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6
Disassembly and Repair
Self-Tests
A complete self-test performs the following tests. A failing test is indicated by the
test number and description in the display.
601: Self-test failed; system logic
This error indicates a failure of the main processor, system RAM, or system ROM.
603: Self-test failed; waveform logic
This error indicates that the waveform logic in the synthesis IC has failed.
604: Self-test failed; waveform memory bank
This error indicates either the waveform RAM or the synthesis IC has failed.
605: Self-test failed; modulation memory bank
This error indicates the modulation memory bank in the synthesis IC has failed.
606: Self-test failed; cross-isolation interface
This error indicates that the cross-isolation interface between the main processor
and Synthesis IC has failed, or that the synthesis IC itself has failed.
619: Self-test failed; leading edge DAC
620: Self-test failed; trailing edge DAC
621: Self-test failed; square-wave threshold DAC
623: Self-test failed; dc offset DAC
624: Self-test failed; null DAC
625: Self-test failed; amplitude DAC
These errors indicate a malfunctioning system DAC, or failed DAC multiplexer
channels.
622: Self-test failed; time base calibration DAC
This error indicates that the time base calibration DAC in the synthesis IC, or
voltage controlled oscillator has failed.
626: Self-test failed; waveform filter path select relay
627: Self-test failed; -10 dB attenuator path
120
Keysight 33210A Service Guide
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