Table 5.22 Selective Self-Test Feature Flags - Fujitsu MHW2120BK Maintenance Manual

Interface
•
Current Span under test
As the self-test progress, the device shall modify this value to contain the test span
number currently being tested.
•
Feature Flags
Bit
0
1
2
3
4
5 to 15
Bit [l] shall be written by the host and returned unmodified by the device. Bit [3:4]
shall be written as zeros by the host and the device shall modify them as the test
progress.
•
Selective Self-test pending time [min]
The selective self-test pending time is the time in minutes from power-on to the
resumption of the off-line testing if the pending bit is set.
•
SMART Command Transport (SCT)
This command supports the following functions by using the SMART command
according to the value specified for the SN field and the FR field. Moreover,
WRITE LOG EXT/READ LOG EXT is used in 48-CMD environment.
5-70

Table 5.22 Selective self-test feature flags

Vendor specific (unused)
When set to one, perform off-line scan after selective test.
Vendor specific (unused)
When set to one, off-line scan after selective test is pending.
When set to one, off-line scan after selective test is active.
Reserved
Description
C141-E261