Debugger General Information
Flash Test Configuration Acceptable Entries
B
Erase Test
Flash Fill Test
B-48
Command Input:
cf flash
177-Diag>
FLASH Configuration Data:
Flash Device Test Mask =00000001 ?
Flash Test Starting Block =00000000 ?
Flash Test Ending Block =0000000F ?
Save/Restore For PATS Test [Y?N] =Y ?
Fill Data =000000FF ?
Test Data Increment/Decrement Step =00000001?
sd
177-Bug>
he flash
177-Diag>
FLASH
Flash Memory Tests (DIR)
TESTS
ERASE
Erase
FILL
Fill
PATS
Patterns
The erase test erases Flash memory according to the current test
configuration parameters selecting starting and ending blocks.
Command Input:
flash erase
177-Diag>
This test executes on the i28f008sa FLASHFILE
each having sixteen 64Kb blocks. On the MVME177 Flash memory
is jumper selectable (mapping to begin at $FF800000 or $FFA00000).
0 or 1
0 through F
0 through F
Y or N
any byte 00 through FF
0, 1, 2, F (-1) etc.
TM
memory devices,