Eyepiece Graticules - Leica DM IRM Instructions Manual

4.6 Eyepiece graticules*

Graticules for length measurements and grain
and particle measurements
Our product range comprises the following grati-
cules:
• Graticule
10 mm/100 divisions
• Graticule 10 mm/100 divisions
with crosshair
• Graticule for standard series
and Snyder-Graff method
• Graticule ASTM-E-112,
grain size determination
• Graticule with 10 x10 x 0.1 mm
grid divisions
• Graticule with 10 x10 x1 mm
grid divisions
• Graticule with
crosshair
• Graticule with
10 mm/200 divisions
• Format graticule F6 for photomicro
(for MPS with HC 10 x
photoeyepiece)
• Format graticule F7
for photomicro (for DMLD
with HC 10 x photoeyepiece) Order no. 506962
• Format graticule F8
for photomicro (for DMLD
and MPS with
HC 12.5 x photoeyepiece)
For calibrating the graticules, we recommend:
Order no. 506950
Order no. 506952
Order no. 566950
Order no. 566951
Order no. 506954
Order no. 506955
Order no. 506953
Order no. 506951
Order no. 506951
Order no. 506963
Incident light stage micrometer,
1 mm = 100 divisions Order no. 563011
47