Long Time Delay Test - GE MicroVersaTrip TVTS1 Manual

Test set
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LONG TIME DELAY Test
Purpose
Verify that the L T characteristic conforms to its upper and
lower band limits. It is recommended that measurements be
taken at three different values of TEST CURRENT
Test Procedure
1. Programmer Settings:
SHORT TIME PICKUP {If present)-9C.
2. Position Test Set Controls:
PROGRAMMER CURRENT SETTING-Must match the
programmer's CURRENT SETTING.
TEST SELECTOR-Long Time.
TEST CURRENT-From Table 2 (using proper Table 2A
or 28), select three test current values. Preset the first
value.
NOTE: These values must be below the program-
mer's SHORT TIME PICKUP setting, otherwise,
a
premature trip signal will be received from that
function.
3. Reset timer and push RESET button.
4. Push START. Allow test to run until trip occurs. The
trip time should conform to Table 2 limits. For 50-Hz opera-
tion, multiply timer readings by 1.2.
5.
Repeat the above test at two other TEST CURRENT
values.
6. If the programmer is equipped with adjustable LONG
TIME DELAY bands, repeat the above test series on the
other delay bands (Table 28).
Table 2A-T4VT and TP4VT (Four-
function) Programmers with Fixed
(Non-adjustable) Delay Band
Trip-Time
Test
Limits (In Seconds)
Current
Min
Max
1.50
209.7
353.7
2.00
117.6
198.2
3.00
51.8
87.3
4.00
29.0
48.8
5.00
18.3
30.8
6.00
12.7
21.4
7.00
9.3
15.7
8.00
7.1
12.0
Table 2B-Programmers with Adjust-
able Long Time Delay Bands
Programmer
Trip-Time
"long Time
limits (In SecondsO)
Delay"
Test
Setting
Current
Min
Max
1.50
37.3
62.7
2.00
20.9
35.3
3.00
9.2
15.6
1
4.00
5.1
8.8
5.00
3.3
5.5
6.00
2.3
3.9
7.00
1.7
2.8
8.00
1.3
2.2
1.50
74.9
126.0
2.00
41.9
70.7
3.00
18.6
31.2
2
4.00
10,4
17.5
5.00
6.6
11.1
6.00
4.6
7.7
7.00
3,4
5.6
8.00
2.6
4.3
1.50
150,4
253.4
2.00
84.3
141.9
3.00
37.2
62.6
3
4.00
20.8
35.1
5.00
13.2
22.2
6.00
9.1
15.4
7.00
6.7
11.3
8.00
5.1
8.7
1.50
314.9
530.4
2.00
176.5
297.2
300
77.7
131.0
4
4.00
43.5
73.3
5.00
27.4
46.2
6.00
19.1
32.1
7.00
14.0
236
8.00
10.7
18.1
"Reflecting the -:- 3% test set accuracy. allIes! lim'lls are extended beyond the
published band limits of the lime-current curves. DUring testing. the test cur-
rent should be monitored and readjusted
If
necessary
~~~_I~
TEST RESULTS DO NOT CONFORM, SEE PAGE 21
9

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