coil Capacitor DC current source IM3533 Sample to be tested • Connect the sample to the measuring probe and then gradually raise the voltage of the DC source to the specified DC bias level. To disconnect the sample, gradually reduce the voltage of the DC source until the DC bias supplied to the sample is decreased to zero.
  • Page 380: Appendix6 The Residual Charge Protection Function

    Appendix6 The Residual Charge Protection Function Appendix6 The Residual Charge Protection Function The instrument has been enhanced by the incorporation of a residual charge protection function. If by mistake a charged capacitor is connected to the measurement terminals, this function protects the internal circuitry of the instrument from discharge of such residual charge.
  • Page 381: Appendix7 Series Equivalent Circuit Mode And Parallel Equivalent Circuit Mode

    Appendix7 Series Equivalent Circuit Mode and Parallel Equivalent Circuit Mode Appendix7 Series Equivalent Circuit Mode and Parallel Equivalent Circuit Mode The instrument measures the current flowing to the test sample and the voltage at both ends of the test sam- ple, and determines Z and .
  • Page 382: Appendix8 Open Circuit Compensation And Short Circuit Compensation

    Appendix8 Open Circuit Compensation and Short Circuit Compensation Appendix8 Open Circuit Compensation and Short Circuit Compensation The residual impedance component of the test fixture can be considered in terms of an equivalent circuit as shown in the figure. Further, because the measured value for impedance includes this residual compo- nent, therefore, in order to obtain the genuine impedance value, it is necessary to compensate the measured value in terms of the open circuit impedance residual component and the short circuit residual component,...
  • Page 383: Appendix9 Temperature Correction Function (Tc)

    Appendix9 Temperature Correction Function (TC) Appendix9 Temperature Correction Function (TC) Temperature correction employs the temperature coefficient of a material to convert its resistance measured at one temperature to the value it would have at any other temperature, for display. Because resistance is fun- damentally temperature-dependent, measuring it without considering the temperature can provide meaning- less results.
  • Page 384 Appendix9 Temperature Correction Function (TC) Reference Conductive Properties of Metals and Alloys Density (x10 Temp. Coeff. Material Content [%] Conductivity [%] [kg/m (20°C) [ppm] Annealed copper wire Cu>99.9 8.89 1.00 to 1.02 3810 to 3970 Hard-drawn copper wire Cu>99.9 8.89 0.96 to 0.98 3770 to 3850 Cadmium copper wire...
  • Page 385: Appendix10Rack Mounting

    Appendix10 Rack Mounting Appendix10Rack Mounting Rack mounting brackets can be attached to the instrument. Observe the following precautions regarding the mounting screws to avoid instru- ment damage and electric shock accidents. • When installing the Rack Mounting Plate, the screws must not intrude more than 6 mm into either side of the instrument.
  • Page 386: Installation Procedure

    Appendix10 Rack Mounting Installation Procedure Fold down the instrument's legs. Remove the feed from the bottom of the instrument, and the screws from the sides (four near the front). M3 x 8 mm M4 x 6 mm Installing the spacers on both sides of the instrument, affix the Rack Mounting Plate with the M4 x 12 mm screws.
  • Page 387: Appendix11Dimensional Diagram

    Appendix11 Dimensional Diagram Appendix11 Dimensional Diagram ± ± (Unit : mm)
  • Page 388: Appendix12Initial Settings Table

    Appendix12 Initial Settings Table Appendix12 Initial Settings Table The following table shows the initial settings of the instrument.  Yes: Available/ No: Unavailable/ : The same as the initial settings Return to Panel save/ Load instru- initial ment settings File ANALY TRAN RESET...
  • Page 389 Appendix12 Initial Settings Table  Yes: Available/ No: Unavailable/ : The same as the initial settings Return to Panel save/ Load instru- initial ment settings File ANALY TRAN RESET Setting Items Initial setting *RST :PRESet when save/ SFOR operati power is Load mode mode...
  • Page 390 Appendix12 Initial Settings Table  Yes: Available/ No: Unavailable/ : The same as the initial settings Return to Panel save/ Load instru- initial ment File settings ANALY TRAN RESET Setting Items Initial setting *RST :PRESet when save/ SFOR operati power is Load mode mode...
  • Page 391 Appendix12 Initial Settings Table  Yes: Available/ No: Unavailable/ : The same as the initial settings Return to Panel save/ Load instru- initial ment settings File ANALY TRAN RESET Setting Items Initial setting *RST :PRESet when save/ SFOR operati power is Load mode mode...
  • Page 392 Change *1 When TYPE=ALL is set, the items indicated by Yes (ADJ) are also saved. 2 ANALYZER mode is only available on the IM3533-01. 3 All 10 ranges are initialized as shown to right. 4 Does not change with instrument reset; reverts to default value at full reset.
  • Page 393 Appendix 13 Device Compliance Statement Appendix 13 Device Compliance Statement "Information on compliance to standards" based on the IEEE 488.2 standard Item Description Description of Communication Instruction Manual on the 1. IEEE 488.1 interface functions included LCR Application Disk., “GP-IB specifications” 2.
  • Page 394 Appendix 13 Device Compliance Statement Item Description The number of response messages varies depending on the settings. • Queries producing responses as syntax checking is per- formed: All queries produce responses when syntax checking is per- formed. • Whether any queries produce responses when read: There are no queries which produce response messages at the instant they are read in by the controller.
  • Page 395 Appendix 13 Device Compliance Statement Item Description 17. Capacity of the user data storage area reserved PUD PUD? The " " command and the " " query are not used. PUD for when the " " command and the Further, there is no user data storage area. PUD? "...
  • Page 396 Appendix 13 Device Compliance Statement...
  • Page 397 Index Index Enlarging Display ..........49 Error display ............. 360 Absolute Value mode ......104, 111, 202 EXT I/O Connection Examples ........327 Accuracy ............342 EXT I/O connector ..........310 Adjustment Delay ..........85 External Control ..........309 All Compensation ........216, 226 Q&A .............
  • Page 398 Index Replaceable Parts ..........353 Residual Charge Protection ......A10 ........ 16, 21, 23, 142, 184, 214 ROM/RAM Test ..........270 LCR Application Disk ........... 1 ..............45 Limit value ............56 Saving Measurement Results ....138, 179 Line Frequency ..........87 Scaling ..............

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