Table 5.22 Selective Self-Test Log Data Structure - Fujitsu MHV2200BT Product Manual

Interface

Table 5.22 Selective self-test log data structure

Byte
00h, 01h
02h...09h
0Ah...11h
12h...19h
1Ah...21h
22h...29h
2Ah...31h
32h...39h
3Ah...41h
42h...49h
4Ah...51h
52h...151h
152h...1EBh
1Ech...1F3h
1F4h...1F5h
1F6h...1F7h
1F8h
1F9h
1FAh, 1FBh
1FCh, 1FDh
1FEh, 1FFh
•
Test Span
Selective self-test log provides for the definition of up to five test spans. If the
starting and ending LBA values for a test span are both zero, a test span is not
defined and not tested.
•
Current LBA under test
As the self-test progress, the device shall modify this value to contain the LBA
currently being tested.
5-70
Data Structure Revision Number
Starting LBA
Test Span 1
Ending LBA
Starting LBA
Test Span 2
Ending LBA
Starting LBA
Test Span 3
Ending LBA
Starting LBA
Test Span 4
Ending LBA
Starting LBA
Test Span 5
Ending LBA
Reserved
Vender Unique
Current LBA under test
Current Span under test
Feature Flags
Offline Execution Flag
Vender Unique
Selective Offline Scan Number
Reserved
Selective Self-test pending time [min]
Checksum
Item
C141-E244