Anritsu 3680 Series Operation And Maintenance Manual
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Anritsu 3680 Series Operation And Maintenance Manual

Anritsu 3680 Series Operation And Maintenance Manual

Universal test fixture
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3680 Series
Universal Test Fixture*
Operation and Maintenance Manual
NOTE: Anritsu Company was formerly known as Wiltron Company
*U.S. Patent No. 5,017,865
www.valuetronics.com

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Summary of Contents for Anritsu 3680 Series

  • Page 1 3680 Series Universal Test Fixture* Operation and Maintenance Manual NOTE: Anritsu Company was formerly known as Wiltron Company *U.S. Patent No. 5,017,865 www.valuetronics.com...

  • Page 2: Limitation Of Warranty

    WARRANTY The Anritsu product listed on the title page is warranted against defects in materials and work- manship for 90 days from the date of shipment. Anritsu’s obligation covers repairing or replacing products which prove to be defective during the warranty period.

  • Page 3: Table Of Contents

    CONTENTS 3DUDJUDSK 7LWOH 3DJH 6(&7,21 , q *(1(5$/ ,1)250$7,21 INTRODUCTION ......1-1 GENERAL DESCRIPTION .
  • Page 4 CONTENTS (Continued) 3DUDJUDSK 7LWOH 3DJH 6(&7,21 9,  $33/,&$7,216 INTRODUCTION ......6-1 UTF-TO-MICROSTRIP CONNECTION PIN DESIGN .
  • Page 5 * MODEL 3680-20 OPTION OF 3.5 mm, K, OR V CONNECTOR 0.16 in. - 3.5 mm CONNECTOR 0.16 in. - K CONNECTOR 0.20 in. - V CONNECTOR 0.86 in. 2.28 in. 3680 Series Universal Test Fixture )LJXUH  3680 OMM www.valuetronics.com...

  • Page 6: Section Igeneral Information

    There are two models of the RAL; the Model 36801V which has a V Connector, and the The 3680 Series Universal Test Fixture (Figure 1-1) Model 36801K which has a K Connector. The RAL is supports on-substrate testing of microstrip and co- equipped as follows: planar waveguide (CPW) devices.

  • Page 7: Mechanical Specifications

    SPECIFICATIONS I GENERAL INFORMATION 63(&,),&$7,216 The mechanical and electrical specifications for the 3680 Series Universal Test Fixture and optional accessories are listed in Table 1-1. 7DEOH  Specifications for the Series 3680 Universal Test Fixture and Accessories (1 of 3)
  • Page 8 I GENERAL INFORMATION SPECIFICATIONS 7DEOH  Specifications for the 3680 Series Universal Test Fixture and Accessories (2 of 3) EXPECTED ACCURACY When Used with a Scalar Network Analyzer Typical SNA Measurement Errors at 10 GHz (Frequency Response Normalized): Examples of typical amplitude coefficient values are shown for calculation purposes. Convert to dB using the RF Measurement Chart on page 1-5.
  • Page 9 SPECIFICATIONS I GENERAL INFORMATION Specifications for the 3680 Series Universal Test Fixture and Accessories (3 of 3) 7DEOH  EXPECTED ACCURACY (Continued) When Used with a Scalar Network Analyzer Overall Insertion Loss Uncertainty (with examples): Dynamic Insertion Loss Interaction Channel...
  • Page 10 I GENERAL INFORMATION SPECIFICATIONS RF Measurement Chart 7DEOH  Conversion tables for Return Loss, Reflection Coefficient, and SWR with tablular values for interaction of a small phasor x with a large phasor (unity reference) expressed in dB related to reference. Relative to Unity Reference REF ±...

  • Page 11: Component Descriptions

    COMPONENT DESCRIPTIONS I GENERAL INFORMATION /HYHUV – Used to open the lower jaws. Closing of the &20321(17 '(6&5,37,216 lower jaws is controlled by spring pressure. The following is a list and description of the compo- nents that make up the UTF. Refer to Figure 1-2 for -DZV –...
  • Page 12 I GENERAL INFORMATION COMPONENT DESCRIPTIONS DIELECTRIC SUBSTRATE SPACER CONNECTOR LEVER STOP LEVER CONNECTOR BASE RODS MODEL 3680 V JAWS SLIDE OFFSET FIXED SLIDING BLOCK CONNECTOR CONNECTOR BLOCK BLOCK )LJXUH  3680 Series Universal Test Fixture Components 3680 OMM 1-7/1-8 www.valuetronics.com...

  • Page 13: Section Ii Operation

    SECTION II OPERATION ,1752'8&7,21 measurements. The typical loss of each UTF connec- tor is approximately 0.25 db at 40 GHz and 0.4 dB The UTF can be used with either scalar network at 60 GHz. analyzer (SNA) or vector network analyzer (VNA) systems.

  • Page 14: Operation With Vector Network Analyzer Systems

    OPERATION WITH VECTOR NETWORK ANALYZER SYSTEMS II OPERATION 127( 23(5$7,21 :,7+ 9(&725 It may be necessary to push the 1(7:25. $1$/<=(5 6<67(06 substrate slightly downward to al- The following steps are necessary to use the UTF low the substrate to slip under the with VNA systems.

  • Page 15: Cpw Measurement Considerations

    The CPW upper jaws are included as part of the CPW calibra- (b) Move the sliding connector block toward tion/verification kit (Anritsu Model 36804B-25C). the substrate until it almost touches the substrate. When making CPW measurements, it is recom-...

  • Page 16: Measurements Of Substrate Mounted On Carriers

    MEASUREMENTS OF SUBSTRATE MOUNTED ON CARRIERS II OPERATION 0($685(0(176 2) 68%675$7( 86( 2) 7+( 68%675$7( 6723 02817(' 21 &$55,(56 The substrate stop is used to accurately position Substrates mounted on carriers are not measured as substrates of the same width. Adjust the stop as accurately as non-carrier mounted substrates.

  • Page 17: Calibration/Verification Kits

    SECTION III CALIBRATION ,1752'8&7,21 method. Refer to paragraph 3-4 for the OSL, LRL, and LRM calibration procedures. This section contains calibration information and procedures that apply to VNA systems only. SNA &$/,%5$7,219(5,),&$7,21 .,76 systems should be calibrated and normalized prior to connection to the UTF (see Section 2, paragraph The UTF calibration/verification kits contain preci- 2-2a).

  • Page 18: Calibration For Microstrip

    &$/,%5$7,21 )25 0,&52675,3 (4) Select CHANGE LRL/LRM PARAME- TERS and CHARACTERIZE CAL DE- The following LRL, LRM, and OSL calibration pro- VICES; cedures support the Anritsu Model 360B and 372XXA VNAs. • For DEVICE 1, enter the length of 127( LINE 1 (typically 1.00 cm).
  • Page 19 III CALIBRATION CALIBRATION FOR MICROSTRIP • E /LQH5HIOHFW0DWFK &DOLEUDWLRQ If TWO BANDS was selected in step 1.(e)(2), then enter the BREAKPOINT LRM calibration is a variation of LRL calibration frequency in GHz. where a termination is substituted for line 2. LRM calibration can cover the same wide bandwidth as (5) Select CHANGE LRL/LRM PARA-ME- OSL calibration but LRM calibration results in a...

  • Page 20: Calibration For Cpw

    CALIBRATION FOR CPW III CALIBRATION quency of the low frequency LRL line. For a com- H 5HFDOLEUDWLRQ ZLWK WKH 6WRUHG &DOLEUDWLRQ bined LRL and LRM calibration, select as break- When a new calibration is desired, recall the stored point the top frequency of the calibration divided by calibration, make any required minor changes, and six;...

  • Page 21: Calibration Checks

    III CALIBRATION CALIBRATION CHECKS E 0HDVXUHPHQW RI .QRZQ 6WDQGDUGV (2) THICKNESS OF SUBSTRATE: 0.2500 This technique uses the Beatty Line as the known standard. In theory, a 30 ohm Beatty Line standard : 50.000 Ω (3) Z (1) gives a return loss of 6 dB and an insertion loss (4) EFFECTVE DIELECTRIC: 5.1 of 1.2 dB at each frequency that is an odd quarter wave multiple of its length and (2) appears as a...
  • Page 22 CALIBRATION CHECKS III CALIBRATION F 0HDVXUHPHQW RI $VVXUDQFH 6WDQGDUGV 4. Convert the value of the source match error to This is the most accurate technique for evaluating dB using the RF Measurement Chart on page the accuracy of a calibration. It uses independent 1-5.

  • Page 23: Addendum

    III CALIBRATION CALIBRATION CHECKS Addendum 26/ &DOLEUDWLRQ 8WLOL]LQJ 87) &DOLEUDWLRQ .LWV Series 36804B UTF Calibration/Verification kits have been updated to allow for dispersion correction with 360B VNA systems. The open and short circuit coefficients sent with these new kits take into account microstrip dispersion.

  • Page 24: Section Iv Maintenance

    SECTION IV MAINTENANCE ,1752'8&7,21 F $GMXVWPHQW 3URFHGXUH This section provides instructions for maintaining 1. Required tools: the UTF. Maintenance requirements are limited to Screwdriver, Phillips adjustment of the connector block upper jaws, re- moval and replacement of connectors, and preven- 2.

  • Page 25: Connector Removal And Replacement

    UTF. When replacing the connector or connector (f) Torque the connector to 8 inch/pounds. pin, use the following Anritsu parts: (g) Reinspect the pin for proper positioning. 3.5 mm & K Connector Pin – P/N B22849 Adjust as required by repeating the above V Connector Pin –...

  • Page 26: Preventive Maintenance

    IV MAINTENANCE PREVENTIVE MAINTENANCE 35(9(17,9( 0$,17(1$1&( E &DOLEUDWLRQ .LWV D 87) The following preventive maintenance is recom- mended for the calibration kits: The following preventive maintenance is recom- mended for the UTF: 1. Keep the calibration substrates in the holder except when in use.
  • Page 27 SECTION V OPTIONAL ACCESSORIES ,1752'8&7,21 5,*+7$1*/( /$81&+(5 The UTF optional accessories are the Model 36801 D *HQHUDO ,QIRUPDWLRQ Right-Angle Launcher, the Model 36802 MMIC At- The Model 36801 Right-Angle Launcher (RAL) is tachment, and the Model 36803 Bias Probe. This used to make multi-port connections as well as right- section contains a general description of each acces- angle connections to the test substrates.

  • Page 28: Right Angle Launcher

    RIGHT-ANGLE LAUNCHER V OPTIONAL ACCESSORIES Calibration of a VNA with an RAL/UTF setup is 3. Mount the substrate to be tested into the jaws performed using the standard UTF calibration kit of the sliding connector block and if and following the calibration procedures found in appropriate, the fixed connector block.

  • Page 29: Mmic Attachment

    V OPTIONAL ACCESSORIES MMIC ATTACHMENT Each connection substrate has a tab projecting from 00,& $77$&+0(17 one end. The tab makes connection with the test D *HQHUDO ,QIRUPDWLRQ substrate. The opposite end of the connection sub- The Model 36802 MMIC Attachment is used to strate is clamped into the UTF connector block jaws.
  • Page 30 MMIC ATTACHMENT V OPTIONAL ACCESSORIES Calibration of the VNA with the MMIC attach- The test substrate height may need to be re- ment/UTF setup consists of an LRL calibration us- adjusted. ing the standard UTF calibration kit and the Section 7.
  • Page 31 V OPTIONAL ACCESSORIES MMIC ATTACHMENT connection substrate to overlap the base G 0HDVXUHPHQW block; it does not have to be near the edge. Replace the calibration substrate with the test sub- 5. Rotate the cam levers to allow the cam strate.

  • Page 32: Bias Probe

    BIAS PROBE V OPTIONAL ACCESSORIES D 8VLQJ WKH SUREH DVVHPEO\ DV D ELDV SUREH %,$6 352%( The Model 36803 Bias Probe can be used either as a 1. Plug the probe assembly into an appropriate bias probe or as a hold-down for components. When hole in a UTF connector block or MMIC at- used as a hold-down, the dielectric probe is used.

  • Page 33: Section Vi Applications

    An example of upper jaw modification is shown in the lower half of Figure 6-2. A kit of upper 87)720,&52675,3 &211(&7,21 jaws is available. Order Anritsu P/N C23845. 3,1 '(6,*1 The center conductor pin on the back side of the UTF’s RF connector (a K Connector or a V Connec-...

  • Page 34: Measurement Considerations

    MEASUREMENT CONSIDERATIONS VI APPLICATIONS 1. Decide on frequency span. The maximum not be made directly under the connector pin and span is 9:1. poor measurement results can be expected. 2. Select length of line one. 1 cm is a good choice. On some carriers, the substrate sits in a channel, with the top of the carrier extending above the top 3.
  • Page 35 Anritsu Company 490 Jarvis Drive Morgan Hill, CA 95037-2809 FAX (408) 778-0239 Printed in USA P/N:10410-00064 June 1998; Rev: F Copyright 1991 Anritsu Co. www.valuetronics.com...

This manual is also suitable for:

3680-203680k3680v36801k36801v36802

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