Mitsubishi MELSEC-A Series Operating Manual page 116

6.
HOW TO USE EACH FUNCTION
M6LSEC-A
Available memory
6.7.2 Changing the current values
of
T,
C,
D,
W, R, A, 2, or V by list monitoring
(Changlng current values
of word
devices)
This operation changes the current value of a word device forcibly by desig-
nating a device and a device number.
[Basic operation]
SHIFT EST
H
number Step
Hz+,---
New
decimal value (1 6 bits)
HF1-1
ew
hexadecimal value (16 b i t s ) w
GO
1
I
U I L
New
decimal value
(32
bits)
GO+
.-I
u
1 L
% N e w
hexadecimal value
(32
b i t s ) m T b
. A - '
Device
fl
: : l t z r
b F m
New
decimal value (16 bits)
HT1-1
Device
: : l : z r
b F m N e w
hexadecimal value (16 b i t s ) H T } - I
Device
, " U " , : z r
l-f=m
New
decimal value
(32
bits)
m z b
Device
: : l : z r
b 7 M N . w
hexadecimal value
(32
b i t s ) m T k
[Sample operatlon]
7
The device
at the cursor
*"[ested. position
]
...
nated device
(*
is
desig-
tested.
1
The current value of device " D l " at the cursor position is changed to "K90",
and the current value of designated device "D100" is changed to "HFO(K240)"
Select the TEST mode, read the step
whose device is to be tested, and
change the current value of the de-
vice at the cursor position.
GO
2 6 L D I
@@
0
0
SP
x90
Change the current value of the de-
vice at the cursor position.
I T
2 1
MOV
1
1 '
2 1 ) D I go}-
Change the current value
of 'Dl' to
2 6 L D I U T 1
"K90'.
I
2 1 ) D I 9 0
Change the current value of the des-
D l 0 0
RFO
ignated device.
The current value of
'D100'
has now
been changed to 'HFO(K240)'.
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