Pin-Io; Figure 2: Test Overview - Siemens TC45 User Manual

TC45 TC45 JAVA User's Guide
Confidential / Released
The following Java instruction was used for calculation of the typical jPS:
value = ( 2 x number of calculation statements ) /
( ( 1 / frequencyB ) - ( 1 / frequencyA ) );
Measurement and calculation were done using:
·
duration of each loop = 600 s
·
number of calculation
Instructions
(executed twice per pin cycle)
·
frequencyA as measured with universal counter
· frequencyB as measured with universal counter
The reference loop has the same structure as the measurement loop except the
measurement sequence is moved.
State
TC45 module in IDLE mode / Not connected
CSD connection
These mean values may be sporadically reduced depending on dynamic conditions.

3.7.2 Pin-IO

The pin IO test was defined to find out how fast a Java MIDlet can process URCs caused by
Pin IO and react on these URCs.
The URCs are generated by feeding an input pin with an external frequency. As soon as the
Java MIDlet gets informed about the URC, it tries to regenerate the feeding frequency by
toggling another output pin.
external frequency
generated frequency
The results of this test show that the delay from changing the state on the pin to processing
the URC in the MIDlet is at least 20 TDMA frames, but depends mainly on the amount of
garbage to collect and number of thread to serve by the virtual machine. So Pin IO is not
suitable to generate or detect frequencies.
TC45_JAVA User's Guide_V02
statements
input pin
poll input pin send URC
set output pin
output pin

Figure 2: Test overview

Page 21 of 72
= 5 "
result=(CONSTANT_VALUE/variable_value);
jPS-Value (mean)
~750 jPS
~450 jPS
ATCommandListener.
" -
Test MIDlet
ATEvent()
ATCommand.
send(...)
30.06.2003