Texas Instruments TRF7970A Manual page 73

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6.15.3.4 Test Registers
6.15.3.4.1 Test Register (0x1A)
Table 6-54 describes the Test register at address 0x1A.
Default: 0x00 at POR = H and EN = L.
Bit Name
B7 OOK_Subc_In Subcarrier input
B6 MOD_Subc_Out Subcarrier output
Direct TX modulation and
B5 MOD_Direct
RX reset
B4 o_sel First stage output selection
Second stage gain –6 dB,
B3 low2
HP corner frequency / 2
First stage gain –6 dB, HP
B2 low1
corner frequency / 2
B1 zun Input followers test
AGC test, AGC level is
B0 Test_AGC
seen on rssi_210 bits
6.15.3.4.2 Test Register (0x1B)
Table 6-55 describes the Test register at address 0x1B.
Default: 0x00 at POR = H and EN = L. When a test_dec or test_io is set IC is switched to test mode. Test Mode persists until a stop
condition arrives. At stop condition the test_dec and test_io bits are cleared.
Bit Name
B7
B6
test_rf_level RF level test
B5
B4
B3 test_io1
I/O test
B2 test_io0
B1 test_dec Decoder test mode
B0 clock_su Coder clock 13.56 MHz
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Table 6-54. Test Register (0x1A) (for Test or Direct Use)
Function
OOK pin becomes decoder digital input
MOD pin becomes receiver digitized subcarrier output
MOD pin becomes input for TX modulation control by the MCU
o_sel = L: First stage output used for analog out and digitizing
o_sel = H: Second Stage output used for analog out and digitizing
Table 6-55. Test Register (0x1B) (for Test or Direct Use)
Function
Not implemented
For faster test of coders
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SLOS743L – AUGUST 2011 – REVISED MARCH 2017
Description
Description
TRF7970A
TRF7970A
Detailed Description 73