Alarm Generation (Defects; Error Measurement (Anomalies - Wavetek ANT-20 Operating Manual

ANT-20/ANT-20E
1.6.3 VC-3 alarm generation (defects)
The following defects can be inserted in addition to the defects specified
in Sec. 1.4.3, Page S-5:
Defect
TU-LOP
TU-AIS
LP-UNEQ
LP-PLM
LP-RDI
LP-TIM
Table S-16
Alarm generation refers to the selected measurement channel.
1.6.4 VC-3 error measurement (anomalies)
The following anomalies can be evaluated and displayed in addition to the error measurements
specified in Sec. 1.4.5, Page S-9:
Anomaly
LP-B3
LP-REI
Table S-17
Evaluation and display refer to the selected measurement channel.
Specifications
Test Sensor thresholds
sensor function
On/Off M in N
yes M = 1 to N - 1
N = 1 to 8000
yes M = 1 to N - 1
N = 1 to 8000
yes M = 1 to N - 1
N = 1 to 8000
yes M = 1 to N - 1
N = 1 to 8000
yes M = 1 to N - 1
N = 1 to 8000
yes -
Additional available defects (VC-3)
LED
LP-BIP
-
LED display of additional anomalies (VC-3)
STM-1 mapping
I----t1----I
I------t2------I
t1 = 0.1 to 60.0 s
t2 = 0.2 to 600 s
t1 = 0.1 to 60.0 s
t2 = 0.2 to 600 s
t1 = 0.1 to 60.0 s
t2 = 0.2 to 600 s
t1 = 0.1 to 60.0 s
t2 = 0.2 to 600 s
t1 = 0.1 to 60.0 s
t2 = 0.2 to 600 s
-
S-21