HP 8753E Installation And Quick Start Manual page 59

Figure 2-14 Example S
Measuring Impedance.
The amount of power reflected from a device is directly related to the impedance of the
device and the measuring system. Each value of the reflection coefficient (Γ) uniquely
defines a device impedance; Γ = 0 only occurs when the device and analyzer impedance are
exactly the same. The reflection coefficient for a short circuit is: Γ = 1 ∠ 180°. Every other
value for Γ also corresponds uniquely to a complex device impedance, according to the
equation:
= [( 1 +(Γ) / (1 −Γ)]×Z
Z
L
where Z is your test device impedance and Z
L
impedance (50Ω or 75Ω).
1. Press ,
Format SMITH CHART
2. Press ,
Marker Fctn MKR MODE MENU
resistive and reactive components of the complex impedance at any point along the
trace, as shown in
The marker annotation tells that the complex impedance is capacitive in the bottom
half of the Smith chart display and is inductive in the top half of the display.
Choose
LIN MKR
of the reflection coefficient at the marker.
Choose
LOG MKR
phase of the reflection coefficient at the active marker. This is useful as a fast method
of obtaining a reading of the log magnitude value without changing to log magnitude
format.
Choose
Re/Im MKR
coefficient at the marker as a real and imaginary pair.
Chapter 2
Measurement Trace in Polar Format
11
0
, ,
Scale Ref AUTOSCALE
,
SMITH MKR MENU
Figure 2-15. This is the default Smith chart marker.
if you want the analyzer to show the linear magnitude and the phase
if you want the analyzer to show the logarithmic magnitude and the
if you want the analyzer to show the values of the reflection
Quick Start: Learning How to Make Measurements
Learning to Make Reflection Measurements
is the measuring system's characteristic
0
.
and turn the front panel knob to read the
49