National Instruments Data Acquisition Device E Series User Manual page 256

Glossary
RTSI
S
s
S
S/s
scan interval
scan rate
SCXI
sensor
signal conditioning
T
task
terminal count
t
gh
t
gsu
t
gw
E Series User Manual
Real-Time System Integration—the National Instruments timing bus that
connects DAQ devices directly, by means of connectors on top of the
devices, for precise synchronization of functions.
Seconds.
Samples.
Samples per second—Used to express the rate at which a digitizer or D/A
converter or DAQ device samples an analog signal.
Controls how often a scan is initialized; is regulated by the AI Sample
Clock signal.
Reciprocal of the scan interval.
Signal Conditioning eXtensions for Instrumentation—the National
Instruments product line for conditioning low-level signals within an
external chassis near sensors so that only high-level signals are sent to DAQ
devices in the noisy PC environment. SCXI is an open standard available
for all vendors.
A device that responds to a physical stimulus (heat, light, sound, pressure,
motion, flow, and so on) and produces a corresponding electrical signal.
The manipulation of signals to prepare them for digitizing.
NI-DAQmx—a collection of one or more channels, timing, and triggering
and other properties that apply to the task itself. Conceptually, a task
represents a measurement or generation you want to perform.
The highest value of a counter.
Gate hold time.
Gate setup time.
Gate pulse width.
G-6 ni.com