Tam Tests Versus Test Connectors - HP 8562E Service Manual

Table 11-3. TAM Tests versus Test Connectors (continued)
Connector
Manual Probe Troubleshooting Test
Positive 15 volt supply
Sampler drive buffer bias
Sampling oscillator bias
Offset lock drive buffer
OFL error voltage
Negative 10 volt supply
Offset lock loop BW DAC
Positive 15 volt supply
Offset lock RF buffer
IF AMP/limiter bias
Offset lock loop buffer D
Offset lock loop buffer C
Sampler bias test
A155502 Positive 15 volt supply
Third LO tune voltage
Offset lock loop buffer
600 MHz oscillator bias
Calibrator AGC amp bias
Calibrator amp1 adj
3rd LO driver amp
Positive 15 volt supply
Flatness compensation 3
Flatness compensation 2
Flatness compensation 1
SIG ID collector bias
RF gain control test
Revision
External mixer switch
Ten volt reference
External mixer bias
Measured Signal Liner
MS1
MS2
MS3
MS4
MS6
MS8
MS2
MS4
MS6
MS7
MS8
MS3
MS2
MS3
MS4
MS5
MS6
MS7
MS8
MS2
MS5
MS6
MS7
MS3
MS5, MS6
MS4
MS7
Synthesizer Section 11-7