onsemi AF0130 User Manual

AF0130 and AF0131 Smart
iToF Evaluation Board
User's Manual
EVBUM2868/D
GENERAL OVERVIEW
This document is a manual for the setup, initialization and calibration
of the AF0130 Smart iToF demo3 evaluation kit, see Figure 1. This
document and evaluation kit also contains information related to the
evaluation of AF0131 variant of the sensor which does not have
on−chip Depth Processing (DP) available but only the RAW or Data
Reduction (DR) outputs, which are also available on AF0130 sensor
variant. The sensor variants AF0130 & AF0131 are pin compatible.
FUNCTIONAL OVERVIEW
The demokit aims to show the performance and features of the
AF0130 Smart iToF Depth sensor. DevWareX is the software used to
interface with the hardware over USB and configure the sensor in
different operating modes.
Six main modes are currently available for evaluation (both in RAW
and DP output):
1. Mode 2.2 (1.2 Mp), 100 MHz Single Freq (1.5 m
unambiguous range)
2. Mode 2.2 (1.2 Mp), 200 MHz Single Freq (0.75 m
unambiguous range)
3. Mode 3.2 (VGA), 100 MHz + 120 MHz Dual Freq
(7.5 m unambiguous range)
4. Mode 3.2 (VGA), 175 MHz + 200 MHz Dual Freq
(6 m unambiguous range)
5. Mode 3.2 (VGA), 30 MHz + 35 MHz Dual Freq
(30 m unambiguous range)
6. Mode 2.2 (1.2 Mp), 75 MHz Single Freq (2 m
unambiguous range)
The Smart iToF sensor is a versatile device with various
operating modes suitable for a wide range of applications.
Higher modulation frequencies will improve measurement
accuracy but will reduce the maximum range before
ambiguity occurs. The single frequency mode with on−chip
frame storage (mode 2.2) has the best motion performance
and allows for the full 1.2 Mp resolution of the sensor to be
used.
On the other hand, the dual frequency modes with on−chip
storage for the 8 phase captures (mode 3.2) will output a 2x2
binned (VGA) resolution and can extend the unambiguous
range of measurement
disambiguation algorithm (available on−chip for AF0130).
The combination of binning and dual frequency
measurement in this mode will furthermore decrease the
noise and therefore increase the Signal to Noise Ratio (SNR)
of the measurement, improving accuracy.
© Semiconductor Components Industries, LLC, 2023
November, 2024 − Rev. 3
significantly through
Figure 1. AF0130 Smart iToF Assembled
The hybrid mode is a more complex mode which
combines phase modulation together with pulsed
modulation of the lasers for an increased dynamic range of
the measurement as well as additional ambient light
rejection compared to its default mode counterpart.
In the current pre−production stage, it is advised to update
the DevwareX software monthly as regular improvements
become available for evaluation. Please do inform your
onsemi representative in case you like to evaluate a mode
that is currently not yet available.
The evaluation kit and its default modes listed above have
been classified as class 1 (eye safe) in nominal operating
conditions according to IEC 60825−1:2014 standard. The
laser eye safety monitoring feature is enabled by default on
the sensor and the eye safety features of the laser drivers on
the laserboard are configured to avoid potential harm to the
user's eyes. It is still recommended to exercise caution as
any single fault failure of the evaluation kit is NOT covered
by onsemi and the user is responsible to use the evaluation
kit in accordance to local regulation and consider the safety
of its employees as mention in the disclaimer. onsemi is not
responsible for the laser safety of the final product of our
customers and advises to consult a professional in this field
(e.g. Seibersdorf Lab in Austria). See further in this
a
document for more additional details on eye safety features
of the sensor and VCSEL drivers.
ATTENTION: The emitted wavelength of the lasers is not
visible to the human eye! We advise the user
to exercise caution and follow the
necessary guidelines to protect your eyes
from potential hazards.
1
EVAL BOARD USER'S MANUAL
www.onsemi.com
Evaluation Board
Publication Order Number:
EVBUM2868/D