Texas Instruments TPD6F002-Q1EVM User Manual

TPD6F002-Q1EVM
This user's guide describes the characteristics, operation, and use of the TPD6F002-Q1EVM evaluation
module (EVM). This EVM includes 2 TPD6F002-Q1's for testing. One TPD6F002-Q1 is configured for
IEC61000-4-2 compliance testing and one TPD6F002-Q1 is configured for 4-port s-parameter analysis.
Additionally, the TPD6F002-Q1 for ESD testing allows the capture of a clamping waveform during an ESD
event. This user's guide includes setup instructions, schematic diagrams, a bill of materials, and printed-
circuit board layout drawings for the evaluation module.
1 Introduction
Texas Instrument's TPD6F002-Q1 evaluation module helps designers evaluate the operation and
performance of the TPD6F002-Q1 device. The TPD6F002-Q1 is a six-channel EMI filter in a space-saving
DSV package. This low-pass filter array reduces EMI emissions and provides system-level ESD protection
at the data ports. Because of its small package and easy-to-use pin assignments, this device is suitable
for a wide array of applications such as mobile handsets, PDAs, video consoles, notebook computers, etc.
In particular, the TPD6F002 is ideal for EMI filtering and protecting data lines from ESD at the LCD
display, keypad, and memory interfaces. The pi-style (C-R-C) filter provides at least 35 dB attenuation in
the carrier frequency range. The TPD6F002 is a highly integrated device designed to suppress EMI/RFI
noise in all systems subjected to electromagnetic interferences. This filter includes ESD protection circuitry
that prevents damage to the application when subjected to ESD up to IEC 61000-4-2 ±20 kV Contact ESD
and ±30 kV Air-Gap ESD. The TPD6F002-Q1 is characterized for operation over an ambient air
temperature range of –40°C to 125°C.
The EVM contains two TPD6F002-Q1's. A TPD6F002-Q1 (U1) is configured with test points for striking
ESD to the protection pins. It also has an SMB (J5) connector for capturing clamping waveforms with an
oscilloscope during an ESD strike. Caution must be taken when capturing clamping waveforms during an
ESD event so as not to damage the oscilloscope. A proper procedure is outlined below in
Setup. A TPD6F002-Q1 (U2) is configured with 4 SMA (J1 – J4) connectors to allow 4-port analysis with a
vector network analyzer.
Reference Designator
U1
U2
2 Definitions
Contact Discharge — a method of testing in which the electrode of the ESD simulator is held in contact
with the device-under-test (DUT).
Air Discharge — a method of testing in which the charged electrode of the ESD simulator approaches
the DUT, and a spark to the DUT actuates the discharge.
ESD simulator — a device that outputs IEC61000-4-2 compliance ESD waveforms shown in
with adjustable ranges shown in
IEC61000-4-2 has 4 classes of protection levels. Classes 1 – 4 are shown in
should be incrementally tested to level 4 as shown in
does not fail at 8 kV, testing can continue in 2 kV increments until failure.
SLVUAC7 – December 2014
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Table 1. EVM Configuration
TI Part Number
IEC61000-4-2 ESD Tests and ESD Clamping
TPD6F002-Q1
TPD6F002-Q1
Table 2 and Table
Copyright © 2014, Texas Instruments Incorporated
SLVUAC7 – December 2014
Configuration
waveforms
S-parameters
3.
Table 3 until the point of failure. If the DUT
User's Guide
Oscilloscope
Figure 1
Table 2. Stress tests
1
TPD6F002-Q1EVM