Agilent Technologies 4500 Series Operation Manual page 36

Analyzing Samples
Bottom window (2 mm
diameter yellow surface)
Figure 10. DialPath with accessory window facing up
In sample analysis mode, the DialPath is rotated such that the
accessory optical window is facing down towards the 4500 DialPath
FTIR sample mounting area. In this position, infrared (IR) energy
passes through the sample, making measurement possible. Make sure
that you rotate the DialPath arm completely around until it reaches
the detent and snaps or clicks into position. This detent keeps the
accessory stationary during sample measurement (see Figure 11).
The background measurement should be taken at the same pathlength that the
NOTE
sample will be measured at.
36 Agilent 4500 Series FTIR Operation Manual
Position 1 ZnSe window