Agilent Technologies 4284A Service Manual page 80

(2) Self test selected by softkeys
Softkey selected self tests are shown below, and each self test is described in SEC-
TION 5 of the operation manual.
1. Memory card R/W test
2. LED display test
3. LCD display test
4. Handler I/F test
5. Scanner I/F EEPROM R/W test
6. Scanner I/F I/O test
7. Bias current I/F I/O test
(3) Self test selected by the bit switch
The following self tests can be performed by setting the A7S3 bit switch.
Table 3-12. Bit Switch Selected Self Test
0 0
F 1 = = 1 1
I —
F a — I 2
F
13
NM 4
5
W - - - 1 6
7
aisJ 8
No.0
No.
This self test displays the ROM check sum on the LCD display.
0
1 This self test performs the RAM read/write test.
This self test performs the EEPROM read/write test. T h e time required for
2
completing this test is approximately 17 minutes.
This self test perform the front panel keyboard test. Pressed key code and
3
its abbreviated name will be displayed.
4 This self test initializes the EEPROM. T h i s self test must be performed
when the EEPROM is being replaced.
5 This self test initializes the scanner interface's EEPROM. T h i s self test
must b e performed w h e n t h e scanner interface's EEPROM i s being
replaced.
0 . 0
F t
F 2 F f — W 2
1 2
IEN I 3
1— 1 3 1 W = 3 3
4 IIIM 4
Om 5
5
I — 1 5
M = 1 6
l e 1 6
t e k = 6
o• 7
7
I i 8
I m i l 8
I 8
No.3 N o . 4
No.1 N o . 2
Description
3-37
0 o
INI 1 I _ I 1
F
F 1 2
F X 1 2
Illa 3
0 , 1 3
4
4 W : : = 1 4
5 5
M = 1 6 °
7
7
8
No.5
—
7.+ I n
0 CD
0)
cD CD
c")
CD