IBM System x3800 Problem Determination And Service Manual page 81

Type 8866
Hide thumbs Also See for System x3800:
Table of Contents

Advertisement

v Follow the suggested actions in the order in which they are listed in the Action column until the problem
is solved.
v See Chapter 3, "Parts listing, System x3800 Type 8866," on page 107 to determine which components are
customer replaceable units (CRU) and which components are field replaceable units (FRU).
v If an action step is preceded by "(Trained service technician only)," that step must be performed only by a
trained service technician.
Error code
Description
030-271-001
SRAM access error.
030-272-001
NVRAM access error.
030-273-001
FLASH access error.
030-274-001
Base Addr Register Key error.
030-xxx-00n
Failed SCSI test on PCI slot n where n
represents the slot number of the failing
adapter.
Action
1. Update the microcode for the Serial Attached
SCSI (SAS) controller (see "Updating the
firmware" on page 157).
2. Update the BIOS code (see "Updating the
firmware" on page 157).
3. Reseat the I/O board.
4. Replace the I/O board.
1. Update the microcode for the Serial Attached
SCSI (SAS) controller (see "Updating the
firmware" on page 157).
2. Update the BIOS code (see "Updating the
firmware" on page 157).
3. Reseat the I/O board.
4. Replace the I/O board.
1. Update the microcode for the Serial Attached
SCSI (SAS) controller (see "Updating the
firmware" on page 157).
2. Update the BIOS code (see "Updating the
firmware" on page 157).
3. Reseat the I/O board.
4. Replace the I/O board.
1. Update the microcode for the Serial Attached
SCSI (SAS) controller (see "Updating the
firmware" on page 157).
2. Update the BIOS code (see "Updating the
firmware" on page 157).
3. Reseat the I/O board.
4. Replace the I/O board.
1. Check the BMC log or system-error log before
replacing a CRU or FRU (see"Error logs" on page
18).
2. Reseat the adapter in slot n.
3. Replace the adapter in slot n.
65
Chapter 2. Diagnostics

Hide quick links:

Advertisement

Table of Contents
loading

Table of Contents