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Each monitored attribute has been selected to monitor a specific set of failure conditions in the operating
performance of the drive and the thresholds are optimized to minimize "false" and "failed" predictions.
8.5.5
Thermal monitor
Seagate Nytro 5350S NVMe SSD drives implement a temperature warning system which:
1.
Signals the host if the composite temperature exceeds the warning threshold, indicating an overheat condition
during which the controller continues to operate.
2.
Signals the host if the composite temperature exceeds the critical threshold, indicating an overheat condition
which can prevent continued operation of the drive.
3.
Saves a log entry on the drive which exceeds the temperature value.
A temperature sensor monitors the drive temperature and issues a warning composite over the interface when the
temperature exceeds a set threshold.
The thermal monitor system generates an Asynchronous Event Report with code 0Dh to indicate the drive has logged
a temperature excursion in the Persistent Event Log.
8.5.6
Device Self Test
Device Self Test (DST) is a technology designed to recognize drive fault conditions that qualify the drive as a failed
unit. DST validates the functionality of the drive at a system level. There are two test coverage options implemented in
DST:
1.
Extended test
2.
Short test
The most thorough option is the extended test that performs various tests on the drive and scans every logical block
address (LBA) of the drive. The short test is time-restricted and limited in length--it does not scan the entire media
contents, but does some fundamental tests and scans portions of the media. If DST encounters an error during either
of these tests, it reports a "diagnostic failed" condition. If the drive fails the test, remove it from service and return it to
Seagate for service.
8.5.6.1
DST failure definition
The drive will present a "diagnostic failed" condition through the self-tests results value of the diagnostic log page if a
functional failure is encountered during DST. The drive parameters are not modified to test the drive more stringently,
and the recovery capabilities are not reduced. All retries and recovery processes are enabled during the test. If data is
recoverable, no failure condition will be reported regardless of the recovery processes required to recover the data.
The following conditions are considered DST failure conditions:
Read error after recovery attempts are exhausted
Write error after recovery attempts are exhausted
8.5.6.2
Implementation
This section provides all of the information necessary to implement the DST function on this drive.
8.5.6.3
State of the drive prior to testing
The drive must be in a ready state before issuing the Device Self-test command. There are multiple reasons why a
drive may not be ready, some of which are valid conditions, and not errors. For example, a drive may be in process of
doing a Format NVM, or another DST. It is the responsibility of the host application to determine the "not ready" cause.
Seagate Nytro 5350S NVMe SSD Product Manual, Rev A
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