Hi-Pot Testing - Emerson Copeland EV2 Series Application Engineering Bulletin

28 Board Temp High
7 H - T
I POT ESTING
There many different types of dielectric testers available. When selecting one to use ensure it
has the following features:
•
Can test to voltages up to 4000VDC or higher.
•
Can read leakage currents less than 10µA.
•
Has Arc Detection available.
Recommended test settings:
•
APPLIED VOLTAGE: 3650 VDC
•
MAXIMUM LEAKAGE CURRENT: Contact Applications Engineer
•
RAMP UP TIME: 8 Seconds
•
DWELL TIME: 5 Seconds
•
RAMP DOWN: 8 Seconds
Test Procedure:
•
Setup test on a clean and dry non-conductive surface.
•
Ensure samples are handled properly and using ESD precautions.
• Verify the dielectric tester is configured per "Recommended test settings".
•
Contact Application Engineer for more details on connections and wiring setup.
•
Execute Test.
•
Note and record the maximum leakage current during the dwell period.
•
Once test is complete, safely disconnect the component and store it properly.
Processor over-heating. Verify proper airflow over the
heat-sink of the drive. Remove any obstructions. If
the problem, still persists replace the drive.
79 81 10 MICRO TEMP
HIGH