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Subtests 1 and 7 write and read a zero (0) to each location in
memory.
Subtests 2 and 8 are the same as subtests 1 and 7 except
that they write and read a -1 instead of 0.
write bit patterns of alternating 0's and l's to each address in
memory.
Subtests 4 and 10 write the one's complement of subtests
3 and 9.
Subtests 5 and 11 write and read the addresses of each
location in memory; subtests 6 and 12 write and read the
complements of addresses to every location in memory.
Errors
Test 0 can return the following errors:
Memory error at Address
Memory error at Address
Memory error at Address
Memory overlap error: Location and contents read back are x x.
Test Output
Output for a run of the memory test is as follows:
MEMORY SUBTEST 1
MEMORY SUBTEST 2
MEMORY SUBTEST 3
MEMORY SUBTEST 4
MEMORY SUBTEST 5
MEMORY SUBTEST 6
MEMORY SUBTEST 7
MEMORY SUBTEST 8
MEMORY SUBTEST 9
MEMORY SUBTEST 10
MEMORY SUBTEST 11
MEMORY SUBTEST 12
TEST 1:
MAP TRANSLATION TEST (p)
The map translation test checks the status bits and page table
entry swapping.
1.
Read and write memory test, check access and dirty bits.
2.
Map tests (page table entry swapping).
x: Wrote
x: Wrote
x: Wrote
The subtests are 1 2
Tests and Subtests
Subtests 3 and 9
0's; Read Back x.
l's; Read Back x.
x's; Read Back x.
2-3
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