Samsung NV10 Service Manual page 100

Ⅳ. ADJUSTMENT
20. EEPROM test
A. Purpos
This is for testing the availability of data of each steps that are saved on the EEPROM.
B. Behavior
① Check whether the data of each step that are saved on the EEPROM are available or not by the standard
② If not, stop the EEPROM test.
C. Spec (Standard for checking defect)
E. Log File Inspection
After completing the adjustment, LOG file will be made on the SD memory card.
Open the file with the Memo pad.
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