Internal Test Pattern Generator; Figure 17: Horizontal Ramp Test Pattern; Figure 18: Vertical Ramp Test Pattern; Figure 19: Diagonal Ramp Test Pattern - Dalsa CALIBIR 640 GigE User Manual

Internal Test Pattern Generator

The Calibir Series cameras include a number of internal test patterns which can easily confirm if
camera installations are setup correctly.
The internal test patterns are generated by the camera FPGA.
Calibir Test Patterns:
Horizontal ramp: Image is filled horizontally with an image that goes from the darkest
•
possible value to the brightest.
Vertical ramp: Image is filled vertically with an image that goes from the darkest possible
•
value to the brightest.
Diagonal ramp: combination of the 2 previous schemes.
•
Constant: All pixels in image stay at a defined value.
•
Constant, Incrementing: All pixels in image increment by 1 between successive frames,
•
going from darkest possible value to the brightest.
Constant, Incrementing, Fast: All pixels in image increment by 1 between successive
•
frames, going from darkest possible value to the brightest at a higher frame rate.
Vertical Stripes: Pixels alternate along the x-axis between the darkest possible value to the
•
brightest.
46 • Features and Configuration Options

Figure 17: Horizontal Ramp Test Pattern

Figure 18: Vertical Ramp Test Pattern

Figure 19: Diagonal Ramp Test Pattern

Figure 20: Vertical Stripes

Calibir 640 GigE IR Camera User's Manual