Agilent Technologies E1326B User Manual page 283

reference thermistor, 89
terminal module connections, 33 - 36
thermocouple measurements, 130, 146
thermocouple types, 89
HP E1403B Adapter, 37
cables, 38
HP E1411B
high-speed scanning, 253
input terminals, 29
installing in mainframe, 26
scanning switchbox channels with, 52 - 53
TTLTrg line, 153
HP E1460A
making measurements, 246
scanning switchbox channels with, 52 - 53
terminal module connections, 33 - 35
HP E1476A
reference thermistor, 89
terminal module connections, 36
thermocouple measurements, 130, 146
thermocouple types, 89
HP-IB
CLEAR command, 113, 122
group execute trigger (GET), 103, 122
interface card, 60 - 62
secondary address, 22
I
ID Register, 205, 223
*IDN?, 186
IEEE 488.2 Commands
See Common (*) Commands
Implied SCPI Commands, 118
Increasing
measurement speed, 269 - 278
reading rates, 82
throughput speed, 58
Induced Voltage, 100
INITiate Subsystem, 142
INITiate:FETCH?, 277
INITiate[:IMMediate], 111, 142
Input
characteristics, 28, 189
signals, connecting, 32
terminals, 15, 29
Installation Overview, 21
Instrument, definition of, 13
Integration Time (PLC)
See also Aperture Time
description, 97
parameters, 91, 97
querying, 98, 165, 174
284 HP E1326B/E1411B 5 1/2 Digit Multimeter User's Manual Index
RESistance:NPLC, 98, 164, 173
saved in memory, 114
setting, 98, 163 - 164, 171, 173
table listing, 92, 120
VOLTage:NPLC, 98, 173
Interface Card, HP-IB, 60 - 62
Internal Installation, HP E1326B, 25
Interrupt
lines, 24
priority, 24
VME, list of, 267
Introduction to Operation, 16
IRQ Jumper Setting, 24
J
Jumper, IRQ, 24
L
LADDR, 22 - 23, 200 - 201
Language Used In Programming, 41
Line Reference Frequency, 123
Linking Commands, 119
*LMC?, 186
Logical Address
factory setting, 22 - 23, 200 - 201
register-based, 200 - 201
setting, 22 - 23, 200 - 201
M
Macros, 274
Mainframe
A16 address space, 199 - 201
disabling keyboard, 39
E1411B installation, 26
HP E1326B internal installation, 25
installing the E1326B adapter, 25
memory, 82, 114
reading destinations, 81 - 82
retrieving data from memory, 83 - 84
Making
a measurement, 78
externally triggered scan, 49
measurements, 20
measurements using CONFigure, 78 - 79
measurements using MEASure, 78, 82
measurements using READ?, 82
multiple paced scans, 48
multiple scans, 47 - 48
Maximizing
measurement accuracy, 63