Completing The Test; Overfrequency Protection Saptof (81); Verifying The Settings; Transformer Protection Ret650 - ABB RET650 Series Commissioning Manual

Section 7
Testing functionality
7.6.1.2

Completing the test

Continue to test another function or end the testing by setting the parameter
Disabled under Main menu/Tests/IED test mode/TESTMODE:1. If another function is tested, then
set the parameter
SAPTUF(81,f<)/SAPTUF:X for the function, or for each individual function in a chain, to be tested
next. Remember to set the parameter
tested.
7.6.2

Overfrequency protection SAPTOF (81)

Prepare the IED for verification of settings as outlined in section
settings.
Values of the logical signals for SAPTOF (81) are available on the local HMI under Main menu/
Tests/Function status/Frequency/SAPTOF(81,f>)/SAPTOF:X. The Signal Monitoring in PCM600
shows the same signals that are available on the local HMI.
7.6.2.1

Verifying the settings

Verification of PICKUP value and time delay to operate
1. Check that the IED settings are appropriate, for example the pickup value and the time delay.
2. Supply the IED with three-phase voltages at their rated values and initial frequency.
The initial frequency is calculated using Equation 18.
StartFrequency
IECEQUATION16061 V1 EN-US
[2]
3. Slowly increase the voltage frequency by steps of 40 mHz until the PICKUP signal appears;
during each step apply the voltage signal for a time that is either at least 10% longer than
tDelay +100 ms) or a suitable time to monitor the function.
(
4. Note the frequency value at which the PICKUP signal appears and compare it with the set
value
5. Decrease the frequency until its rated value is reached.
6. Check that the PICKUP signal resets.
7. Supply the IED with three-phase voltages at their rated values and frequency 20 mHz under
the set value
8. Increase the frequency with a 40 mHz step, applying it for a time that is at least 10% longer
than (
9. Measure the time delay of the
the measured time consists of the set value of the time delay plus the minimum trip time of
the function (80 - 90 ms).
Extended testing
x ] is the largest integer less than or equal to x
[2] floor[
68
Blocked to No under Main menu/Tests/Function test modes/Frequency/
   
0.02 floor f StartFrequency

r
StartFrequency .
StartFrequency .
tDelay +100 ms).
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Blocked to Yes , for each individual function that has been
 
/ 0.04 0.04

TRIP signal, and compare it with the set value tDelay . Note that
1MRK 504 136-UUS B
TestMode to
Preparing the IED to verify
(Equation 18)

Transformer protection RET650

Commissioning manual

M16289-57 v5
M16290-2 v7.1.1
M16290-14 v4.1.1
M16290-28 v4.1.1