Device Operating Conditions; Absolute Maximum Ratings Over Operating Case Temperature Range (Unless Otherwise Noted) - Texas Instruments TMS320C6474 Manual

Multicore digital signal processor
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TMS320C6474
SPRS552F – OCTOBER 2008 – REVISED JULY 2010

6 Device Operating Conditions

Based
on
JESD22-C101C
Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components), the TMS320C6474
device's charged-device model (CDM) sensitivity classification is Class II (200 to <500 V). Specifically,
DDR memory interface and SERDES pins conform to ±200-V level. All other pins conform to ±500 V.
6.1
Absolute Maximum Ratings Over Operating Case Temperature Range (Unless
Otherwise Noted)
(2)
Supply voltage range
:
Input voltage (V
) range:
I
Output voltage (V
) range:
O
Operating case temperature range, T
Storage temperature range, T
stg
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to V
(3) There is no pin named DV
SGR_V
, and SGR_V
DDD11
(4) A heatsink is required for proper device operation.
(5) Advance Information is presented in this document for the C6474 1.2-GHz extended temperature device.
72
Device Operating Conditions
(Field-Induced
(1)
CV
DD
(3)
DV
DD11
DV
DD18
V
REFSSTL
AIF_V
, AIF_V
DDA11
AIF_V
DDR18
SGR_V
, SGR_V
DDA11
SGR_V
DDR18
AV
, AV
DD118
DD218
V
Ground
SS
1.8-V Single-Ended I/Os
DDR2
I2C/VCNTL
Frame Sync Differential Clocks
SYSCLK, CORECLK, DDR REFCLK, SRIO/EMAC
REFCLK
SERDES
1.8-V Single-Ended I/Os
DDR2
I2C/VCNTL
SERDES
850-MHz and 1-GHz device commercial temperature
1.2-GHz device commercial temperature
:
C
1-GHz device extended temperature
1.2-GHz device extended temperature
:
SS.
available on the device. DV
DD11
pins.
DDT11
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Product Folder Link(s)
Charged-Device
, AIF_V
DDD11
DDT11
, SGR_V
DDD11
DDT11
(5)
represents the AIF_V
DD11
DDA11
Copyright © 2008–2010, Texas Instruments Incorporated
:TMS320C6474
Model
Test
Method
-0.3 V - 1.35 V
-0.3 V to 1.35 V
-0.3 V to 2.45 V
0.49 * DV
to 0.51 * DV
DD18
-0.3 V to 1.35 V
-0.3 V to 2.45 V
-0.3 V to 1.35 V
-0.3 V to 2.45 V
-0.3 V to 2.45 V
-0.3 V to DV
-0.3 V to 2.45 V
-0.3 V to 2.45 V
-0.3 V to DV
-0.3 V to 1.35 V
-0.3 V to DV
-0.3 V to DV
-0.3 V to 2.45 V
-0.3 V to 2.45 V
-0.3 V to DV
0°C to 100°C
0°C to 95°C
-40°C to 100°C
-40°C to 95°C
-65°C to 150°C
, AIF_V
, AIF_V
, SGR_V
DDD11
DDT11
www.ti.com
for
DD18
0 V
+ 0.3 V
DD18
+ 0.3 V
DD18
+ 0.3 V
DD11
+ 0.3 V
DD18
+ 0.3 V
DD11
(4)
(4)
(4)
(4)
,
DDA11

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