Error Measurements (Anomalies; Vc-12 Alarm Generation (Defects) - Wavetek ANT-20 Operating Manual

ANT-20/ANT-20E
1.5.3

VC-12 alarm generation (defects)

The following defects can be generated in addition to the alarm types specified in
Sec. 1.4.3, Page S-5:
Defect
TU-LOM
TU-LOP
TU-AIS
LP-UNEQ
LP-PLM
LP-RDI
LP-TIM
LP-RFI
Table S-11
Alarm generation refers to the selected measurement channel.
1.5.4 VC-12 error measurements (anomalies)
The following anomalies can be evaluated and displayed in addition to the error measurements
specified in Sec. 1.4.5, Page S-9:
Anomaly
LP-BIP
LP-REI
Table S-12
Evaluation and display refer to the selected measurement channel.
Specifications
Test Sensor thresholds
sensor function
On/Off M in N
yes M = 1 to N - 1
N = 1 to 8000
yes M = 1 to N - 1
N = 1 to 8000
yes M = 1 to N - 1
N = 1 to 8000
yes M = 1 to N - 1
N = 1 to 8000
yes M = 1 to N - 1
N = 1 to 8000
yes M = 1 to N - 1
N = 1 to 8000
yes -
yes M = 1 to N - 1
N = 1 to 8000
Addition available defects (VC-12)
LED
LP-BIP
-
LED display of additional anomalies (VC-12)
STM-1 mapping
I----t1----I
I------t2------I
t1 = 0.1 to 60.0 s
t2 = 0.2 to 600 s
t1 = 0.1 to 60.0 s
t2 = 0.2 to 600 s
t1 = 0.1 to 60.0 s
t2 = 0.2 to 600 s
t1 = 0.1 to 60.0 s
t2 = 0.2 to 600 s
t1 = 0.1 to 60.0 s
t2 = 0.2 to 600 s
t1 = 0.1 to 60.0 s
t2 = 0.2 to 600 s
-
t1 = 0.1 to 60.0 s
t2 = 0.2 to 600 s
S-17