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Kyle Addington
The DAC38RF8x family of devices comes equipped with multiple test modes to assist users in verifying
systems in rapid prototyping situations. This application report covers two of the available tests, the
pseudorandom binary-sequence test and JESD204B short pattern test, in detail using the TI
DAC38RF8xEVM and
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1.1
1.2
1.3
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1.6
1.7
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2.1
2.2
2.3
2.4
2.5
2.6
2.7
2.8
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SLAA750 - July 2017
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ABSTRACT
TSW14J56EVM
capture card.
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List of Figures
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Copyright © 2017, Texas Instruments Incorporated
DAC38RF8x Test Modes
Contents
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Application Report
SLAA750 - July 2017
Wireless Infrastructure
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DAC38RF8x Test Modes
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