Specification Setup Description (2) - Microtest 7605 User Manual

3.6 Specification setup description (2)

(1) OPEN: Open circuit detection sensitivity. Poor connection of the high
voltage test wire to the DUT may lead to a lower measurement current
and invalid qualified product results in the voltage test. Once this
function is enabled (with non-zero settings) your machine will measure
the DUT's capacitance with low voltage for about 200ms before the
high voltage test begins. In case the measured capacitance value is
lower than the settings, the test wire may not be connected to the DUT
properly and your machine will stop the test and prompt the message
"OPEN". You may set this in two options: Manual and auto. The first
requires manual input of the given value. The second contains the
following steps: Connect the DUT properly; point the cursor to the field
OPEN and press the software key AUTO; your machine measures the
given output channel and prompts the results; the message
"SAVE=ENTER" displays after the measurement operation is done;
press the ENTER key to save the test value or the EXIT key to exit
without saving it.
Note: In case readings with or without connection to the DUT
differ from each other in a range less than 20, then its capacitance
is too small and may not be valid for using this method for an open
circuit test.
(2) DLAY: This item is aimed at judging the delay time and is editable
only in IR mode. For IR tests of the DUT with capacitance, this can be
Figure 3-6-1 Setup 2