Table 5.21 Selective Self-Test Log Data Structure - Fujitsu MHW2120BK Maintenance Manual

Table 5.21 Selective self-test log data structure

Byte(hex)
00, 01
02 to 09
0A to 11
12 to 19
1A to 21
22 to 29
2A to 31
32 to 39
3A to 41
42 to 49
4A to 51
52 to 151
152 to 1EB
1EC to 1F3
1F4 to 1F5
1F6 to 1F7
1F8
1F9
1FA, 1FB
1FC, 1FD
1FE, 1FF
•
Test Span
Selective self-test log provides for the definition of up to five test spans. If the
starting and ending LBA values for a test span are both zero, a test span is not
defined and not tested.
•
Current LBA under test
As the self-test progress, the device shall modify this value to contain the LBA
currently being tested.
C141-E261
Data Structure Revision Number
Starting LBA
Test Span 1
Ending LBA
Starting LBA
Test Span 2
Ending LBA
Starting LBA
Test Span 3
Ending LBA
Starting LBA
Test Span 4
Ending LBA
Starting LBA
Test Span 5
Ending LBA
Reserved
Vender Unique
Current LBA under test
Current Span under test
Feature Flags
Offline Execution Flag
Vender Unique
Selective Offline Scan Number
Reserved
Selective Self-test pending time [min]
Checksum
5.3 Host Commands
Item
5-69