Tap Signals; Table 6-29 Tap Signals - Intel P4000 - DATASHEET REV 001 Datasheet

6.9

TAP Signals

Table 6-29.TAP Signals
Signal Name
TAPPWRGOOD
78
TCK TCK (Test Clock): Provides the clock input
for the processor Test Bus (also known as
the Test Access Port).
TDI TDI (Test Data In): Transfers serial test
data into the processor. TDI provides the
serial input needed for JTAG specification
support.
TDO Test Data Output
TDI_M Test Data In for the GPU/Memory core:
Tie TDI_M and TDO_M together on the
motherboard
TDO_M Test Data Output from the processor
core: Tie TDO_M and TDI_M together on the
motherboard.
TMS TMS (Test Mode Select): A JTAG
specification support signal used by debug
tools.
TRST# TRST# (Test Reset) Boundary-Scan test
reset pin
Power good for ITP
Description
Signal Description
Direction/Buffer
Type
I
CMOS
I
CMOS
O
CMOS
I
CMOS
O
CMOS
I
CMOS
I
CMOS
O
Asynchronous CMOS
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