Smu Pulsed Sweep Measurement - Agilent Technologies B1500A Training Manual

Semiconductor device analyzer self-paced training manual, 4
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SMU Pulsed Sweep Measurement

Use PULSE mode for precise force/measure timing
Pulse down to 500 μs width
Use current ranges from 1 nA to 1 A (HPSMU)
Use voltage ranges from 2 V to 200 V (HPSMU)
Use PULSE mode for repeatable 1 A measurements
Eliminate heating during IV sweeps
Avoid device damage
Only one pulsed source is available
Only one measurement channel is available
Set the expected maximum measurement value to Compliance
Measurement integration time cannot be changed
SMUs can be pulsed for precise force/measure timing, or to reduce heating of the device when
forcing high currents.
The measurement unit performs measurement by using the compliance range. It is the minimum
range which covers the Compliance value. The Compliance value should be the expected maximum
measurement value or greater.
7-3
Module 7
Measurement Functions

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