NB6L14MNG Evaluation Board User's Manual
NB6L14MNGEVB
Introduction
onsemi has developed the QFN16EVB evaluation board
for its high-performance devices packaged in the 16-pin
QFN. This evaluation board was designed to provide
a flexible and convenient platform to quickly evaluate,
characterize and verify the operation of various onsemi
products. Many QFN16EVBs are dedicated with a device
already
installed,
and
www.onsemi.com at the specific device web page.
This evaluation board manual contains:
•
Information on 16-lead QFN Evaluation Board
•
Assembly Instructions
•
Appropriate Lab Setup
•
Bill of Materials
This user's manual provides detailed information on
board contents, layout and its use. It should be used in
conjunction with an appropriate onsemi device datasheet
located at www.onsemi.com. The datasheet contains the
technical device specifications.
Top View
© Semiconductor Components Industries, LLC, 2013
October, 2021 − Rev. 1
can
be
ordered
from
Figure 1. Top and Bottom View of the 16 QFN Evaluation Board
EVAL BOARD USER'S MANUAL
Board Layout
The QFN16 Evaluation Board provides a high bandwidth,
50 W
controlled
impedance
implemented in four layers. The first layer or primary trace
layer is 0.008" thick Rogers RO4003 material, and is
designed to have equal electrical length on all signal traces
from the device under test (DUT) pins to the SMA
connectors. The second layer is the 1.0 oz copper ground
plane and is primarily dedicated for the SMA connector
ground plane. FR4 dielectric material is placed between the
second and third layers and between third and fourth layers.
The third layer is also 1.0 oz copper plane. A portion of this
layer is designated for the device V
planes. The fourth layer is the secondary trace layer.
1
www.onsemi.com
environment
and DUTGND power
CC
Bottom View
Publication Order Number:
EVBUM2183/D
and
is