METREL CE MultiTesterXS Instruction Manual
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METREL CE MultiTesterXS Instruction Manual

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CE MultiTesterXS
MI 3394 XS
Instruction manual
Ver. 1.3.4, Code no.20 753 061

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  • Page 1 CE MultiTesterXS MI 3394 XS Instruction manual Ver. 1.3.4, Code no.20 753 061...
  • Page 2 Mark on your equipment certifies that it meets requirements of all subjected EU regulations Hereby, Metrel d.d. declares that the MI 3394 XS is in compliance with Directive 2014/53/EU (RED) and all other subjected EU directives. The full text of the EU declaration of conformity is available at the following internet address https://www.metrel.si/DoC.
  • Page 3  Please note that LCD screenshots in this document may differ from the actual instrument screens in details due to firmware variations and modifications.  Metrel reserve the right to make technical modifications without notice as part of the further development of the product.

  • Page 4: Table Of Contents

    MI 3394 XS CE MultiTesterXS Table of contents ABLE OF ONTENTS General description ....................... 7 Warnings and notes ....................7 1.1.1 Safety warnings ....................7 1.1.2 Warnings related to safety of measurement functions ......... 8 1.1.2.1 HV AC, HV DC, HV AC programmable, HV DC programmable ....... 8 Diff.
  • Page 5 MI 3394 XS CE MultiTesterXS Table of contents 5.8.2.7 Exporting a Workspace ................. 39 ® Auto Sequence groups .................... 40 ® 5.9.1 Auto Sequence groups menu ................40 ® 5.9.1.1 Operations in Auto Sequence groups menu ..........40 ® 5.9.1.2 Selecting a group of Auto Sequences ............
  • Page 6 MI 3394 XS CE MultiTesterXS Table of contents 7.2.7 Insulation resistance (Riso, Riso-S) ..............92 7.2.8 Sub-leakage (Isub, Isub-S) ................94 7.2.9 Differential Leakage ................... 96 7.2.10 Ipe Leakage ....................... 98 7.2.11 Touch Leakage ....................100 7.2.12 Power ......................101 7.2.13...
  • Page 7 11.11 Discharging time ..................... 134 11.12 General data ......................134 Appendix A - Structure objects in CE MultiTesterXS ............137 Appendix B - Profile Notes ....................138 Appendix C - Print labels and write / read RFID / NFC tags ..........139 PAT tag format ......................

  • Page 8: General Description

    1.1.1 Safety warnings In order to reach high level of operator safety while carrying out various measurements using the CE MultiTesterXS instrument, as well as to keep the test equipment undamaged, it is necessary to consider the following general warnings: ...

  • Page 9: Warnings Related To Safety Of Measurement Functions

    MI 3394 XS CE MultiTesterXS General description 1.1.2 Warnings related to safety of measurement functions 1.1.2.1 HV AC, HV DC, HV AC programmable, HV DC programmable  A dangerous voltage up to 5.1 kV or 6 kV is applied to the HV instrument outputs during the test.

  • Page 10: Standards Applied

    General description This equipment shall be recycled as electronic waste.  1.2 Standards applied The CE MultiTesterXS instrument is manufactured and tested according to the following regulations, listed below. Electromagnetic compatibility (EMC) EN 61326-1 Electrical equipment for measurement, control and laboratory use - EMC requirements –...

  • Page 11: Instrument Set And Accessories

    MI 3394 XS CE MultiTesterXS Instrument set and accessories 2 Instrument set and accessories MI 3394 XS CE MultitesterXS in intended to be integrated into various measuring systems and should not be used independently. 2.1 Standard set of the instrument ...

  • Page 12: Instrument Description

    MI 3394 XS CE MultiTesterXS Instrument description 3 Instrument description 3.1 Front panel Figure 3.1: Front panel Mains supply connector F1, F2 fuses (F 5 A / 250 V) F3, F4 fuses (T 16 A / 250 V) On / Off switch...
  • Page 13 The instrument contains dedicated connectors intended to be connected only to dedicated accessories provided or approved by Metrel.  When CE MultiTesterXS is applied without connected Safety system, function of Safety system shall be simulated with connected Test circuits OFF (mains test voltage (L,N)) shorting connector and I (HV) (control signal) shorting connector in order to provide normal operation.

  • Page 14: Instrument Installation

    MI 3394 XS CE MultiTesterXS Instrument installation 4 Instrument installation The following procedure describes the installation of the MI 3394 XS to a 19” rack. Step 1: Disassembling of the cover of a MI 3394 XS case Figure 4.1: MI 3394 XS cover removal Step 2: 19”...

  • Page 15: Instrument Operation

    MI 3394 XS CE MultiTesterXS Instrument operation 5 Instrument operation The CE MultiTesterXS can be manipulated via a keypad or touch screen. 5.1 General meaning of keys Cursor keys are used to: select appropriate option Enter key is used to:...

  • Page 16: Safety Checks

    MI 3394 XS CE MultiTesterXS Instrument operation 5.3 Safety checks At start up and during operation the instrument performs various safety checks to ensure safety and to prevent any damage. These safety pre-tests are checking for:  Correct input mains voltage ...
  • Page 17 MI 3394 XS CE MultiTesterXS Instrument operation Resistance L-N < 30 Ω In pre-test a low input resistance of the device under test was measured. This can result in a high current after applying power to the device. If the high current is only of short duration (caused by a short inrush current) the test can be performed, otherwise not.
  • Page 18 MI 3394 XS CE MultiTesterXS Instrument operation The load current exceeded the highest upper limit of 10 A for the Discharging time test. Measurement was aborted. Press OK to continue. The load current continuously exceeded 10 A for more than 4 min (moving average) in Power and Leakage tests.
  • Page 19 MI 3394 XS CE MultiTesterXS Instrument operation Test passed. Test failed. Conditions on the input terminals allow starting the measurement; consider other displayed warnings and messages. Conditions on the input terminals do not allow starting the measurement, consider displayed warnings and messages.

  • Page 20: Instrument Main Menu

    MI 3394 XS CE MultiTesterXS Instrument operation 5.5 Instrument main menu From the instrument Main Menu different main operation menus can be selected. Figure 5.1: Main menu Options Single Tests Menu with single tests, see chapter 7 Single tests. ®...

  • Page 21: General Settings

    MI 3394 XS CE MultiTesterXS Instrument operation 5.6 General settings In the General Settings menu general parameters and settings of the instrument can be viewed or set. Figure 5.2: Setup menu Options in General Settings menu Language Instrument language selection Date / Time Instruments Date and time.

  • Page 22: Language

    MI 3394 XS CE MultiTesterXS Instrument operation Change password Changing password for enabling HV tests. Initial Settings Factory settings. About Instrument info. 5.6.1 Language In this menu the language of the instrument can be set. Figure 5.3: Select language menu 5.6.2 Date and time...

  • Page 23: Auto Sequence ® Groups

    MI 3394 XS CE MultiTesterXS Instrument operation ® 5.6.5 Auto Sequence groups ® Refer to Chapter 5.9 Auto Sequence groups for more information. 5.6.6 User accounts In this menu user accounts can be managed: ▪ Setting if signing in to work with the instrument is required or not.

  • Page 24: Changing User Password, Signing Out

    MI 3394 XS CE MultiTesterXS Instrument operation Enter the User password through the on-screen numerical keyboard and confirm User profile screen is opened as presented on Figure 5.6. Administrator signing in: Enters Account manager password entry screen. Enter the Administrator password through on-...

  • Page 25: Managing Accounts

    MI 3394 XS CE MultiTesterXS Instrument operation Change User password. Numerical user password entry keyboard appear on the screen. First step: enter current user password and confirm entry. Wrong entry is reported by message. Confirm message, clear wrong password and repeat first step.
  • Page 26 MI 3394 XS CE MultiTesterXS Instrument operation Options User sign in is not required. User sign in is required. Presented setting requires sign in, when instrument is switched on. Sign in could also be set to be required on every restart of instrument.

  • Page 27: Edit User Accounts

    MI 3394 XS CE MultiTesterXS Instrument operation 5.6.6.4 Edit user accounts Administrator can add new user and set his password, change user existing password, delete user account and delete all user accounts. Edit accounts screen is accessed by selecting Edit account icon from Account manager options screen, see Chapter 5.6.6.3 Managing accounts.
  • Page 28 MI 3394 XS CE MultiTesterXS Instrument operation Warning message selection options: • YES: confirmation of deletion, all user accounts will be deleted • NO: interrupts procedure and return to Edit accounts menu User selected (user is highlighted Options Set password For selected user, password is set, numerical keyboard appears on the screen.

  • Page 29: Setting Blackbox Password

    MI 3394 XS CE MultiTesterXS Instrument operation 5.6.6.5 Setting Blackbox password Blackbox password can be set by administrator from the Account manager menu. Set Blackbox password is valid for all users. Default Blackbox password is empty (disabled). Options Add or edit Blackbox password. Enter to modify.

  • Page 30: Settings

    MI 3394 XS CE MultiTesterXS Instrument operation 5.6.8 Settings In this menu different general parameters can be set. Figure 5.10: Settings menu Setting options: Option Description ON – touch screen is active. Touch screen OFF – touch screen is deactivated.
  • Page 31 MI 3394 XS CE MultiTesterXS Instrument operation correct value. Default gateway XXX.XXX.XXX.XXX In manual mode, depending on the network topology, the user can enter the correct value or leave it as it is, if not needed. Preferred DNS XXX.XXX.XXX.XXX In manual mode, depending on the network...

  • Page 32: Devices

    MI 3394 XS CE MultiTesterXS Instrument operation 5.6.9 Devices In this menu, operation with external devices is configured. Figure 5.11: Device settings menu Writing devices Type Sets appropriate writing device (Serial printer, Bluetooth printer, RFID writer). Port Sets/views communication port of selected writing device.

  • Page 33: Initial Settings

    MI 3394 XS CE MultiTesterXS Instrument operation 5.6.10 Initial Settings In this menu internal Bluetooth module can be initialized and the instrument settings, measurement parameters and limits can be set to initial (factory) values. Figure 5.12: Initial settings menu Warning! Following customized settings will be lost when setting the instruments to initial settings: ...

  • Page 34: Instrument Profiles

    5.8.1 Workspaces and Exports The works with CE MultiTesterXS MI 3394 XS can be organized with help of Workspaces and Exports. Exports and Workspaces contain all relevant data (measurements, parameters, limits, structure objects) of an individual work.

  • Page 35: Workspace Manager Main Menu

    MI 3394 XS CE MultiTesterXS Instrument operation Figure 5.15: Organization of Workspaces and Exports on microSD card Workspaces are stored on microSD card on directory WORKSPACES, while Exports are stored on directory EXPORTS. Exports are suitable for making backups of important works or can be used for storage of works if the removable microSD card is used as a mass storage device.

  • Page 36: Operations With Workspaces

    MI 3394 XS CE MultiTesterXS Instrument operation 5.8.2.1 Operations with Workspaces Only one Workspace can be opened in the instrument at the same time. The Workspace selected in the Workspace Manager will be opened in the Memory Organizer. Figure 5.17: Workspaces menu Options Marks the opened Workspace in Memory Organizer.

  • Page 37: Adding A New Workspace

    MI 3394 XS CE MultiTesterXS Instrument operation Options Deletes the selected Export. Refer to chapter 5.8.2.5 Deleting a Workspace / Export for more information. Imports a new Workspace from Export. Refer to chapter 5.8.2.6 Importing a Workspace for more information.

  • Page 38: Opening A Workspace

    MI 3394 XS CE MultiTesterXS Instrument operation 5.8.2.4 Opening a Workspace  Workspace can be selected from a list in Workspace manager screen.  Opens Workspace Workspace manager. The opened Workspace is marked with a blue dot. previously opened Workspace will close automatically.

  • Page 39: Importing A Workspace

    MI 3394 XS CE MultiTesterXS Instrument operation  Workspace / Export is deleted from the Workspace / Export list. 5.8.2.6 Importing a Workspace  Select an Export file to be imported from Workspace manager Export list.  Enters option Import.

  • Page 40: Exporting A Workspace

    MI 3394 XS CE MultiTesterXS Instrument operation 5.8.2.7 Exporting a Workspace  Select a Workspace from Workspace manager list to be exported to an Export file.  Enters option for Export. Before exporting selected Workspace the user asked for confirmation.

  • Page 41: Auto Sequence ® Groups

    ® ® The Auto Sequences in CE MultiTesterXS MI 3394 XS are organized in Auto Sequence groups stored in folders on the microSD memory card. Folders are located in Root\__MOS__\AT on the microSD card. ® Figure 5.19: Organization of Auto Sequence groups on microSD card ®...

  • Page 42: Selecting A Group Of Auto Sequences

    MI 3394 XS CE MultiTesterXS Instrument operation ® Deletes the selected list of Auto Sequences ® Refer to chapter 5.9.1.3 Deleting a group of Auto Sequences for more information. ® 5.9.1.2 Selecting a group of Auto Sequences  ® A group of Auto Sequences...
  • Page 43 MI 3394 XS CE MultiTesterXS Instrument operation  ® A group of Auto Sequences is deleted. Note: ® Selected Auto Sequences group (marked with blue dot) cannot be deleted, warning message appear on the screen.

  • Page 44: Memory Organizer

    MI 3394 XS CE MultiTesterXS Memory Organizer 6 Memory Organizer Memory Organizer is a tool for storing and working with test data. 6.1 Memory Organizer menu The data is organized in a tree structure with Structure objects and Measurements. CE MultiTesterXS has a fixed three level structure.

  • Page 45: Measurement Statuses

    MI 3394 XS CE MultiTesterXS Memory Organizer Figure 6.2: Example of a Tree menu 6.1.1 Measurement statuses Each measurement has:  a status (Pass or Fail or no status)  a name  results  limits and parameters ® A measurement can be a Single test or an Auto Sequence test.

  • Page 46: Structure Objects

    Structure object  a comment or a file attached Structure objects supported in CE MultiTesterXS are described in Appendix A - Structure objects in CE MultiTesterX. Figure 6.3: Structure object in tree menu 6.1.2.1 Measurement status indication under the Structure object...

  • Page 47: Selecting An Active Workspace In Memory Organizer

    MI 3394 XS CE MultiTesterXS Memory Organizer measurements under selected structure object are completed but one or more measurement result(s) has failed. Figure 6.6: Status - Measurements completed with fail result(s) Note:  There is no status indication if all measurement results under each structure element / sub-element have passed or if there is an empty structure element / sub-element (without measurements).

  • Page 48: Adding Nodes In Memory Organizer

    MI 3394 XS CE MultiTesterXS Memory Organizer New Workspace is selected and displayed  on the screen. 6.1.4 Adding Nodes in Memory Organizer Structural Elements (Nodes) are used to ease organization of data in the Memory Organizer. One Node is a must; others are optional and can be created or deleted freely.

  • Page 49: Operations In Tree Menu

    MI 3394 XS CE MultiTesterXS Memory Organizer 6.1.5 Operations in Tree menu In the Memory organizer different actions can be taken with help of the control panel at the right side of the display. Possible actions depend on the selected element in the organizer.

  • Page 50: Operations On Structure Objects

    MI 3394 XS CE MultiTesterXS Memory Organizer Views and edit comments. The instrument displays comment attached to the selected measurement or opens keypad for entering a new comment. Deletes a measurement. Selected Measurement can be deleted. User is asked for confirmation before the deleting.
  • Page 51 MI 3394 XS CE MultiTesterXS Memory Organizer Attachments. Name and link of attachment is displayed. Clones a Structure object. Selected Structure object can be copied to same level in structure tree (clone). Refer to chapter 6.1.5.6 Clone a Structure object for more information.

  • Page 52: View / Edit Parameters And Attachments Of A Structure Object

    MI 3394 XS CE MultiTesterXS Memory Organizer 6.1.5.3 View / Edit parameters and attachments of a Structure object The parameters and their content are displayed in this menu. To edit the selected parameter tap on it or press Enter key to enter menu for editing parameters.

  • Page 53: Add A New Structure Object

    MI 3394 XS CE MultiTesterXS Memory Organizer 6.1.5.4 Add a new Structure Object This menu is intended to add new structure objects in the tree menu. A new structure object can be selected and then added in the tree menu.

  • Page 54: Add A New Measurement

    MI 3394 XS CE MultiTesterXS Memory Organizer 6.1.5.5 Add a new measurement In this menu new empty measurements can be set and then added in the structure tree. The type of measurement, measurement function and its parameters are first selected and then added under the selected Structure object.

  • Page 55: Clone A Structure Object

    MI 3394 XS CE MultiTesterXS Memory Organizer 6.1.5.6 Clone a Structure object In this menu selected structure object can be copied (cloned) to same level in the structure tree. Cloned structure object have same name as original. Clone Figure 6.12: Clone Structure Object menu Procedure and options ...

  • Page 56: Clone A Measurement

    MI 3394 XS CE MultiTesterXS Memory Organizer  The new structure object is displayed. 6.1.5.7 Clone a measurement By using this function a selected empty or finished measurement can be copied (cloned) as an empty measurement to the same level in the structure tree.
  • Page 57 MI 3394 XS CE MultiTesterXS Memory Organizer  Select Copy option from control panel. Copy  Select location where structure element should be copied.  Select Paste option from control panel. Paste  The Paste structure object menu is displayed.

  • Page 58: Cloning And Pasting Sub-Elements Of Selected Structure Object

    MI 3394 XS CE MultiTesterXS Memory Organizer 6.1.5.9 Cloning and Pasting sub-elements of selected structure object When structure object is selected to be cloned, or copied & pasted, additional selection of its sub-elements is needed. The following options are available:...

  • Page 59: Cut & Paste A Structure Object With Sub-Items

    MI 3394 XS CE MultiTesterXS Memory Organizer  The new (empty) measurement is displayed in selected Structure object. 6.1.5.11 Cut & Paste a Structure object with sub-items In this menu selected Structure object with sub-items (sub-structures and measurements) can be cut and pasted (moved) to any allowed location in the structure tree.

  • Page 60: Delete A Structure Object

    MI 3394 XS CE MultiTesterXS Memory Organizer 6.1.5.12 Delete a Structure object In this menu selected Structure object can be deleted. Procedure  Select the structure object to be deleted.  Select Delete option from control panel. Delete  A confirmation window will appear.

  • Page 61: Rename A Structure Object

    MI 3394 XS CE MultiTesterXS Memory Organizer  Select Delete option from control panel. Delete  A confirmation window will appear.  Selected measurement is deleted.  Returns to the tree menu without changes. 6.1.5.14 Rename a Structure object In this menu selected Structure object can be renamed.

  • Page 62: Recall And Retest Selected Measurement

    MI 3394 XS CE MultiTesterXS Memory Organizer 6.1.5.15 Recall and Retest selected measurement Procedure  Select the measurement to be recalled.  Select Recall results in Control panel.  Measurement is recalled. Parameters and limits can be viewed but cannot be edited.

  • Page 63: Searching In Memory Organizer

    MI 3394 XS CE MultiTesterXS Memory Organizer  Select Run in Control panel to retest the measurement.  Results / sub-results after re-run of recalled measurement.  Select Save results in Control panel. Retested measurement is saved under same structure object as original one.
  • Page 64 MI 3394 XS CE MultiTesterXS Memory Organizer  The parameters that can be searched for are displayed in the Search setup menu. Note: Equipment ID, Test date, Retest date  refer only to the following structure objects: Appliance, Appliance FD, Machine and Switchgear.
  • Page 65 MI 3394 XS CE MultiTesterXS Memory Organizer Figure 6.13: Search results screen – Page view Options Next page. Previous page. Note: Search result page consist of up to 50 results. Figure 6.14: Search results screen with structure object selected Options Goes to selected location in Memory Organizer.
  • Page 66 MI 3394 XS CE MultiTesterXS Memory Organizer Renames the selected Structure object. Refer to Chapter 6.1.5.14 Rename a Structure object for more information. Views comment. The instrument displays comment attached to the selected Structure object.

  • Page 67: Single Tests

    MI 3394 XS CE MultiTesterXS Single tests 7 Single tests 7.1 Selection of single tests Single tests can be selected in the Main single test menu or in Memory Organizer’s main and submenus. In Single test main menu there are four modes for selecting single tests.
  • Page 68 MI 3394 XS CE MultiTesterXS Single tests For the selected group a submenu with all single tests that belongs to the selected group is displayed. Cross selector This selection mode is the fastest way for working with the keypad. Groups of single tests are organized in a row.

  • Page 69: Single Test Screens

    MI 3394 XS CE MultiTesterXS Single tests 7.1.1 Single test screens In the Single test screens measuring results, sub-results, limits and parameters of the measurement are displayed. In addition on-line statuses, warnings and other information are displayed. Name of function...

  • Page 70: Setting Parameters And Limits Of Single Tests

    MI 3394 XS CE MultiTesterXS Single tests 7.1.1.2 Setting parameters and limits of single tests Figure 7.3: Screens in menu for setting Single test parameters and limits Options Selects parameter (white) or limit (red). Selects value of parameter or limit.

  • Page 71: Single Test Screen During Test

    MI 3394 XS CE MultiTesterXS Single tests 7.1.1.3 Single test screen during test Figure 7.4: Single test screen (during measurement) Options (during test) Stops the single test measurement. Proceeds to the next step of the measurement (if measurement consists of more steps).

  • Page 72: Single Test Result Screen

    MI 3394 XS CE MultiTesterXS Single tests 7.1.1.4 Single test result screen Figure 7.5: Single test result screen Options (after measurement is finished) Starts a new measurement. Saves the result. A new measurement was selected and started from a Structure object in...

  • Page 73: Single Test Memory Screen

    MI 3394 XS CE MultiTesterXS Single tests limits of single tests for more information. 7.1.1.5 Single test memory screen Figure 7.6: Single test memory screen Options Retest Enters screen with “empty” measurement. Opens menu for viewing parameters and limits. Refer to chapter 7.1.1.2 Setting parameters and...

  • Page 74: Single Test (Inspection) Screens

    MI 3394 XS CE MultiTesterXS Single tests 7.1.2 Single test (inspection) screens Visual and Functional inspections can be treated as a special class of tests. Items to be visually or functionally checked are displayed. In addition on-line statuses and other information are displayed.

  • Page 75: Single Test (Inspection) Screen During Test

    MI 3394 XS CE MultiTesterXS Single tests 7.1.2.2 Single test (Inspection) screen during test Figure 7.9: Inspection screen (during inspection) Options (during test) Selects item Applies a pass status to the selected item or group of items. Applies a fail status to the selected item or group of items.

  • Page 76: Single Test (Inspection) Result Screen

    MI 3394 XS CE MultiTesterXS Single tests Rules for automatic applying of statuses:  The parent item(s) can automatically get a status on base of statuses in child items. the fail status has highest priority. A fail status for any item will result in a fail status in all parent items and an overall fail result.

  • Page 77: Single Test (Inspection) Memory Screen

    MI 3394 XS CE MultiTesterXS Single tests and then restarted: A new measurement will be saved under the selected Structure object. Opens Help screen, see chapter 7.1.3 Help screens for more information. 7.1.2.4 Single test (inspection) memory screen Figure 7.11: Inspection memory screen...

  • Page 78: Help Screens

    MI 3394 XS CE MultiTesterXS Single tests 7.1.3 Help screens Help screens contain diagrams for proper connection of the instrument. Figure 7.12: Examples of help screens Options Goes to previous / next help screen.

  • Page 79: Single Test Measurements

    MI 3394 XS CE MultiTesterXS Single tests 7.2 Single test measurements 7.2.1 Visual inspections Figure 7.13: Visual inspection menu Test circuit Figure 7.14: Visual inspection test circuit Visual inspection procedure  Select the appropriate Visual inspection.  Start the inspection.

  • Page 80: Continuity

    MI 3394 XS CE MultiTesterXS Single tests 7.2.2 Continuity Figure 7.16: Continuity test menu Test results / sub-results R....Resistance ΔU………..Voltage drop scaled to 10 A Test parameters Output connections Output [4-wire, P-PE] Test current I out [0.2 A, 4 A, 10 A, 25 A] Duration Duration [Off, 2 s ...
  • Page 81 MI 3394 XS CE MultiTesterXS Single tests Test circuit Figure 7.17: Measurement of continuity 4-wire Figure 7.18: Measurement of Continuity P/S - PE Continuity measurement procedure  Select the Continuity function.  Set test parameters / limits.  Connect test leads to C1, P1, P2 and C2 terminals on the instrument (4 wire), or connect test lead to P/S terminal (2 wire measurement P/S –...

  • Page 82: Compensation Of Test Leads Resistance

    MI 3394 XS CE MultiTesterXS Single tests Figure 7.19: Examples of Continuity measurement results 7.2.2.1 Compensation of test leads resistance This chapter describes how to compensate the test leads resistance in Continuity (Output = P/S – PE) function. Compensation shall be carried out to eliminate the influence of test leads resistance and the internal resistances of the instrument on the measured resistance.

  • Page 83: Limit Calculator

    MI 3394 XS CE MultiTesterXS Single tests Figure 7.21: Uncompensated and compensated result Notes:  The compensation of test leads is carried out with set test current (I out).  If “Calibrate” compensation is not possible (use of measuring adapters), manually set “R compensation”...
  • Page 84 MI 3394 XS CE MultiTesterXS Single tests B: Calculator Continuity resistance limit is calculated by the formula: �� �� = �� + 0.1Ω �� Where: −8 ρ ....specific resistance of copper 1,68×10 Ωm L ....wire length selected from a list (1 m, 2 m, 3 m, … ,100 m) or Custom numeric entry A ....
  • Page 85 MI 3394 XS CE MultiTesterXS Single tests  Select parameters value for chosen Limit rule by using on-screen or keyboard arrow keys. By tapping on parameter field, value can be selected from presented list. Calculator rule allow custom value Length and Cross section entry with on-screen keyboard, when Custom is selected from the value list.

  • Page 86: Hv Ac

    MI 3394 XS CE MultiTesterXS Single tests 7.2.3 HV AC IMPORTANT SAFETY NOTE Refer to chapter 1.1 Warnings and notes for more information regarding safe use of the instrument. Figure 7.23: HV AC test menu Test results / sub-results I ....test current U....

  • Page 87: Hv Dc

    MI 3394 XS CE MultiTesterXS Single tests HV AC measurement procedure  Select the HV AC function.  Set test parameters / limits.  Connect HV test leads to HV(~,+) and HV(~,-) terminals on the instrument.  Connect HV test leads to device under test.
  • Page 88 MI 3394 XS CE MultiTesterXS Single tests Test parameters DC test voltage U test [500 V ... 6000 V in steps of 50 V] Duration t end [Off, 1 s ... 120 s] Test limits High limit (I) H limit [Custom, 0.05 mA ... 10.0 mA] Low limit (I) L limit [Off, Custom, 0.05 mA ...

  • Page 89: Hv Ac Programmable

    MI 3394 XS CE MultiTesterXS Single tests 7.2.5 HV AC programmable IMPORTANT SAFETY NOTE Refer to chapter 1.1 Warnings and notes for more information regarding safe use of the instrument. In the HV AC programmable test the time dependency of high voltage can be set according to diagram on Figure 7.29.
  • Page 90 MI 3394 XS CE MultiTesterXS Single tests Test circuit Figure 7.31: HV AC programmable test HV AC programmable test procedure  Select the HV AC programmable function.  Set test parameters / limits.  Connect HV test leads to HV(~,+) and HV(~,-) terminals on the instrument.

  • Page 91: Hv Dc Programmable

    MI 3394 XS CE MultiTesterXS Single tests 7.2.6 HV DC programmable IMPORTANT SAFETY NOTE Refer to chapter 1.1 Warnings and notes for more information regarding safe use of the instrument. In the HV DC programmable test the time dependency of high voltage can be set according to diagram on Figure 7.29.
  • Page 92 MI 3394 XS CE MultiTesterXS Single tests Test circuit Figure 7.34: HV DC programmable test HV DC programmable test procedure  Select the HV DC programmable function.  Set test parameters / limits.  Connect HV test leads to HV(~,+) and HV(~,-) terminals on the instrument.

  • Page 93: Insulation Resistance (Riso, Riso-S)

    MI 3394 XS CE MultiTesterXS Single tests 7.2.7 Insulation resistance (Riso, Riso-S) Figure 7.36: Insulation resistance test menus Test results / sub-results Riso ..Insulation resistance Riso-S ..Insulation resistance-S Um .... Test voltage Test parameters Nominal test voltage Uiso [50 V, 100 V, 250 V, 500 V, 1000 V] Duration Duration [Off, 2 s ...
  • Page 94 MI 3394 XS CE MultiTesterXS Single tests Figure 7.38: Measurement of insulation resistance (Socket LN - PE) Figure 7.39: Measurement of Riso, Riso-S (socket) RISO measurement procedure  Select the Riso function.  Set test parameters / limits.  Connect test leads to ISO(+), ISO(-) terminals on the instrument, then connect test leads to device under test, or ...

  • Page 95: Sub-Leakage (Isub, Isub-S)

    MI 3394 XS CE MultiTesterXS Single tests Figure 7.40: Examples of Insulation resistance measurement results Note: When P/S probe is connected during the Riso measurement, then the current through it  is also considered. 7.2.8 Sub-leakage (Isub, Isub-S) Figure 7.41: Sub Leakage test menus Test results / sub-results Isub ..
  • Page 96 MI 3394 XS CE MultiTesterXS Single tests Test circuits Figure 7.42: Measurement of Sub-leakage (SUB1, SUB2) Figure 7.43: Measurement of Sub-leakage (socket LN-PE) Figure 7.44: Measurement of Sub-leakage, Sub-leakage-S (socket)

  • Page 97: Differential Leakage

    MI 3394 XS CE MultiTesterXS Single tests Sub-leakage measurement procedure  Select the Sub-leakage function.  Set test parameters / limits.  Connect test leads to SUB1,SUB2 terminals on the instrument, then connect test leads to device under test, or ...
  • Page 98 MI 3394 XS CE MultiTesterXS Single tests Delay [0.2 s … 5 s] *Delay time Test limits H Limit (Idiff) H limit [Off, Custom, 0.25 mA ... 15.0 mA ] L Limit (Idiff) L limit [Off, Custom, 0.25 mA ... 15.0 mA ] [Socket L,N –...

  • Page 99: Ipe Leakage

    MI 3394 XS CE MultiTesterXS Single tests Ipe Leakage 7.2.10 Figure 7.49: Ipe Leakage test menu Test results / sub-results Ipe .... PE current P ....Power Test parameters Duration Duration [Off, 2 s ... 180 s] Change status Change [YES, NO] YES: The instrument measures leakage current in two sequential steps with delay* in between.
  • Page 100 MI 3394 XS CE MultiTesterXS Single tests Test circuit Figure 7.50: Measurement of Ipe Leakage current Ipe Leakage measurement procedure  Select the Ipe Leakage function.  Set test parameters / limits.  Connect device under test to mains test socket.

  • Page 101: Touch Leakage

    MI 3394 XS CE MultiTesterXS Single tests Touch Leakage 7.2.11 Figure 7.52: Touch Leakage test menu Test results / sub-results Itou ... Touch Leakage current P ....Power Test parameters Duration Duration [Off, 2 s ... 180 s] Change status...

  • Page 102: Power

    MI 3394 XS CE MultiTesterXS Single tests Touch Leakage measurement procedure  Select the Touch Leakage function.  Set test parameters / limits.  Connect device under test to mains test socket. Connect test lead to P/S terminal on the instrument and on device under test.
  • Page 103 MI 3394 XS CE MultiTesterXS Single tests Test circuit Figure 7.56: Measurement of Power Power measurement procedure  Select the Power function.  Set test parameters / limits.  Connect device under test to mains test socket.  Start measurement.

  • Page 104: Leak's & Power

    MI 3394 XS CE MultiTesterXS Single tests Leak's & Power 7.2.13 Figure 7.58: Leak’s & Power measurement menu Test results / sub-results P ....Active power Itou ... Touch Leakage current Idiff ... Differential Leakage current S ....Apparent power Q ....
  • Page 105 MI 3394 XS CE MultiTesterXS Single tests Test circuit Figure 7.59: Measurement of Leak’s and Power Leak’s & Power measurement procedure Select the Leak’s & Power function.   Set test parameters / limits.  Connect device under test to mains test socket and optionally to P/S terminal.

  • Page 106: Discharging Time

    MI 3394 XS CE MultiTesterXS Single tests Discharging Time 7.2.14 Figure 7.61: Discharging Time test menu Test results / sub-results t ....Discharging time Up ..... Peak voltage of supply during the test Test parameters Limit voltage Limit U [34 V, 60 V, 120 V]...
  • Page 107 MI 3394 XS CE MultiTesterXS Single tests (1) peak voltage (4) Ulim (2) voltage at disconnection time (5) moment of disconnection (3) calculated voltage value (6) discharging time Figure 7.62: Measuring principle (external) Test circuit (Output = External) Figure 7.63: Discharging Time test (Output = External) Discharging Time test procedure (Output = External) ...
  • Page 108 MI 3394 XS CE MultiTesterXS Single tests Figure 7.64: Examples of Discharging Time measurement results (Output = External) Measuring principle (Output = Socket) The measuring principle of the Discharging time function is as following:  Phase The DEVICE UNDER TEST is connected to the mains test socket. The instrument monitors the mains voltage and internally stores the peak voltage value.

  • Page 109: Functional Inspections

    MI 3394 XS CE MultiTesterXS Single tests Figure 7.66: Examples of Discharging Time measurement results (Output = Socket) Functional inspections 7.2.15 Figure 7.67: Functional inspection start menu (left) and menu during inspection (right) Test parameters (optional) For the optional Power measurement test the parameters and limits are the same as set in the Power single test, see chapter 7.2.12 Power.
  • Page 110 MI 3394 XS CE MultiTesterXS Single tests Figure 7.69 Examples of Functional Inspection results...

  • Page 111: Auto Sequences

    ® Auto Sequences can be pre-programmed on PC with the Metrel ES Manager software and uploaded to the instrument. On the instrument parameters and limits of individual single test in ® the Auto Sequence can be changed / set.

  • Page 112: Searching In Auto Sequences Menu

    ® MI 3394 XS CE MultiTesterXS Auto Sequences ® New Auto Sequence group is selected and all ® folders, sub-folders and Auto Sequences within that group are displayed on the screen.  ® 8.1.2 Searching in Auto Sequences menu ®...
  • Page 113 ® MI 3394 XS CE MultiTesterXS Auto Sequences  Searches through active Auto ® Sequence group according to the set filters. The results are shown in the Search results screen presented on Figure 8.1 and Figure 8.2. Figure 8.1: Search results screen Page view Options Next page.

  • Page 114: Structure Organization Of Auto Sequence Group

    ® MI 3394 XS CE MultiTesterXS Auto Sequences ® Goes to Auto Sequence view menu. ® Starts the selected Auto Sequence 8.1.3 Structure organization of Auto Sequence ® group ® The Auto Sequences to be carried out can be selected from the active group in Main Auto ®...

  • Page 115: Organization Of Auto Sequence ® Tests

    ® MI 3394 XS CE MultiTesterXS Auto Sequences 8.2 Organization of Auto Sequence ® tests ® An Auto Sequence test is divided into three phases:  ® Before starting the first test the Auto Sequence view menu is shown (unless it was ®...

  • Page 116: Auto Sequence ® View Menu (Measurement Is Selected)

    ® MI 3394 XS CE MultiTesterXS Auto Sequences ® 8.2.1.2 Auto Sequence view menu (measurement is selected) ® view menu – measurement selected Figure 8.5: Auto Sequence Options Selects single test. Opens menu for changing parameters and limits of selected measurements.

  • Page 117: Auto Sequence ® Configurator Menu

    ® MI 3394 XS CE MultiTesterXS Auto Sequences Sets operation mode for multiple points. For more information see chapter 8.2.1.5 Managing multiple points. ® 8.2.1.3 Auto Sequence Configurator menu Auto Sequence® Configurator menu options are active only when single tests within selected Auto sequence®...

  • Page 118: Indication Of Loops

    ® MI 3394 XS CE MultiTesterXS Auto Sequences 8.2.1.4 Indication of Loops The attached ‘x3’ at the end of single test name indicates that a loop of single tests is programmed. This means that the marked single test will be carried out as many times as the number behind the ‘x’...
  • Page 119 ® MI 3394 XS CE MultiTesterXS Auto Sequences ® – example of a finished measurement with options for Figure 8.8: Auto Sequence proceeding ® Options (during execution of an Auto Sequence Proceeds to next step in the test sequence. Repeats the measurement if multiple points execution is selected.

  • Page 120: Auto Sequence Result Screen

    ® MI 3394 XS CE MultiTesterXS Auto Sequences ® 8.2.3 Auto Sequence result screen ® ® After the Auto Sequence is finished the Auto Sequence result screen is displayed as presented on Figure 8.9. At the left side of the display the single tests and their statuses are ®...
  • Page 121 ® MI 3394 XS CE MultiTesterXS Auto Sequences change its overall status from ‘empty’ to ‘finished’. ® An already carried out Auto Sequence was selected in structure tree, viewed and then restarted:  ® A new Auto Sequence will be saved under the selected Structure object.

  • Page 122: Auto Sequence

    ® MI 3394 XS CE MultiTesterXS Auto Sequences ® 8.2.4 Auto Sequence memory screen ® In Auto Sequence memory screen details of the auto test can be viewed, labels can be printed ® and a new Auto Sequence can be restarted.

  • Page 123: Maintenance

    Replace blown fuses only with the same types defined in this document. 9.3 Service For repairs under or out of warranty please contact your distributor for further information. Unauthorized person is not allowed to open the CE MultiTesterXS instrument. There are no user replaceable parts inside the instrument. 9.4 Cleaning Use a soft, slightly moistened cloth with soap water or alcohol to clean the surface of CE MultiTesterXS MI 3394 XS instrument.

  • Page 124: Communications

    Some Android applications automatically carry out the setup of a Bluetooth connection.  It is preferred to use this option if it exists. This option is supported by Metrel's Android applications. If this option is not supported by the selected Android application then configure a ...

  • Page 125: Bluetooth Communication With Printers And Scanners

    See chapter 5.6.8 Settings for details. Metrel ES Manager is currently not supporting Ethernet communication. Contact Metrel or your distributor regarding options for using the Ethernet communication. 10.5 RS232 communication with other external devices It is possible to communicate with scanners via the RS232-1 serial port and printers via the RS232-2 serial port.

  • Page 126: Inputs

    MI 3394 XS CE MultiTesterXS Communications Legend: 4 pin measuring signal connection (Safety connector) In parallel to terminal N on mains test socket In parallel to terminal L on mains test socket In parallel to terminal PE on mains test socket...

  • Page 127: Outputs

    (L, N Test circuit off, connector 23) and interrupt HV test signal generator, limit test current and interrupt test sequence through control signals (Test circuit off I (HV), connector 25). Only Safety systems provided or approved by Metrel should be connected to Safety system connectors.

  • Page 128: Technical Specifications

    MI 3394 XS CE MultiTesterXS Technical specifications 11 Technical specifications 11.1 HV AC, HV AC programmable Voltage a.c. Range Resolution Accuracy (3 % of reading) 0 V ... 1999 V (3 % of reading) 2.00 kV ... 5.99 kV 10 V Current a.c.

  • Page 129: Continuity

    MI 3394 XS CE MultiTesterXS Technical specifications Test terminals Function Connections HV(~,+) ↔ HV(~,-) Withstanding voltage (HV , HV DC-P 11.3 Continuity Continuity Range Resolution Accuracy 0.00  ... 19.99  0.01  (2 % of reading + 2 D) 20.0 ...

  • Page 130: Insulation Resistance, Insulation Resistance-S

    MI 3394 XS CE MultiTesterXS Technical specifications 11.4 Insulation Resistance, Insulation Resistance-S Insulation resistance (250 V, 500 V, 1000 V) Range Resolution Accuracy (3 % of reading + 2 D) 0.00 M … 19.99 M 0.01 M Riso  10 % of reading 20.0 M...

  • Page 131: Differential Leakage Current

    MI 3394 XS CE MultiTesterXS Technical specifications 11.6 Differential Leakage current Differential leakage current Range Resolution Accuracy (3 % of reading + 5 D) Idiff 0.00 mA ... 19.99 mA 0.01 mA Power (active) Range Resolution Accuracy (5 % of reading + 5 D) 0.00 W…19.99 W...

  • Page 132: Touch Leakage Current

    MI 3394 XS CE MultiTesterXS Technical specifications 11.8 Touch leakage current Touch leakage current Range Resolution Accuracy (3 % of reading + 3 D) 0.010 mA ... 1.999 mA 0.001 mA Itou (3 % of reading) 2.00 mA ... 19.99 mA 0.01 mA...

  • Page 133: Leak's & Power

    MI 3394 XS CE MultiTesterXS Technical specifications Total Harmonic Distortion (voltage) Range Resolution Accuracy (5 % of reading + 5 D) 0.0 % ... 99.9 % 0.1 % THDU Total Harmonic Distortion (current) Range Resolution Accuracy (5 % of reading + 5 D) 0 mA…999 mA...
  • Page 134 MI 3394 XS CE MultiTesterXS Technical specifications Power (reactive) Range Resolution Accuracy 0.00 var …19.99 var (5 % of reading + 10 D) 0.01 var  5 % of reading 20.0 var …199.9 var 0.1 var  5 % of reading 200 var ...

  • Page 135: Discharging Time

    MI 3394 XS CE MultiTesterXS Technical specifications Test terminals: Function Connections Power Mains test socket, TC1 Differential leakage Mains test socket (LN), TC1 Mains test socket ↔ P/S, TC1 Touch leakage 11.11 Discharging time Discharging time Range Resolution Accuracy (5 % of reading + 2 D) 0.0 s ...
  • Page 136 MI 3394 XS CE MultiTesterXS Technical specifications Protection classifications Power supply ........... Class I HV output ............5 kV a.c. / 6 kV d.c., double insulation Pollution degree ..........2 Degree of protection ........IP 50 (closed case) ……………………………………....... IP 40 (open case) ................
  • Page 137 MI 3394 XS CE MultiTesterXS Technical specifications Accuracies apply for 1 year in reference conditions. Temperature coefficient outside these limits is 0.2 % of measured value per C plus 1 digit, otherwise noted. Fuses 2 x T 16 A / 250 V, 32 mm  6.3 mm / 1500 A (protection of mains test socket)

  • Page 138: Appendix A - Structure Objects In Ce Multitesterxs

    MI 3394 XS CE MultiTesterXS Appendix A Appendix A - Structure objects in CE MultiTesterXS Structure elements used in Memory Organizer are instrument’s Profile dependent. Symbol Default name Description Node Node Project Project Location Location Element Universal element Appliance Appliance (basic description)

  • Page 139: Appendix B - Profile Notes

    MI 3394 XS CE MultiTesterXS Appendix B Appendix B - Profile Notes There are no specific profile notes for CE MultiTesterXS MI 3394 XS.

  • Page 140: Appendix C - Print Labels And Write / Read Rfid / Nfc Tags

    – QR code – in addition. The instrument supports RFID / NFC reader / writer device, tag type supported is NTAG216. Please check with Metrel or distributor which printers and labels are supported in your instrument. C.1 PAT tag format It is intended for tagging of individual appliance with Auto Sequence®...
  • Page 141 MI 3394 XS CE MultiTesterXS Appendix C  Status (printing from object: overall status of all tests appended to the object or sub- structure objects; printing from Auto Sequence®: its status)  User name (Printing from Auto Sequence: user who performed test; printing from object:...

  • Page 142: Appendix D - Default List Of Auto Sequences

    MI 3394 XS CE MultiTesterXS Appendix D ® Appendix D - Default list of Auto Sequences Pre-programmed DEMO Auto Sequences® Name Description ® This Auto Sequence is just for demonstration of manipulation 1 EN 60335-1_class I ® of Auto Sequence operation with build-in safety system.

  • Page 143: Appendix E - Programming Of Auto Sequences On Metrel Es Manager

    Appendix E - Programming of Auto Sequences on Metrel ES Manager ® ® The Auto Sequence Editor is a part of the Metrel ES Manager software. In Auto Sequence ® Editor, Auto Sequences can be pre-programmed and organized in groups, before uploaded to the instrument.

  • Page 144: Managing Of Auto Sequence ® Groups

    MI 3394 XS CE MultiTesterXS Appendix E ® An Auto Sequence begins with Name, Description and Image, followed by the first step (Header), one or more measuring steps and ends with the last step (Result). By inserting appropriate Single tests...
  • Page 145 MI 3394 XS CE MultiTesterXS Appendix E ® Operation options on Files and Auto Sequence Group are available from menu bar at the top of ® Auto Sequence editor workspace. File operation options: ® Opens a file (Auto Sequence Group).

  • Page 146: Auto Sequence ® Name, Description And Image Editing

    MI 3394 XS CE MultiTesterXS Appendix E Double click on the object name allows it name edit: ® ® Auto Sequence name: Edit Auto Sequence name DOUBLE CLICK Folder name: Edit folder name ® Drag and drop of the selected Auto Sequence or Folder / Subfolder moves it to a new location: “Drag and drop”...

  • Page 147: Elements Of An Auto Sequence

    Result step. E.3.2 Single tests Single tests are the same as in Metrel ES Manager Measurement menu. Limits and parameters of the measurements can be set. Results and sub-results can’t be set. E.3.3 Flow commands Flow commands are used to control the flow of measurements.

  • Page 148: Number Of Measurement Steps

    MI 3394 XS CE MultiTesterXS Appendix E E.3.4 Number of measurement steps Often the same measurement step has to be performed on multiple points on the device under test. It is possible to set how many times a Measurement step will be repeated. All carried out ®...

  • Page 149: Description Of Flow Commands

    MI 3394 XS CE MultiTesterXS Appendix E E.5 Description of flow commands Double click on inserted Flow Command opens menu window, where text or picture can be entered, external signalling and external commands can be activated and parameters can be set.
  • Page 150 MI 3394 XS CE MultiTesterXS Appendix E Wait input mode Reads input condition on pins IN_2, IN_3, IN_4 and IN_5 on INPUT port. Input must be high to ® proceed with the Auto Sequence Parameters On – enables Wait input mode; set active INPUT from Input pins menu State Off –...
  • Page 151 On – enables External TEST / OK key mode (INPUT pin 5 is active) State Off – disables External TEST / OK key mode No notifications mode Instrument skips pre-test warnings (see CE MultiTesterXS User Manual, chapter 5.4 Symbols and messages for more information). Parameters On – enables No notifications mode State Off –...
  • Page 152 MI 3394 XS CE MultiTesterXS Appendix E Retest period Retest period in months. Options: Editable – allows Retest period to be modified while running Auto Sequence®. Numeric keypad for entering custom Retest period is offered within the test. Not editable – Default Retest period is used. Retest period cannot be modified while running Auto Sequence®.
  • Page 153 MI 3394 XS CE MultiTesterXS Appendix E Received strings: End - pass End + Status End - fail End - none End - empty Description: Instrument sends string to external device at the end of each Measurement step. End + Status Flow setting is disabled by default.

  • Page 154: Custom Inspections Programming

    MI 3394 XS CE MultiTesterXS Appendix E E.6 Custom Inspections programming Arbitrary set of tasks dedicated to specific user defined Inspections can be programmed with application of Custom Inspection Editor Tool, accessible from Auto Sequence® Editor workspace. Custom Inspections are stored in dedicated file *.indf with user defined name. For application of Custom Inspections as a single test within Auto Sequence®...
  • Page 155 MI 3394 XS CE MultiTesterXS Appendix E Browse to the location, confirm overwriting, if file already exists or edit file name to save it as a new Custom Inspection Data file. Add New Custom Inspection. New inspection with default name Custom Inspection and default scope Visual appear on the editor workspace.

  • Page 156: Applying Custom Inspections

    E.6.2 Applying Custom Inspections Custom inspections can be applied in Auto Sequences®. Direct assignment of Custom inspection to the Metrel ES manager structure objects is not possible. After custom created Inspection Data file is opened, available inspections are listed in Custom ®...

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