Table of Contents
Advertisement
OPERATION
Test
DS0 Circuit Delay Measurement
DS0 End-to-End Self-Test
DS0 Remote Test
DS0 Remote Test with Self-Test
3-29
Select Test Pattern
This function selects and displays the test pattern used in the BIT ER-
ROR TEST mode. To use this function, press S to step through the three
test patterns available:
511
511-bit test pattern
2047
2047-bit test pattern
QRS
Quasi-Random Signal (QRS) test pattern
The test pattern selection is retained when you exit this screen, and when
the CSU is reset or powered down.
Always select the same test pattern at both CSUs.
Test Mode
This function selects and displays the test mode. To use this function,
press M to step through the three test modes available: LOOPBACK, BIT
ERROR TEST, and DELAY TEST. These modes are used alone or in
combination (in a specific sequence) to perform the tests described in Sec-
tion 4, as follows:
Use This Mode at Remote CSU
LOOPBACK
BIT ERROR TEST
LOOPBACK
LOOPBACK
Cumulative Errors
This displays the total errors counted (not the bit error rate) as an indica-
tion of circuit quality for tests using the BIT ERROR TEST mode. The
maximum count is 59500. For the DS0 End-to-End Self-Test, errors for the
local-to-remote leg are displayed at the remote CSU, while errors for the
remote-to-local leg are displayed at the local CSU (that is, test results are
always displayed at the receiving end). When the selected test is not run-
ning, this displays LOOPBACK OFF, BIT ERROR TEST (INACTIVE),
or DELAY TEST (INACTIVE).
Tested Data Blocks
This displays the total number of blocks tested using the BIT ERROR
TEST mode. The maximum count is 65536. Each block is 1 x 10
bits long.
CAUTION
... and Use This Mode at Local CSU
DELAY TEST
BIT ERROR TEST
n/a (uses customer data)
BIT ERROR TEST
5
(100,000)
Advertisement
Table of Contents
