Safety precautions overvoltages. Measurement Category II (as referenced in IEC 60664) connections require protection for high transient overvoltages often associated with local AC mains connections. Certain Keithley measuring instruments may be connected to mains. These instruments will be The following safety precautions should be observed before using this product and any marked as category II or higher.
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Do not touch any object that could provide a current path to the common side of the circuit The WARNING heading in the user documentation explains dangers that might result under test or power line (earth) ground. Always make measurements with dry hands while in personal injury or death.
Power and environmental specifi cations For indoor use only. 100 VAC to 240 VAC , 50 Hz to 60 Hz Carefully consider and confi gure the appropriate Power Supply output-off state, source levels, and compliance 1000 VA Maximum VA levels before connecting the instrument to Maximum 2000 m (6562 feet) above Operating altitude a device that can deliver energy.
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Introduction USB fl ash drive contents The USB fl ash drive that is included with your instrument contains The easy-to-use Model 4200A-SCS Parameter Analyzer installation fi les for Clarius+. These can only be installed on the performs lab grade DC and pulse device characterization, 4200A-SCS Parameter Analyzer.
Unpack and inspect the instrument To unpack and inspect the instrument: Inspect the box for damage. Open the top of the box. Remove the documentation, standard accessories, USB fl ash drive, and optional accessories (such as rack-mount hardware). Remove the packaging insert. Remove the 4200A-SCS.
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Also, you should have received the following accessories: 8101-PIV component test fi xture with sample devices 4200-RPC-2 remote preamplifi er cable CAP-31 protective caps with triaxial connectors (two) CS-1252 SMA male-to-BNC female adapters (two) CS-1247 SMA female-to-BNC male adapters (four) CS-701 BNC tee adapters (two) 4200-MTRX ultra-low noise SMU triaxial cables (two) 236-ILC-3 safety interlock cable...
Connect the instrument Important test system safety information This system contains instruments that can produce hazardous • Cover the device under test (DUT) to protect the operator from voltages. It is the responsibility of the test system installer, fl ying debris in the event of a system or DUT failure. maintenance personnel, and service personnel to make sure the system is safe during use and is operating properly.
Install the instrument If you need voltages greater than ±40 V, you must also connect The 4200A-SCS can be used on a bench or in a rack. Please the exterior of the test fi xture enclosure to protective earth see the instructions that came with your rack-mount kit if you are (safety ground).
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There are low-voltage and high-voltage test fi xtures for the 4200A-SCS. Low-voltage fi xtures, such as the 8101-PIV that is included with this bundle, are intended for applications that For the examples shown in this quick start guide, you do not are less than ±40 V.
Test connections To connect the interlock cable: Connect one end of the supplied interlock cable (part If you are testing discrete devices, you need a test fi xture that is number 236-ILC-3) to the rear panel of the 4200A-SCS. equipped with 3-lug triaxial connectors. The 8101-PIV test fi xture The location of the rear panel interlock connector is shown that is included with the 4200A-SCS-PK2 allows the 4200A-SCS in the following graphic.
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Power on the 4200A-SCS The 4200A-SCS operates from a line voltage of 100 V to 240 V at a frequency of 50 Hz or 60 Hz. Make sure the operating voltage in your area is compatible. The power cord supplied with the Model 4200A-SCS contains a separate protective earth (safety ground) wire for use with grounded outlets.
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To power on the 4200A-SCS: Make sure the power is off. The power switch, on the front panel in the lower right corner, is not lit when power is off. When fi rst starting a Clarius+ application, you must answer Plug the male end of the line cord into a properly grounded AC “Yes”...
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Change powerline frequency To change the powerline frequency: Close Clarius. Run KCon. The default powerline frequency is set to 60 Hz. If the setting is wrong, the 4200A-SCS cannot properly reject powerline Select KI 4200A SCS in the Confi guration Navigator. The left pane is the Confi...
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FAQs Safety Introduction Connect I-V Test C-V Test Next Steps...
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Make connections for the I-V test If you are using the supplied test fi xture, connect the MOSFET and test fi xture as shown in this diagram.
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Item Description Notes 4200A-SCS Parameter Analyzer 4200-TRX Ultra-Low Noise Preamplifi er Triaxial-to-triaxial cable that connects 4200-PA to Triaxial Cables a test fi xture 4200-MTRX Ultra-low noise SMU triaxial cable (mini-triaxial, connects 4200-SMU units to a test fi xture) TG-439 nMOSFET (DUT) Plug into the test socket that is labeled DC ONLY 8101-PIV Component Test Fixture 4200-PA Remote Preamplifi...
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Perform an I-V test on a MOSFET The fi rst time Clarius opens, the project tree is displayed and the default project is loaded. The next graphic shows the tests in this project. To work with a test: Select vds-id (located under 4terminal-n-fet).
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To confi gure the test: Select Confi gure to open the pane shown here. This is The vds-id settings should be: where you defi ne the test. • SMU3: Provide a voltage step function for four different gate voltages (2 V, 3 V, 4 V, and 5 V). •...
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Run the vds-id test Clarius can run a single test or a sequence of tests. To run a single test, check the test and select it in the project tree. The test should be highlighted. When you select , only that test will run.
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To run a sequence of tests, check the tests you want to run, then check and select the device, subsite, or project item that contains the tests. For example, in the following graphic, when you select , all the checked tests under 4terminal-n-fet run. FAQs Safety Introduction...
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View the vds-id test results To view vds-id test data, you can use the Analyze sheet, which is similar to a Microsoft Excel spreadsheet, and the graph. To view vds-id test results: Select Analyze. Select an icon next to View to choose the type of information you would like to see: •...
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Export data or graphs Test results are automatically saved in Clarius, however, based on the vds-id test data you received, you can choose to save the data, graph, or both to an external fi le with a unique fi lename, depending on your needs. Note that the graph output is determined by the Graph Defaults setting in My Settings (you can choose .jpg or .bmp format).
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Customize the graph The graph shown below was customized to include the Legend box, Title, and use different colors for the graph series. These options are available through the Graph Settings button. To customize a graph: Select Graph Settings. To include a Legend and Title, select those options from the Graph Settings menu.
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FAQs Safety Introduction Connect C-V Test I-V Test Next Steps...
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Make connections for the C-V test If you are using the supplied test fi xture, connect the nMOSFET and test fi xture as shown in this diagram.
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Item Description Qty Notes 4200A-SCS Parameter Analyzer CA-447A cables SMA cable, male-to-male, 100 Ω, 1.5 m CS-1391 tee adapters SMA tee adapter (female-male-female) 8101-PIV Component Test Fixture 8101-309 (nMOSFET with S D B connected Plug into PULSE IV test socket together (DUT)) 4210-CVU FAQs...
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Perform a C-V test on an nMOSFET The Confi gure pane, on the next page, is where you defi ne the In the project tree, select cv-nmosfet. This test is located test. In the test shown, the device is connected to the CVH1 under the 4terminal-n-fet device.
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To defi ne the test: Select Confi gure. The cv-nmosfet settings should be: • CVH1: Default setting for DC bias is swept from 5 V to -5 V in -0.2 V steps with a 1 MHz capacitance measurement taken at each step. •...
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Run the cv-nmosfet test In the following example, only one test is run. cv-nmosfet To run the test: In the project tree, select cv-nmosfet to highlight it. On the toolbar, select While the test is running, Run shows two arrows circling the icon and Stop turns red: When the test is complete, Run and Stop return to normal:...
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View cv-nmosfet test results To view cv-nmosfet test data, you can use the Analyze sheet, which is similar to a Microsoft Excel spreadsheet, or the graph. To view cv-nmosfet test results: Select Analyze. Select an icon next to View to choose the type of information you would like to see: •...
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Export data or graphs Test results are automatically saved in Clarius, however, based on the vds-id test data you received, you can choose to save the data, graph, or both to an external fi le with a unique fi lename, depending on your needs. Note that the graph output is determined by the Graph Defaults setting in My Settings (you can choose .jpg or .bmp format).
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To display the graph for the cv-nmosfet test, select Graph only. A sample graph is shown here. In this example, the C-V curve is measured between the gate and the source/drain/bulk. Notice that the COX, CFB, and VFB parameters are extracted and displayed on the screen.
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FAQs A confi guration error has been detected and I cannot How should I clean the front-panel display? launch Clarius. What should I do? If you need to clean the front-panel LCD touchscreen display, This occurs when the physical confi guration does not use a soft dry cloth.
Next steps Data sheets: Technical data regarding the 4200A-SCS and See the 4200A-SCS Learning Center , which is preinstalled • related accessories. on your system. To access the Learning Center, select Help in the Clarius menu, press F1 while using Clarius, or select the See: www.tek.com/keithley for support and additional information...
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TEKTRONIX and TEK are registered Central East Europe / Baltics +41 52 675 3777 trademarks of Tektronix, Inc. All other trade names referenced Central Europe / Greece +41 52 675 3777 are the service marks, trademarks or registered trademarks of Denmark +45 80 88 1401 their respective companies.
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