Go/No Go" Tests For Integrated Devices - Ublox NORA-B1 Series System Integration Manual

NORA-B1 series - System integration manual
Dedicated tests can be implemented to check the device. For example, the measurement of module
current consumption when set in a specified state can detect a short circuit if compared with a
"Golden Device" result.
The standard operational module firmware and test software on the host can be used to perform
functional tests (communication with the host controller, check interfaces) and to perform basic RF
performance tests.
8.2.1

"Go/No go" tests for integrated devices

A "Go/No go" test compares the signal quality with a "Golden Device" in a location with a known signal
quality. This test can be performed after establishing a connection with an external device.
A very simple test can be performed by just scanning for a known Bluetooth low energy device and
checking the signal level.
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These kinds of test may be useful as a "go/no go" test but not for RF performance measurements.
This test is suitable to check the functionality of the communication with the host controller and the
power supply. It is also a means to verify if components are well-soldered.
A basic RF functional test of the device including the antenna can be performed with standard
Bluetooth low energy devices as remote stations. The device containing the NORA-B1 series module
and the antennas should be arranged in a fixed position inside an RF shield box to prevent
interferences from other possible radio devices to obtain stable test result.
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