Toshiba Satellite A300-ST3511 Maintenance Manual page 111

3.6 Memory Test
The test item is to ensure that there is no short circuitry issue in memory chip. The
parameter dialog window is the same as that in 'Subtest 02 Pattern'.
Subtest 06 Walking 0's Test
The test item is to ensure that there is no open circuitry issue in memory chip. The
parameter dialog window is the same as that in 'Subtest 02 Pattern'.
Subtest 07 Address Test
This test item is to check short and open issue on memory address lines.
Subtest 08 Refresh Test
This test item is to check whether the memory refresh works normally. The
parameter dialog window is as follows:
Subtest 09 Cache Memory
The test item is to check whether the CPU internal cache memory could be
accessed correctly.
Subtest 10 Random Memory
Random Memory test includes the following two test items: Randomize Test and
Random Incremental Read/Write Test. The parameter dialog window is the same
as that in 'Subtest 03 Extended Pattern'.
1. Randomize Test
This test item is to check whether the memory could be correctly accessed
with randomized data and randomized memory address.
2. Random Increment Read/Write
This test item is to check whether the memory could be correctly accessed
with randomized memory address and a series of incremental data.
Subtest 11 Data Bus Test
Satellite A300,Satellite Pro A300, EQUIUM A300,SATEGO A300 Maintenance Manual
3 Diagnostic Programs
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