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MI 3340 AlphaEE XA
Instruction manual
Ver. 1.2.3, code no. 20 753 403

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Summary of Contents for METREL MI 3340 AlphaEE XA

  • Page 1 MI 3340 AlphaEE XA Instruction manual Ver. 1.2.3, code no. 20 753 403...
  • Page 2 DATA BACKUP AND LOSS: regularly backup and validate the integrity of backups of the data. METREL HAS NO OBLIGATION OR LIABILITY FOR ANY LOSS, ALTERATION, DESTRUCTION, DAMAGE, CORRUPTION OR RECOVERY OF USER DATA, REGARDLESS OF WHERE THE DATA IS STORED.
  • Page 3 MI 3340 - AlphaEE XA Table of Contents General description....................8 Warnings and notes ....................8 1.1.1 Safety warnings ....................8 1.1.2 Warnings related to batteries .................8 1.1.3 Warnings related to safety of measurement functions ........9 1.1.4 Markings on the instrument ................9 1.1.5 Note related to measurement procedure ............
  • Page 4 MI 3340 - AlphaEE XA Table of Contents 4.6.7 Devices ......................33 Instrument profiles ....................34 Workspace Manager ..................... 35 4.8.1 Workspaces and Export ................. 35 Auto Sequence® groups ..................36 Memory Organizer ....................38 Operations in Memory Organizer ................38 5.1.1 Operations on Workspace ................
  • Page 5 MI 3340 - AlphaEE XA Table of Contents 6.4.20 Clamp current ....................76 6.4.21 SELV/PELV Voltage ..................77 6.4.22 EVSE Diagnostic Test (A 1632)............... 79 6.4.23 EV-RCD ......................80 6.4.24 PE conductor (EV RCD) .................. 81 6.4.24.1 Compensation of IEC plug adapter resistance ........... 82 6.4.25 Enhanced TRMS test ..................
  • Page 6 Print labels and read NFC tags ............... 113 PAT tag format ....................113 Generic tag format ....................114 Appendix D Programming of Auto Sequences on Metrel ES Manager ......115 Auto Sequence Editor workspace ................ 115 ® Managing groups of Auto Sequences ..............
  • Page 7 MI 3340 - AlphaEE XA Table of Contents Standard ......................130 Instructed ......................130...
  • Page 8 • Metrel Auto Sequences® are designed as guidance to tests in order to significantly reduce testing time, improve work scope and increase traceability of the tests performed. Metrel assumes no responsibility for any Auto Sequence by any the selected Auto Sequence.
  • Page 9 MI 3340 - AlphaEE XA General description • Do not attempt to disassemble, crush or puncture the batteries in any way. • Do not use a damaged battery. • If a battery has leaking fluids, do not touch any fluids. •...
  • Page 10 LCD screenshots in this document are informative only. Screens on the instrument may be slightly different. • Metrel reserve the right to make technical modifications without notice as part of the further development of the product. 1.2.1 Battery and charging characteristics...
  • Page 11 MI 3340 - AlphaEE XA General description • Charge the instrument battery pack to approximately 50% of capacity at least once every 6 months. 1.3.1 Testing 230 V electrical equipment 230 V equipment can be fully tested, except if testing in IT or CT supply system. Appendix F Testing in IT and CT supply systems for limitations.
  • Page 12 MI 3340 - AlphaEE XA General description EN 61557 Electrical safety in low voltage distribution systems up to 1 000 V a.c. and 1 500 V d.c. Equipment for testing, measuring or monitoring of protective measures Instrument complies with all relevant parts of EN 61557 standards. Functionality Code of Practice Household and similar electrical appliances...
  • Page 13 Soft padded carrying bag , 1 m form instruction manual (Quick Guide) *SW 1201 Metrel ES Manager and all documentation can be downloaded free of charge from Metrel Web server (https://www.metrel.si/en/downloads/) or Metrel Documentation center (https://doc.metrel.si/). For a list of optional accessories, approved with this test instrument, visit www.metrel.si.
  • Page 14 MI 3340 - AlphaEE XA Instrument description 3 Instrument description Mains supply connector Mains test socket IEC test connector PE, COM / Clamp terminal LN / Clamp terminal P/S (probe), V terminal USB communication port Colour TFT display with touch screen Pass / fail LED bar Set of keys (for details, see chapter General meaning of...
  • Page 15 MI 3340 - AlphaEE XA Instrument description Serial number label Battery / fuse compartment cover with information label Battery / fuse compartment cover screws...
  • Page 16 MI 3340 - AlphaEE XA Instrument description 3.2.1 Battery / fuse compartment Li-ion battery pack Battery connector Micro SD card slot F1, F2, F3 fuses (for details, see chapter Fuses)
  • Page 17 MI 3340 - AlphaEE XA Instrument operation 4 Instrument operation The instrument can be manipulated via a keypad or touch screen. Cursor keys are used to: • Select appropriate option. • Left, right, up, down. • In some functions: page up, page down. RUN key is used to: •...
  • Page 18 MI 3340 - AlphaEE XA Instrument operation Tap (briefly touch surface with fingertip) is used to: • Select appropriate option. • Confirm selected option. • Start and stop measurements. Swipe (press, move, lift) up/ down is used to: • Scroll content in same level. •...
  • Page 19 MI 3340 - AlphaEE XA Instrument operation At start up and during operation the instrument performs various safety checks to ensure safety and to prevent any damage. If a safety check fails, an appropriate warning message will be displayed and safety measures will be taken. Supply voltage warning I •...
  • Page 20 MI 3340 - AlphaEE XA Instrument operation result in a high current after applying power to the device under test. If the too high current is only of short duration (caused by a short inrush current) the test can be performed otherwise not.
  • Page 21 MI 3340 - AlphaEE XA Instrument operation In pre-test a possible high leakage current was detected. It is likely that a dangerous leakage current (higher than 3.5 mA) will flow after applying power to the device under test. The measured leakage current was higher than 20 mA.
  • Page 22 MI 3340 - AlphaEE XA Instrument operation The device under test should be switched on (to ensure that the complete circuit is tested). In case of simultaneously measuring of Riso, Riso-S or Isub, Isub-S: if the voltage has dropped because of one measurement the other measurement is also compromised.
  • Page 23 MI 3340 - AlphaEE XA Instrument operation Conditions on the input terminals do not allow starting the measurement, consider displayed warnings and messages. Stop the measurement. Bluetooth communication active / inactive. Hint For some icons more information is displayed if on icon.
  • Page 24 Date / Time Setting date and time Workspace Manager Managing project files Auto Sequence® groups Managing lists of Auto Sequences® User accounts Managing user accounts Connectivity Menu with QR code link for connection to Metrel Cloud app Profiles Instrument profiles...
  • Page 25 MI 3340 - AlphaEE XA Instrument operation (This setting is visible only if more than one profile is available.) Settings Setting different system and measuring parameters Devices Setting external devices Bluetooth init. Bluetooth initialization Initial Settings Factory settings About Instrument data 4.6.1 Settings Touch screen Set Touch screen on / off.
  • Page 26 MI 3340 - AlphaEE XA Instrument operation • Worst the worst result of the measurement will be displayed at the end of test. • Last the last result will be displayed at the end of test. Notes and exceptions: • In general, the worst result(s) of the main result is considered.
  • Page 27 MI 3340 - AlphaEE XA Instrument operation 4.6.2 Bluetooth initialization In this menu the Bluetooth module is reset. 4.6.3 Initial Settings In this menu internal Bluetooth module will be initialized and the instrument settings, measurement parameters and limits will be set to initial (factory) values. WARNING Following customized settings will be lost when setting the instruments to initial settings:...
  • Page 28 MI 3340 - AlphaEE XA Instrument operation 4.6.5 User Accounts The demand to sign in can prevent from unauthorized persons to work with the instrument. In this menu user accounts can be managed: Setting if signing in to work with the instrument is required or not. ...
  • Page 29 MI 3340 - AlphaEE XA Instrument operation To sign in, the selected user password must be entered and confirmed. The user password consists of a up to 4 digit number. Administrator signing in Enters Account manager menu. The administrator password must be entered and confirmed first.
  • Page 30 MI 3340 - AlphaEE XA Instrument operation Enters the Account manager menu. The Account manager menu is accessed by selecting Account Manager in Sign in menu or User profile menu. The administrator password must be entered and confirmed first. The factory set default administrator password is: ADMIN 4.6.5.3 Managing accounts Figure 4.3: Account manager menu...
  • Page 31 MI 3340 - AlphaEE XA Instrument operation Figure 4.4: Edit accounts menu Options Opens the window for adding a new user account. In the Add New window the name and initial password of new user account. Changes password of the selected user account. Enters menu for setting user permissions Deletes all user accounts.
  • Page 32 MI 3340 - AlphaEE XA Instrument operation Options with different user permissions. For more information see Appendix G User permissions. 4.6.5.5 Setting Black-box password Black-box password can be set by administrator from the Account manager menu. Set Black- box password is valid for all users. Default Black-box password is empty (disabled). Options Add or edit Black-box password.
  • Page 33 MI 3340 - AlphaEE XA Instrument operation 4.6.6 Connectivity In this menu QR code link for connection to Metrel Cloud App is displayed. Refer to Metrel Cloud help for more information. Note • Metrel Cloud app is available for Android and iOS.
  • Page 34 MI 3340 - AlphaEE XA Instrument operation Tag format Set tag / label format: [PAT, generic]. See Appendix C Print labels and read NFC tags. Tag type Select tag type to be printed: [simple, classic, QR]. See Appendix C Print labels and read NFC tags.
  • Page 35 Workspaces are stored on microSD card on directory WORKSPACES, while Exports are stored on directory EXPORTS. Export files can be read by Metrel applications that run on other devices. Exports are suitable for making backups of important works or can be used for storage of works if the removable microSD card is used as a mass storage device.
  • Page 36 MI 3340 - AlphaEE XA Instrument operation Select Open selected Workspace in Memory Organizer Delete Delete selected Workspace Export Export selected Workspace into an Export Import Import selected Export to a Workspace Delete Delete selected Export The Auto Sequences in the instrument can be organized by using lists. In a list a group of similar Auto Sequences is stored.
  • Page 37 MI 3340 - AlphaEE XA Instrument operation Open Open the selected Auto Sequence group in the Auto Sequences® main menu. Delete Delete the selected Auto Sequence group.
  • Page 38 MI 3340 - AlphaEE XA Memory Organizer 5 Memory Organizer Memory Organizer is an environment for storing and working with test data. The data is organized in a multilevel tree structure with Structure objects and Measurements. For a list of available structure objects see Appendix A Structure objects in AlphaEE 5.1.1 Operations on Workspace...
  • Page 39 MI 3340 - AlphaEE XA Memory Organizer Start Test Start a new measurement Clone Copy selected measurement as an empty measurement under the same Structure object Copy, Paste Copy a selected measurement as an empty measurement to any location in structure tree Add an empty measurement Comment View / add a comment to the measurement...
  • Page 40 MI 3340 - AlphaEE XA Memory Organizer 5.1.3 Measurement statuses Measurement statuses indicate the status of a measurement or a group of measurements in the Memory Organizer. Statuses of Single tests Passed finished single test with test results Failed finished single test with test results Finished single test with test results and no status Empty single test without test results...
  • Page 41 MI 3340 - AlphaEE XA Memory Organizer No status indication if all measurement results under each structure element / sub-element have passed or are without measurements. 5.1.4 Operations on Structure objects Start Test Start a new measurement (proceeds to menus for selection of measurement) Parameters View / edit parameters...
  • Page 42 MI 3340 - AlphaEE XA Memory Organizer Header line (Workspace), Search Enter Search menu Search Clear filters Clear set filters in Search menu Operations on found structure objects Header line (Page x/y), Next Page, Go Page Up / Down Previous Page Go to location Jump to selected location in Memory organizer Parameters...
  • Page 43 MI 3340 - AlphaEE XA Single tests 6 Single tests Different modes for selecting single tests are available. 6.1.1 Area groups With help of area groups, it is possible to limit the number of offered single tests, according to the field of use. Select Area Group Select appropriate Area group or All single tests...
  • Page 44 MI 3340 - AlphaEE XA Single tests Groups View groups, (sub-groups) of available measurements Selector This view mode is suited for fast work with the keypad Last used View last made measurements Area groups Change area group In the Single test screens main measuring results, sub-results, limits and parameters of the measurement are displayed.
  • Page 45 MI 3340 - AlphaEE XA Single tests Start test Start single test Parameters, or tap on Parameters field Set parameters/ limits of single test Help View help screens Lim. Calculator, Calibrate: other options are available, depending on the test. See chapter Single test measurements for more information.
  • Page 46 MI 3340 - AlphaEE XA Single tests 6.2.2 Single test screen during test End single test Proceed to the next step of a single test Reconnect and proceed with the next step of a single test Previous, next test screen Testing procedure (during the test) Observe the displayed results and statuses Check for eventual messages, warnings...
  • Page 47 MI 3340 - AlphaEE XA Single tests A new measurement was started from a The measurement will be saved under the Structure object in the structure tree selected Structure object A new measurement was started from Saving under the last selected Structure the Single test main menu object will be offered by default.
  • Page 48 MI 3340 - AlphaEE XA Single tests 6.3.1 Single test (inspection) start screen Start test Start the inspection Help View help screens 6.3.2 Single test (Inspection) screen during test Header line (name of inspection), Apply or clear the overall status to complete apply Pass or Fail or Checked or Clear inspection Select group of items,...
  • Page 49 MI 3340 - AlphaEE XA Single tests Select items, Apply or clear the status of an individual item apply Pass or Fail or Checked or Clear Power Test Power is applied to the mains test socket to power up the tested equipment during a functional inspection.
  • Page 50 MI 3340 - AlphaEE XA Single tests Save results Save the result Comment Add comment to the inspection Help View help screens A new inspection was started from a The inspection will be saved under the Structure object in the structure tree selected Structure object.
  • Page 51 MI 3340 - AlphaEE XA Single tests 6.4.1 Visual inspection Test results / sub-results Pass, Fail, Checked Test circuit 6.4.2 Continuity Test results / sub-results Resistance Test parameters Output Output: [P/S PE, MS_PE IEC_PE] Test current I out: [0.2 A] Start mode Start mode: [Manual, Auto] Duration...
  • Page 52 MI 3340 - AlphaEE XA Single tests Test circuits Measurement procedure (Start mode = Auto) In this mode, multiple measurements can be taken at different test points within a single test. 1. Start the test: The instrument checks for a low resistance connection. 2.
  • Page 53 MI 3340 - AlphaEE XA Single tests 6.4.2.1 Compensation of test lead(s) / IEC test cable resistance Resistance of test lead(s) and cables can be compensated. Compensation is possible in following functions: • Continuity (Output = P/S PE, MS_PE IEC_PE) •...
  • Page 54 MI 3340 - AlphaEE XA Single tests Note • The compensation value is correct only for the output (P/S terminal PE terminal on test socket or P/S terminal PE terminal) at which the calibration was carried out. Hint • To reset compensation value, carry out compensation with open leads. 6.4.2.2 Limit calculator Limit calculator is a tool for determining the resistance high limit.
  • Page 55 MI 3340 - AlphaEE XA Single tests L wire length R Limit [Ω] L <= 5 m 5 m < L <= 12.5 m 12.5 m < L <= 20 m 20 m < L <= 27.5 m 27.5 m < L <= 35 m 35 m <...
  • Page 56 MI 3340 - AlphaEE XA Single tests 20 m < L <= 25 m 0.49 0.38 0.31 0.27 25 m < L <= 30 m 0.55 0.41 0.33 0.29 30 m < L <= 35 m 0.61 0.45 0.35 0.30 35 m <...
  • Page 57 MI 3340 - AlphaEE XA Single tests Wire cross-section [mm L wire length R Limit [Ω] L <= 2 m 0.20 0.20 0.20 2 m < L <= 5 m 0.21 0.21 0.20 5 m < L <= 10 m 0.22 0.21 0.21...
  • Page 58 MI 3340 - AlphaEE XA Single tests Test circuits Riso Riso-S Riso (fixed installed DUT) Note • The current through the P/S probe is also considered in the Riso result. 6.4.4 Sub-leakage (Isub, Isub-S) Test results / sub-results Isub (+result) Sub-leakage current Result [TRMS] Isub-S (+result)
  • Page 59 MI 3340 - AlphaEE XA Single tests Isub Isub-S Isub (fixed installed DUT) Note • When P/S probe is connected during the Sub-leakage measurement, then the current through it is also considered. 6.4.5 Auto test: Cont+Ins+Sub Test results / sub-results Resistance Isub (+result) Sub-leakage current...
  • Page 60 MI 3340 - AlphaEE XA Single tests Duration Isub 30 s] Test limits Limit (Row) H Limit (R): [Off, Custom, 0.01 Ω 9 Ω] Limit (Isub) H Limit (Isub): Limit (Riso) L Limit (Riso): [Off, Custom, 0.01 MΩ 10.0 MΩ] Additional options Calibrate Calibrate see chapter...
  • Page 61 MI 3340 - AlphaEE XA Single tests 6.4.6 Differential Leakage Test results / sub-results Idiff (+ mains, result) Diff: Differential Leakage current Mains: [nor, rev] Result [TRMS] Power not shown separately in Result view = Standard Test parameters Duration Duration: Mains polarity [All, Normal, Reversed] Normal: Phase voltage is applied to the right output of...
  • Page 62 MI 3340 - AlphaEE XA Single tests Result [TRMS, AC, DC] Test parameters Duration Duration: Test limits H Limit (Ileak TRMS) H limit (Ileak): H Limit (I_AC) H limit (I_ac): H Limit (I_DC) H limit (I_dc): Test circuit Note • For this test instrument shall be battery powered (not connected to the mains).
  • Page 63 MI 3340 - AlphaEE XA Single tests Test parameters Duration Duration: Mains polarity [All, Normal, Reversed] Normal: Phase voltage is applied to the right output of the mains test socket. Reversed: Phase voltage is applied to the left output of the mains test socket. All: All tests will be carried out.
  • Page 64 MI 3340 - AlphaEE XA Single tests Note • Single Fault Condition Adapter (A 1789) should be used, to simulate single fault condition connections. 6.4.9 Touch Leakage Test results / sub-results Itou (+ mains, condition, result) Touch Leakage current Mains [nor, rev] Condition [NC, sfN, sfPE] Result [TRMS, AC, DC] Power...
  • Page 65 MI 3340 - AlphaEE XA Single tests H Limit (Itou TRMS, sfN) H limit (Itou TRMS): H Limit (Itou AC, sfN) H limit (Itou AC): [Off, Custom, 0.50 mA, 5.00 mA] H Limit (Itou DC, sfN) H limit (Itou DC): [Off, Custom, 2.0 mA, 25 mA] H Limit (Itou TRMS, sfPE) H limit (Itou TRMS): H Limit (Itou AC, sfPE)
  • Page 66 MI 3340 - AlphaEE XA Single tests Mains polarity [All, Normal, Reversed] Normal: Phase voltage is applied to the right output of the mains test socket. Reversed: Phase voltage is applied to the left output of the mains test socket. All: Tests at both polarities will be carried out.
  • Page 67 MI 3340 - AlphaEE XA Single tests Ipe+Ifi (+ result) Sum of PE and Floating Input leakage currents Mains [nor, rev] Result [TRMS] Idiff+Ifi (+ result) Sum of Differential and Floating Input leakage currents Mains [nor, rev] Result [TRMS] Ipe (+ mains, result) Touch Leakage current Mains [nor, rev] Result [TRMS]...
  • Page 68 MI 3340 - AlphaEE XA Single tests Step 1 Step 2 Note • The measurement consists of three steps. Step 1 - Ipe or Idiff is measured. Step 2 - Ifi is measured. If there are more floating inputs, individual inputs can be measured successively and the results are added together.
  • Page 69 MI 3340 - AlphaEE XA Single tests Test circuit 6.4.13 Leak's & Power Test results / sub-results Active power Itou (+ mains, condition, result) Touch Leakage current Mains [nor, rev] Condition [NC, sfN, sfPE] Result [TRMS, AC, DC] Idiff TRMS (+ mains) Diff: Differential Leakage current Mains [nor, rev] Condition [NC]...
  • Page 70 MI 3340 - AlphaEE XA Single tests Condition [NC, SFC-N, SFC-PE] NC: normal condition SFC-N: single fault, N open SFC-PE: single fault, PE open Test limits H Limit (P) H limit L Limit (P) L limit (P): H Limit (Idiff TRMS) H limit (Idiff): H Limit (Itou TRMS, NC) H limit (Itou TRMS):...
  • Page 71 MI 3340 - AlphaEE XA Single tests trip-out time (I , (+) positive polarity)   trip-out time (I , (-) negative polarity)   trip-out time (I =5I , (+) positive polarity)   trip-out time (I =5I , (-) negative polarity) ...
  • Page 72 MI 3340 - AlphaEE XA Single tests trip-out time (I =5I , (-) negative polarity)   trip-out time (I =½I , (+) positive polarity)   trip-out time (I =½I , (-) negative polarity)   trip-out current I (+) trip-out current at (+) positive polarity I (-) trip-out current at (-) negative polarity...
  • Page 73 MI 3340 - AlphaEE XA Single tests Result Indication that the protection of the varistor in PE connection works properly Test parameters Type of PRCD Design: [2 pole, 3 pole, S (3 pole), S+] Duration Duration: [Off, 2 s 180 s] Nominal current IΔN: [10 mA, 15 mA, 30 mA] Nominal current (K/Di varistor)
  • Page 74 MI 3340 - AlphaEE XA Single tests In this test the instrument disconnects individual conductors on the supply side and the response of the PRCD is checked. Test results / sub-results L open Result for open L conductor [Pass, Fail] N open Result for open N conductor [Pass, Fail] PE open...
  • Page 75 MI 3340 - AlphaEE XA Single tests Test = manual Test = auto Notes • A safe but high voltage is applied to the test lead during the test. Do not touch the exposed tip at the end of the test lead. Risk of not dangerous but unpleasant electric shock! •...
  • Page 76 MI 3340 - AlphaEE XA Single tests Not applicable in AUS/NZ and UK versions. Test circuits Mode = normal Mode = active Note • Active polarity test is intended for testing cords equipped with (P)RCD or mains operated switches. 6.4.20 Clamp current Test results / sub-results Current Test parameters...
  • Page 77 MI 3340 - AlphaEE XA Single tests High Limit (I, Idiff, Ipe) Limit(I, Idiff, Ipe): Test circuit Note • The frequency range of this measurement is limited. This measurement function cannot be used for measuring leakage currents of appliances that are able to generate leakage currents with frequencies above 10 kHz or above the specified frequency range of the clamp.
  • Page 78 MI 3340 - AlphaEE XA Single tests Condition [NC, SFC-N, SFC-PE] NC: normal condition SFC-N: single fault, N open SFC-PE: single fault, PE open Test limits H Limit (U NC, TRMS) Limit (U NC, TRMS): [Off, Custom, 50 V, 60 V] H Limit (U NC, AC) Limit (U NC, AC): [Off, Custom, 30 V, 50 V] H Limit (U NC, DC)
  • Page 79 MI 3340 - AlphaEE XA Single tests • Single Fault Condition Adapter (A 1789) should be used, to simulate single fault condition connections. • Voltmeter is floating against PE. 6.4.22 EVSE Diagnostic Test (A 1632) Test results / sub-results Maximal value of CP (control pilot) signal Minimal value of CP (control pilot) signal Duty C.
  • Page 80 • Refer to application note Guide to OmegaPAT/GT XA for more information. • Follow instructions in Metrel Auto Sequences® for charging cables. 6.4.23 EV-RCD Test results / sub-results trip out time trip-out time at (+) positive polarity...
  • Page 81 A 1832 eMobility Adapter Instruction manual for more information. • Refer to application note Guide to OmegaPAT/GT XA for more information. • Follow instructions in Metrel Auto Sequences® for charging cables. 6.4.24 PE conductor (EV RCD) Test results / sub-results R ....Resistance Test parameters...
  • Page 82 MI 3340 - AlphaEE XA Single tests Test current I test [standard, low] Standard: I test = 0.2 A Low: Itest = < 3 mA Test limits H Limit (R) H Limit (R): [Off, Custom, 0.01 Ω Ω] Additional options Calibrate Calibrate Compensation of IEC plug cable...
  • Page 83 MI 3340 - AlphaEE XA Single tests Connect test lead between test instrument socket PE (using A 1610 Continuity test adapter) and PE pin of A 1634 plug, connected to A 1632 eMobility Analyser. Calibrate: Compensate IEC plug adapter resistance Symbol is displayed if the compensation was carried out successfully.
  • Page 84 MI 3340 - AlphaEE XA Single tests Note • This function is intended as a check of voltages and loop resistance at mains sockets. Some (but not all) errors are detected and are indicated on the display. 6.4.26 Functional test Test results / sub-results Pass, Fail, Checked Test circuit...
  • Page 85 7 Auto Sequences® Auto Sequences® are pre-programmed sequences of measurements. The Auto Sequences can be pre-programmed on PC with the Metrel ES Manager software and uploaded to the instrument. On the instrument parameters and limits of individual single test in the Auto Sequence can be changed / set.
  • Page 86 MI 3340 - AlphaEE XA Auto Sequences® Start Test Start Auto Sequence View View Auto Sequence 7.1.1 Organization of Auto Sequences® in Auto Sequences® menu The Auto Sequence® menu can be organized in a structural manner with folders, sub-folders and Auto Sequences. Auto Sequence in the structure can be the original Auto Sequence or a shortcut to the original Auto Sequence.
  • Page 87 MI 3340 - AlphaEE XA Auto Sequences® During the execution phase of an Auto Sequence, pre-programmed single tests are carried out. The sequence of single tests is controlled by pre-programmed flow commands. After the test sequence is finished the Auto Sequence result menu is shown. Details of individual tests can be viewed and the results can be saved to Memory organizer.
  • Page 88 MI 3340 - AlphaEE XA Auto Sequences® Name of selected single test Multiple points selected Options Parameters / limits of selected single test Single tests Header Parameters View/edit parameters Start Test Start of Auto Sequence® Help View help screens Additional option: Calibrate Compensation of test leads resistance Enable multiple points testing: set Multiple points, see...
  • Page 89 MI 3340 - AlphaEE XA Auto Sequences® 7.2.3 Indication of Loops programmed. This means that the marked single test will be carried out as many times as the t the end of each individual measurement. 7.2.4 Managing multiple points If the device under test has more than one test point for an individual single test and the selected Auto Sequence predicts only one test point (one single test) it is possible to change the Auto Sequence appropriately.
  • Page 90 Expert mode for Inspections Skip non-safety notifications For the actual list and description of flow commands see Metrel ES Manager software help file. The offered options in the control panel depend on the selected single test, its result and the programmed test flow.
  • Page 91 MI 3340 - AlphaEE XA Auto Sequences® Auto Sequence name Overall status Test date and time Short code Options Description Status of single test Single tests Start Test Start a new Auto Sequence View View results of individual measurements. Comment Add comment to Auto Sequence Print label Print label (available only if printing device is set).
  • Page 92 MI 3340 - AlphaEE XA Auto Sequences® A new Auto Sequence was Saving under the last selected Structure object will be started from the offered by default. The user can select another Auto Sequence main menu Structure object or create a new Structure object. By pressing Save in Memory organizer menu the Auto Sequence result is saved under selected location.
  • Page 93 MI 3340 - AlphaEE XA Maintenance 8 Maintenance Unauthorized persons are not allowed to open the AlphaEE XA instrument. There are no user replaceable components inside the instrument, except the battery and fuses under back cover. It is essential that all measuring instruments are regularly calibrated in order for the technical specification listed in this manual to be guaranteed.
  • Page 94 MI 3340 - AlphaEE XA Maintenance Battery pack disconnection procedure Unscrew and remove the battery / fuse compartment cover.  Remove the battery pack from battery compartment   Press to unlock the connector and pull the wires to disconnect the battery pack from the instrument.
  • Page 95 MI 3340 - AlphaEE XA Maintenance For repairs under or out of warranty please contact your distributor for further information. Unauthorized person is not allowed to open the instrument. There are no user replaceable parts inside the instrument. Use a soft, slightly moistened cloth with soap water or alcohol to clean the surface of the instrument.
  • Page 96 MI 3340 - AlphaEE XA Communications 9 Communications The instrument can communicate with the Metrel ES Manager PC software. There are two communication interfaces available on the instrument: USB and Bluetooth. Instrument can also communicate to various external devices (Android devices, scanners, printers, The instrument automatically selects the communication mode according to detected interface.
  • Page 97 MI 3340 - AlphaEE XA Technical specifications 10 Technical specifications 10.1 Continuity Range Resolution Accuracy ±(2 % of reading + 2 D) 0.00 Ω Ω 0.01 Ω ±3 % of reading 20.0 Ω Ω 0.1 Ω 100.0 Ω Ω 0.1 Ω ±5 % of reading 200 Ω...
  • Page 98 MI 3340 - AlphaEE XA Technical specifications Output voltage Range Resolution Accuracy ±(3 % of reading + 2 D) Operating range (acc. to EN 61557-2) ......0.08 MΩ Ω at Un: 50 V, 100 V Operating range (acc. to EN 61557-2) ......0.08 MΩ Ω...
  • Page 99 MI 3340 - AlphaEE XA Technical specifications Operating range (acc. to EN 61557-16) ...... 0.01 mA Influence of load current .......... ≤ 0.03 mA/A Differential leakage current (with A 1830) Range Resolution Accuracy 0.10 9 mA 0.01 mA ±(5 % of reading + 20 D) Idiff 2.00 99 mA...
  • Page 100 MI 3340 - AlphaEE XA Technical specifications Operating range (acc. to EN 61557-16) ...... 0.010 mA 10.8 Point to point leakage current Range Resolution Accuracy 1 µA ±(3 % of reading + 3 D) Ileak 0.01 mA ±5 % of reading Operating range (acc.
  • Page 101 MI 3340 - AlphaEE XA Technical specifications 10.10 Touch leakage current Range Resolution Accuracy Itou 0.000 mA 1.999 mA 1 µA (3 % of reading + 3 D) 2.00 mA 19.99 mA 0.01 mA (5 % of reading) Operating range (acc. to EN 61557-16) ..... 0.010 mA 19.99 mA Range Resolution...
  • Page 102 MI 3340 - AlphaEE XA Technical specifications Power (reactive) Range Resolution Accuracy ± 0.01 var ±(5 % of reading + 10 D) ± var) 0.1 var ± 1 var ±5 % of reading ± 10 var Power factor Range Resolution Accuracy 0.01 ±(5 % of reading + 5 D)
  • Page 103 MI 3340 - AlphaEE XA Technical specifications 10.12 Touch leakage current Range Resolution Accuracy 1 µA ±(3 % of reading + 3 D) Itou 19.99 mA 0.01 mA ±5 % of reading Operating range (acc. to EN 61557-16) ...... 0.010 mA Differential leakage current Range Resolution...
  • Page 104 MI 3340 - AlphaEE XA Technical specifications Power factor Range Resolution Accuracy 0.01 ±(5 % of reading + 5 D) Total Harmonic Distortion (voltage) Range Resolution Accuracy THDU 0.1 % ±(5 % of reading + 5 D) Total Harmonic Distortion (current) Range Resolution Accuracy...
  • Page 105 MI 3340 - AlphaEE XA Technical specifications 10.14 Trip-out time Range Resolution Accuracy (999 ms*) 1 ms  3 ms tΔN (½I  1 ms  3 ms (40 ms*) (I  I 1 ms  3 ms  *According to standard AS/NZS 3017 Trip-out current Range Resolution...
  • Page 106 MI 3340 - AlphaEE XA Technical specifications 10.16 PE conductor (Type = 2 pole, 3 pole, S(3 pole), S+) Range Resolution Accuracy 0.00  19.99  0.01  (2 % of reading + 2 D) Current source ..........> 0.2 A d.c. at R < 2 Ω 19.99 ...
  • Page 107 MI 3340 - AlphaEE XA Technical specifications Trip-out current Result Test current Range Resolution Accuracy 0.1 I a.c. 0.2 I 1.1 I 0.05 I      pulse d.c. (A) 0.1 I 0.2 I 1.5 I 0.05 I ...
  • Page 108 MI 3340 - AlphaEE XA Technical specifications Input resistance ............input P/S 200 kΩ to earth, input PE 200 kΩ to earth Nominal frequency range ......... 0 Hz (DC), 15 Hz ... 500 Hz Bandwidth ..............1 kHz 10.22 This test is performed in combination with an external test adapter / instrument. For technical specification refer to A 1632 eMobility Analyser Instruction manual.
  • Page 109 MI 3340 - AlphaEE XA Technical specifications 10.25 Mains supply Supply voltage, frequency ....115 V* / 230 V a.c., 50 Hz / 60 Hz Supply voltage tolerance ...... ±10 % Max. power consumption ..... 30 VA (without load on test socket) ....
  • Page 110 MI 3340 - AlphaEE XA Technical specifications Reference conditions Reference temperature range:....15 ° °C Reference humidity range: ....Operation conditions Working temperature range: ....0 ° °C Maximum relative humidity: ....85 % RH (0 ° °C), non-condensing Storage conditions Temperature range: ......
  • Page 111 MI 3340 - AlphaEE XA Appendix A Appendix A Structure objects in AlphaEE XA Symbol Default name Description Node Node Project Project Location Location Client Client Appliance Appliance (basic description) Appliance FD Appliance (full description) Element Universal element...
  • Page 112 Insulation and Sub-leakage tests can be carried out. Note that Sub-leakage test results are calculated to 230 V. For more information about adapters and their limitations, contact Metrel or distributors. Instrument works on 230 V mains. Testing of 110 V equipment is partly supported. With dedicated adapters Continutiy, Insulation and Sub-leakage tests can be carried out.
  • Page 113 The instrument supports different label printers, label size forms, two tag formats (PAT and Generic) and NFC reader devices. Please check with Metrel or distributor which printers, NFC reading devices and labels are supported in your instrument profile. In the tables below, the content printed on the selected label is shown.
  • Page 114 MI 3340 - AlphaEE XA Appendix C Size Label type Field Data 1 label Data 2 label [W  H] Barcode Test code, Appliance ID Appliance ID Text Test code, Appliance ID, Appliance ID, Test and Classic Test and retest date, retest date, Status, User Status, User Test code, Appliance ID,...
  • Page 115 Appendix D Programming of Auto Sequences on Metrel ES Manager The Auto Sequence® editor is a part of the Metrel ES Manager software. In Auto Sequence® editor Auto Sequence® can be pre-programmed and organized in groups, before uploaded to the instrument.
  • Page 116 MI 3340 - AlphaEE XA Appendix D appropriate Single tests (measurements, inspections and custom inspections) and Flow commands and setting their parameters, arbitrary Auto Sequences® can be created. Figure D.2: Example of an Auto Sequence® header Figure D.3: Example of a measurement step Figure D.4: Example of an Auto Sequence®...
  • Page 117 MI 3340 - AlphaEE XA Appendix D Operation options on Group of Auto Sequences® are available from menu bar at the top of Auto Sequence® Editor workspace. File operation options: Opens a file (Group of Auto Sequences®). Creates a new file (Group of Auto Sequences®). Saves / Saves as the opened Group of Auto Sequences®...
  • Page 118 MI 3340 - AlphaEE XA Appendix D Double click on the object name allows it name edit: Auto Sequence® name: Edit Auto Sequence® name DOUBLE CLICK Folder name: Edit folder name Drag and drop of the selected Auto Sequence® or Folder / Subfolder moves it to a new location: DRAG &...
  • Page 119 MI 3340 - AlphaEE XA Appendix D ® D.2.2 Search within selected Auto Sequence group By entering the text into search box and click on the search icon, found results are highlighted with yellow background and first found result (Folder or Auto Sequence ) is ®...
  • Page 120 The Result step contains the Result screen flow command by default. Other Flow commands can also be added to the Result step. D.3.2 Single tests Single tests are the same as in Metrel ES Manager Measurement menu. Limits and parameters of the measurements can be set. Results and sub- D.3.3 Flow commands Flow commands are used to control the flow of measurements.
  • Page 121 MI 3340 - AlphaEE XA Appendix D Copy Paste before A measurement step / flow command can be copied and pasted above selected location on the same or on another Auto Sequence®. Copy Paste after A measurement step / flow command can be copied and pasted under selected location on the same or on another Auto Sequence®.
  • Page 122 MI 3340 - AlphaEE XA Appendix D Parameters State On enables No notifications mode Off disables No notifications mode D.5.4 Appliance info Instrument enables to automatically select the appliance type and add the Appliance ID, Appliance name and Retest period to the Auto Sequence®. Parameters Repeat Setting Repeat:...
  • Page 123 MI 3340 - AlphaEE XA Appendix D automatically applied at the end of test. In between, the automatic procedure can be stopped and statuses can be applied manually. Inspection Expert mode is disabled by default. Parameters State On enables automatic settings of tickers in Visual and Functional tests. Off disables automatic settings of tickers in Visual and Functional tests.
  • Page 124 MI 3340 - AlphaEE XA Appendix D Note • This flow command is active only if Auto Sequence® is started from the Auto Sequence® Main menu (not from the Memory organizer). Arbitrary set of tasks dedicated to specific user defined Inspections can be programmed with application of Custom Inspection Editor Tool, accessible from Auto Sequence®...
  • Page 125 MI 3340 - AlphaEE XA Appendix D Opens existing Custom Inspection Data file. By selecting, menu for browsing to location of *.indf file containing one or more Custom Inspections data appear on the screen. Selected file is opened in dedicated tab marked with file name. Creates a new Custom Inspection Data file.
  • Page 126 MI 3340 - AlphaEE XA Appendix D Edit Item task structure of Inspection Item tasks of the selected Inspection are listed in Name column on the right side of Editor workspace. Each Item task can have Child Item tasks, Child Item can have its own Child Item tasks and so on.
  • Page 127 Custom inspections can be applied in Auto Sequences®. Direct assignment of Custom inspection to the Metrel ES manager structure objects is not possible. After custom created Inspection Data file is opened, available inspections are listed in Custom Inspections tab of Single test area of Auto Sequence®...
  • Page 128 For more information contact Metrel or distributor. SDK is a powerful interface for data communication with Metrel test instruments. The SDK itself is a set of subroutine definitions, protocols, and tools for building application software.
  • Page 129 MI 3340 - AlphaEE XA Appendix F Appendix F Testing in IT and CT supply systems When testing appliances in IT or CT supply system, some test functions in the instrument are omitted due to safety reasons. Following is a list of applicable test functions. Supply system Test function Continuity...
  • Page 130 Works with the instrument is restricted according to description below. Auto equences® Auto Sequence®can be used: • Metrel ES Manager, in Auto Sequence® editor. In general, changing of measuring parameters and limits on included single tests are not possible. Exceptions are: Measurement...
  • Page 131 MI 3340 - AlphaEE XA Contacts METREL d.o.o. Ljubljanska cesta 77 SI-1354 Horjul Slovenia Phone: +386 (0)1 75 58 200 Fax: +386 (0)1 75 49 226 Email: info@metrel.si...