Hitachi C4K60 - Travelstar Slim - Hard Drive Specifications page 81

7.5.17.3. Extended SMART Self-test Log [Log Sector Address = 07h]
The results of SMART short self-test routine, extended self-test routine and SMART selective self-test
routine are gathered in Extended SMART self-test log. This log is viewed as a circular buffer. All unused self-
test descriptors are filled with zeros. Only 28-bit error entries contain in the SMART self-test log, Both 28-bit
error entries and 48-bit error entries contain in the Extended SMART self-test log. Table 7.17 defines the
format of each of the sectors that comprise the Extended SMART Self-test log.
Byte
0 Self-test log data structure revision number "01h"
1 Reserved
2 - 3 Self-test descriptor index
The index points to the most recent entry. When the log is empty, the index is set to zero.
st
4 - 29 1 descriptor entry
nd
30 - 55 2 descriptor entry
: :
th
18 descriptor entry
446 - 471
Vendor Specific
472 - 499
500 -510 Reserved
511 Data structure checksum
(1) Extended Self-test log descriptor entry
Byte
n Content of the LBA Low (Sector Number) Register
This contains the content of the LBA Low (Sector Number) Register when the Nth self-
test subcommand was issued.
n+1 Content of the self-test execution status byte
This contains the result of self-test routine when the Nth self-test was completed.
n+2 ~ n+3 Life timestamp
This contains the Power-on lifetime of the device in hours when the Nth self-test
subcommand was completed.
n+4 Content of the self-test failure checkpoint byte
This contains additional information about the self-test routine that failed.
n+5 ~ n+10 Falling LBA
The failing LBA is the LBA of the uncorrectable sector that caused the test to fail. If the
device encountered more than one uncorrectable sector during the test, this field
indicates the LBA of the first uncorrectable sector encountered. If the test passed or the
test failed for some reason other than an uncorrectable sector, the value of this field is
undefined.
n+11 ~ n+29 Vendor Specific
K6610170
Rev.2
Dec 22, 2004
Table 7.17 Extended SMART Self-test Log
Table 7.18 Self-test log descriptor entry
Description
Description
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