Table 5.23 Selective Self-Test Feature Flags - Fujitsu MHV2040BH Product Manual

Interface
•
Current Span under test
As the self-test progress, the device shall modify this value to contain the test
span number currently being tested.
•
Feature Flags
Bit
0
1
2
3
4
5...15
Bit [l] shall be written by the host and returned unmodified by the device. Bit
[3:4] shall be written as zeros by the host and the device shall modify them as the
test progress.
•
Selective Self-test pending time [min]
The selective self-test pending time is the time in minutes from power-on to the
resumption of the off-line testing if the pending bit is set.
5-68

Table 5.23 Selective self-test feature flags

Vendor specific (unused)
When set to one, perform off-line scan after selective test
Vendor specific (unused)
When set to one, off-line scan after selective test is pending.
When set to one, off-line scan after selective test is active.
Reserved
Description
C141-E224