Foreword
The LEED Software Data Acquisition and Analysis was developed for OCI Vacuum Micro-
engineering by Dr. Greg Hall.
The
MultLEED
stores as platform independent bitmaps (.bmp files), which can be viewed using other Win-
dows applications. Supported platforms are Windows XP and Windows 7.
MultLEED can perform analyses on LEED images such as adding and subtracting im-
ages, enhancing brightness and contrast, line scanning through the image, calculating lattice
distances, calculating IV curves and reliability factor calculations, and acquiring Intensity–
Time (IT) curves.
software acquires, saves, and analyzes LEED images. The images are
Chapter 1 Introduction
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