Individual Tests - Siemens simatic hmi op27 Equipment Manual

C.1.1

Individual Tests

Performing
settings on the
selection screen
Internal/External
The OP memory modules are checked by means of read/write tests.
memory
Should an error occur, the faulty memory address is displayed on the screen.
The individual RAM tests:
OP27, OP37 Equipment Manual
Release 05/99
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Contrast Increase or decrease the contrast of the selected
screen using the arrow keys depicted on the
right.
Brightness Blank or brighten the screen by pressing the
arrow keys depicted on the right. This function
corresponds to the Blank Screen function on
the System Settings standard screen.
Relay on/off Press this button to activate and deactivate the
contact assembly integrated in the power sup-
ply connector:
Note
With SRAM, EEPROM and flash memory, the memory contents are saved to
DRAM prior to testing. Consequently, you should begin by testing the DRAM
for errors.
If the test reveals an error, the data copied prior to the test is not re-imported.
This means that the content of the memory which failed the test is corrupted.
The same applies if the power supply fails.
RAM Test Initiated by Key
DRAM
K1
EPROM
F9
SRAM
F10
EEPROM
F11
T est Functions
Result
Test each bit in the memory area.
A checksum test is performed to validate
the integrity of the data stored in memory.
Test each bit in the memory area.
ENTER
C-3