Toshiba Satellite A300-ST3511 Maintenance Manual page 109

3.6 Memory Test
test coverage would be based on the setting and the value in 'Percent (%)
mentioned at below.
Pattern Size: Choose the pattern size – BYTE, WORD, DWORD or ALL.
Percent (%): Choose the percentage of the defined range of the memory to
be tested.
Time Limit(h): Choose or Input the time (hour) of the defined range of the
memory to be tested.
Time Limit(m): Choose or Input the time (minute) of the defined range of
the memory to be tested.
1. Bit Stuck High Test
Data pattern: Every bit is '1' (Each bit is high)
2. Bit Stuck Low Test
Data pattern: Every bit is '0'(Each bit is low);
3. Checker Board Test
Data pattern: Lo-byte and hi-byte are composed with 0101(0x5) and 1010
(0xA);
4. CAS Line Test
Data pattern: Lo-byte and hi-byte are composed with 0000 (0x0) and
1111(0xF);
5. Incremental Test
Data pattern: A series of increasing data from 0 by adding 1 each time;
6. Decrement Test
Data Pattern: A series of decreasing data from the maximum (e.g. 0xFFFF) by
subtracting 1 each time;
7. Incremental / Decrement Test
Data Pattern is a series of data whose low byte is increasing data from 0x00
and high byte is decreasing data from 0xFF.
Subtest 04 Extended Pattern
Satellite A300,Satellite Pro A300, EQUIUM A300,SATEGO A300 Maintenance Manual
3 Diagnostic Programs
37