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4-4 Fault Finding Using MULTI METER
Parts defects can be found for DIODE TRANSISTOR IC, using MULTI TEST including
Forward/Reverse direction Multi Test. Of course, in case resistance of several ohms and COIL are connect-
ed in parallel circuit, the lock out circuit parallel connected to part must be severed.
1.DIODE
+
Between Anode and Cathode
2. TRANSISTOR
l For NPN(KSC815-Y, 2SC2068, 2SC2331-Y)
B(BASE)
Between B and E
Between B and C
Between E and C
l For PNP(KSA539-Y)
B(BASE)
Between B and E
Between B and C
Between E and C
Samsung Electronics
-
Forward Direction
Hundreds of ohms
C (COLLECTOR)
E (EMITTER)
Forward Direction
Hundreds of ohms
Hundreds of ohms
Infinity
C (COLLECTOR)
E (EMITTER)
Forward Direction
Hundreds of ohms
Hundreds of ohms
Infinity
+
-
Reverse Direction
Infinity
E
B
C
Reverse Direction
Infinity
Infinity
Infinity
E
B
C
Reverse Direction
Infinity
Infinity
Infinity
Alignment and Adjustments
4-11
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