Sourcetronic ST2840 User Manual

Automatic transformer test system
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ST2840 Automatic Transformer Test System

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Summary of Contents for Sourcetronic ST2840

  • Page 1 SOURCETRONIC – Quality electronics for service, lab and production User Manual ST2840 Automatic Transformer Test System...
  • Page 2: Table Of Contents

    ST2840 Series Automatic Transformer Test System Contents Contents Contents ................................. II 1 Out of Box Audit ............................1 1.1 Inspect the Package ..........................1 1.2 Power Connection ..........................1 1.3 Fuse ..............................1 1.4 Environment ............................2 1.5 Use of Test Fixture ..........................2 1.6 Warm-Up ...............................
  • Page 3: Contents

    ST2840 Series Automatic Transformer Test System Contents 3.1.3 Decimal Point Position ......................... 16 3.1.4 Display Results of BIN Sorting ..................... 17 3.1.5 Comparison Function ........................17 3.1.6 BIN Count Function ........................17 3.1.7 Count Reset ..........................17 3.1.8 Save Bridge Measurement Results to USB Flash Drive .............. 18 3.2 <List Display>...
  • Page 4 ST2840 Series Automatic Transformer Test System Contents 3.4.8 Trigger ............................32 3.4.9 Average ............................33 3.4.10 Automatic Level Control ......................33 3.4.11 Source Resistance ........................34 3.4.12 Deviation and Reference ......................34 3.5 <Limit Setup> ............................35 3.5.1 Comparator Function ........................36 3.5.2 Compare Count Switch ........................
  • Page 5 ST2840 Series Automatic Transformer Test System Contents 3.7.5 Sweep Type ..........................42 3.7.6 Trace Mode ..........................43 3.7.7 X Format ............................43 3.7.8 Max/Min ............................43 3.7.9 Ordinate Range Setting ....................... 43 3.8 User Correction ........................... 44 3.8.1 Open-Circuit Correction ....................... 45 3.8.2 Short-Circuit Correction .......................
  • Page 6 ST2840 Series Automatic Transformer Test System Contents 5.1.2 Point-Frequency Correction ......................59 5.2 Correct Connection of DUT ......................... 60 5.3 Eliminate the Influence of Stray Impedance ..................61 5.4 Example: Testing Inductance ......................62 5.4.1 Measurement Settings ......................... 62 5.4.2 Operation Steps ........................... 63 5.5 Example: Testing Capacitance by Multi-Frequency List Sweep ............
  • Page 7 ST2840 Series Automatic Transformer Test System Contents 6.3.1 Save the Measurement Results of a Single Set of Transformers on the USB Flash Drive ..73 7 Transformer Auto Scanning Test ......................74 7.1 Introduction to the Scan Measurement Function ................. 74 7.2 Install and Connect the Scanning Test System ...................
  • Page 8 ST2840 Series Automatic Transformer Test System Contents 7.9 Trans Pin to Fixture ..........................85 7.9.1 Pin-to-Fixture Setup ........................85 7.9.2 Pin Label Setup ..........................86 7.10 Pin Setup ............................87 7.10.1 Trans Pin Setup ......................... 87 7.10.2 Series Pins Setup ........................88 7.10.3 Parallel Pins Setup ........................
  • Page 9 ST2840 Series Automatic Transformer Test System Contents 7.12.5 BAL Balance Parameter Display ....................122 7.13 <File> Page of Transformer Scan ....................122 7.13.1 Transformer Scan Setup File (*.t40) ..................123 7.13.2 Operation Steps for File Management ..................123 7.13.3 Transformer Deviation-Deduction .................... 124 7.14 Focus ...............................
  • Page 10 ST2840 Series Automatic Transformer Test System Contents 8.1.4 Equivalent Mode ........................134 8.1.5 Range ............................134 8.1.6 Trigger ............................134 8.1.7 Delay Time ..........................134 8.1.8 Connection Modes of Test Terminals ..................134 8.1.9 Measurement Speed ........................135 8.1.10 Average ............................ 135 8.1.11 Digits Displayed ........................
  • Page 11 ST2840 Series Automatic Transformer Test System Contents 8.3.9 Lk Accuracy ..........................140 8.3.10 Turns Ratio Accuracy ....................... 140 8.3.11 Accuracy Factor ........................141 8.4 Safety Requirements ......................... 145 8.4.1 Insulation Resistance ......................... 145 8.4.2 Insulation Intensity ........................145 8.4.3 Leakage Current ........................145 8.4.4 Electromagnetic Compatibility: ....................
  • Page 12 ST2840 Series Automatic Transformer Test System Contents 9.2.9 AMPLitude Auto Level Subsystem Commands ................160 9.2.10 Output RESister Internal Resistance Subsystem Commands ..........161 9.2.11 FUNCtion Subsystem Commands ................... 161 9.2.12 COMParator Subsystem Commands ..................166 9.2.13 LIST Subsystem Commands ....................170 9.2.14 TRACE Subsystem Commands ....................
  • Page 13 ST2840 Series Automatic Transformer Test System Contents 10.2.3 Electrical Features ........................235 10.2.4 Wiring Instructions ........................235 10.2.5 Using the List Sweep Comparison ................... 235 10.3 Transformer Single-Group Measurement ..................235 10.3.1 Sorting Logic ..........................235 10.3.2 Technical Description ....................... 236 10.3.3 Electrical Feature ........................
  • Page 14: Out Of Box Audit

    1 Out of Box Audit Thank you for choosing our product – if you have any questions after reading this manual, please feel free to contact Sourcetronic. When you receive the product, some inspections are needed before installation. 1.1 Inspect the Package Inspect the shipping container for damage after unpacking it.
  • Page 15: Environment

    ST2840 Series Automatic Transformer Test System Out of Box Audit 1.4 Environment Please do not operate the instrument in an environment where it will be subjected to strong vibrations, dust, direct sunlight or corrosive air. The normal working temperature is 0°C~40°C with a relative humidity of ≤ 75%, so the instrument should be used under these conditions to guarantee its accuracy.
  • Page 16: Introduction

    USB Host Interface ST2840 is equipped with two USB host interfaces, which can be used to connect USB storage to save and load files from, or to connect to devices such as a mouse, keyboard, or scanner. Note that only one USB storage device can be inserted at a time.
  • Page 17 ST2840 Series Automatic Transformer Test System Introduction [DISP] Press this key to enter the measurement display page of the corresponding function (bridge, transformer measurement, transformer scan, focus scan). [SETUP] Press this key to enter the measurement settings page of the corresponding function (bridge, transformer measurement, transformer scan).
  • Page 18 ST2840 Series Automatic Transformer Test System Introduction 20) [TRIGGER] When the trigger mode is set to single mode, press this key to start a measurement cycle. 21) Test Terminals (UNKNOWN) Four-teminal test pairs are used to connect a four-terminal test fixture or cable to the DUT.
  • Page 19: Introduction To The Rear Panel

    Introduction 2.2 Introduction to the Rear Panel The rear panels of the different models of ST2840 series instruments vary slightly. The detailed description of the rear panel layout of ST2840A, ST2840B, ST2840AX, ST2840BX will be introduced in 2.2.1 and the detailed description of the rear panel layout of ST2840NX will be introduced in 2.2.2.
  • Page 20 ST2840 Series Automatic Transformer Test System Introduction Note: ST2840A and ST2840B have no transformer scan function, so for them, this interface cannot be used. Ground Terminal This terminal is connected to the chassis of the instrument. It can be used to protect or shield ground connections.
  • Page 21: Rear Panel Description 2

    ST2840 Series Automatic Transformer Test System Introduction 2.2.2 Rear Panel Description 2 Figure 2-3 briefly describes the rear panel of ST2840NX. Warning: To avoid electric shock, the power cord protective grounding conductor must be connected to ground. Disconnect power supply before replacing fuse.
  • Page 22: Introduction To The Display Areas

    The serial communication interface is used for online communication with the computer. 2.3 Introduction to the Display Areas ST2840 series instruments use a 10.1-inch capacitive touch screen; the content displayed on the screen is divided into the following display areas:...
  • Page 23: Main Menu Keys And Their Corresponding

    ST2840 Series Automatic Transformer Test System Introduction Figure 2-4 Display Areas The elements shown on this page include: • Title, • Measurement Conditions (Settings), • Four-Parameter (Function) Result Display, • Sorting Results, • Menu. 2.4 Main Menu Keys and Their Corresponding Pages 2.4.1 [DISP]...
  • Page 24: Setup]

    ST2840 Series Automatic Transformer Test System Introduction When the transformer scan function is active, press this key to access the transformer scan display page. The following function pages are available here: <Pri.> <Load Std> <Deviation> <Speed> <Test Fail> <Focus> <Split>...
  • Page 25: System]

    ST2840 Series Automatic Transformer Test System Introduction <Handler Mode> <Stat> <Tools> 2.4.3 [SYSTEM] Press this key to enter the system settings homepage, which concerns communication settings, user management settings, and Handler settings. The following function pages are available here: <System Info>...
  • Page 26: Basic Operation

    ST2840 Series Automatic Transformer Test System Introduction 2.5 Basic Operation The basic operation principles of ST2840 series instruments are as follows: • Use the menu keys ([DISP], [SETUP], [SYSTEM]) and soft keys to select pages. • Use the cursor keys ([←][→][↑][↓]), knob or directly touch the screen to move the cursor between areas on the screen.
  • Page 27: Description Of The Lcr Function Module

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 3 Description of the LCR Function Module 3.1 <Meas Display> When the LCR function is active, press [DISP] to access the <Meas Display> page, as shown in the following...
  • Page 28: Measurement Function

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module • DC Range • Each of these settings will be described in further detail in the <Meas Setup> chapter of this user manual. 3.1.2 Measurement Function Touch the position of the parameter name in the measurement result area, and you can see the selection menu of the corresponding measurement function in the right menu area.
  • Page 29: Decimal Point Position

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 3.1.3 Decimal Point Position Parameter Type: select from list The position of the decimal point has a direct relationship with the resolution of the result displayed; this way, the relative stability of the result can also be seen intuitively.
  • Page 30: Display Results Of Bin Sorting

    3.1.5 Comparison Function ST2840 series instruments come with a built-in comparison function that allows the DUT to be assigned to one of up to ten sorting bins (BIN1 to BIN9 and BIN OUT). Ten sets of upper and lower limits can be set, and the upper and lower limits of each file containing four parameters can be set independently.
  • Page 31: Save Bridge Measurement Results To Usb Flash Drive

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 3.1.8 Save Bridge Measurement Results to USB Flash Drive Use the USB flash drive to save the bridge measurement results. The results and settings that can be saved include the following: •...
  • Page 32: List Display

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 3.2 <List Display> On the <List Display> page, you can enter up to 201 points of measurement frequency, as well as measurement level, DC bias, trigger delay, independent functions corresponding to four parameters, four independent parameters, and upper and lower limits for each list sweep measurement point.
  • Page 33: Trace Display

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module • • • • COMP (These correspond, in order, to test time, point index, 4 parameter function, parameter 1~4 result, comparison result.) The operation steps to save your data are as follows: •...
  • Page 34: Trigger

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module Note: After you have configured the scan settings, you must press the [TRIGGER] key on the front panel to begin the scan. Press the [RESET] key once to pause the measurement, and press it again to reset and rescan.
  • Page 35: Read

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 3.3.3 Read This setting is used to configure the behavior of the cursor (displayed as a red line) on the screen. You can view the measurement results of different parameters under the same scanning condition by turning the knob or using the left and right keys.
  • Page 36: Trace

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 3.3.4 Trace Via the submenu of the curve button, you can quickly choose the sweep points of the curve, whether to hide or show the parameter on the curve for each of the four parameters, how to split the screen between multiple curves, as well as other related settings.
  • Page 37: Save Measurement Results To Usb Flash Drive

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module Figure 3-8 Display Effect of 2-Split Screen Figure 3-9 Display Effect of 4-Split Screen 3.3.8 Save Measurement Results to USB Flash Drive Use the USB flash drive to save the measurement results and curve settings. The results and settings that can be saved are as follows: •...
  • Page 38: Other Measurement Results

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module • • • COMP (These correspond, in order, to test time, point index, x-axis size, parameter 1~4 result.) The operation steps to save your data are as follows: •...
  • Page 39: Meas Setup

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module • The maximum impedance Z and its corresponding frequency f , (point M on the screen). Δ – f −  2  51 .   −...
  • Page 40: Measurement Function

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 3.4.1 Measurement Function Parameter Type: select from list The four parameters of the impedance element can be measured at the same time in one measurement cycle. The measurable parameters are as follows:...
  • Page 41: Level

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module Note: The specific models have different frequency ranges they support. For further details, please refer to the instrument selection guide. Here is a very basic comparison: Specific Instrument Model...
  • Page 42 ST2840 Series Automatic Transformer Test System Description of the LCR Function Module Voltage Level Range: 5mV~20V. Current Level Range: 50uA~100mA Note: There is a linear constraint relationship of internal resistance between the voltage level and the current level. (For example, the current level corresponding to 30Ω internal resistance is 166.7μA~66.67mA, and the current level corresponding to 100Ω...
  • Page 43: Speed

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module Level Voltage and Resolution: Voltage Level (V Resolution [0.1,1] (1,20] 10mV 3.4.4 Speed Parameter Type: select from list The measurement speed is mainly determined by the following factors: •...
  • Page 44: Dc Bias

    This involves selecting bias source and type, setting the digital size range, as well as other related settings. 3.4.6.1 Bias Source ST2840 series instruments come equipped with two types of internal bias source or external biases for selection. The corresponding options and input ranges are as follows:...
  • Page 45: Level Monitoring Function

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module Note: After the bias current isolation function is turned on, it will affect the test accuracy. Therefore, when measuring high-impedance components under low frequency and small bias current conditions, the bias current isolation function should be set to OFF.
  • Page 46: Average

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module Note: If, during measuring, another trigger signal is received, this signal will be ignored. Therefore, the trigger signal needs to be sent again after the measurement is completed.
  • Page 47: Source Resistance

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 3.4.11 Source Resistance When using the internal 100mA bias current, the output of the signal source has an output resistance, and the output signals of other bias current modes are not output through this internal resistance.
  • Page 48: Limit Setup

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module Δ% (Percentage Deviation Mode) The deviation currently displayed is the percentage of the difference between the test value of DUT and the preset reference value divided by the reference value. Its calculating formula is as below: Δ% = (X –...
  • Page 49: Comparator Function

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 10 BIN limits can be set, and the measured results can be sorted into up to 11 BINs (BIN1 to BIN10 and BIN OUT). • Comparison ON/OFF (comparison function switch) •...
  • Page 50: Comparator Function Limit Mode

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 3.5.3 Comparator Function Limit Mode The comparison function provides the following two parameter limit setting modes, as shown in the figure below: Tolerance Mode In tolerance mode, set the deviation value from the nominal value (the nominal value is set in the nominal field) as the comparison limit value.
  • Page 51: Deviations And References

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 3.5.5 Deviations and References Refer to the setting of the deviation and reference on the measurement settings page; the meaning of the parameter here is exactly the same.
  • Page 52: Total Point

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module On the <List Setup> page, the following list sweep parameters can be set: • Total Point • Trigger Mode • List Mode (sweep mode) • Sweep Condition (frequency [Hz], level [V], level [I], bias [V], bias [I]) •...
  • Page 53: Sweep Condition

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 3.6.4 Sweep Condition Frequency, level, and bias can be set independently, and can also be quickly set to make one of the conditions remaining relatively regular. If you are only concerned about the impact of one condition change on the DUT, you can quickly set other measurement conditions to the same result, such as a linear change in frequency, and a fixed level and bias.
  • Page 54: Trace Setup

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 3.7 <Trace Setup> Press [SETUP] and then [Trace Setup] to enter into the <Trace Setup> page. Figure 3-15 Trace Setup This display function page is used to complete the setting of trace sweep measurement parameters, including split, sweep point, sweep type, start condition, stop condition, trace mode, X Format, Max-Min switch, 4 parameters, and Y display range, etc.
  • Page 55: Spilt

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 3.7.3 Spilt For the curve display effect, 3 kinds of split screen display are available: Split Description 1-Split / None All curves are displayed in the same drawing window...
  • Page 56: Trace Mode

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 3.7.6 Trace Mode Set the trace sweep mode to either sequential mode or single-step mode. Parameter Type: select from list Sequential Mode Upon receiving a trigger signal, the instrument will sweep sequentially from the first point to the last point;...
  • Page 57: User Correction

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 3.8 User Correction 10 user PT are provided on the <User Corr> page. In the Freq domain, you can set whether the calibration data of the corresponding point is turned on. After turning on, manually enter the frequency corresponding to the calibration, and then use the soft key [Open] to execute open-circuit correction, short-circuit correction, and load correction for the set frequency.
  • Page 58: Open-Circuit Correction

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module • Load Type • Point Frequency Correction Switch • Reference Value; etc. 3.8.1 Open-Circuit Correction The open-circuit correction function can eliminate the error caused by the stray admittance (G, B) connected...
  • Page 59: Short-Circuit Correction

    Note: Connect the test fixture to the test terminal of the instrument. The fixture is open and not connected to any component under test. 3.8.2 Short-Circuit Correction The short-circuit correction function of ST2840 series instruments can eliminate errors caused by spurious inductance (R, X) in serial with DUT, as shown in the following figure: Figure 3-18 Spurious Inductance...
  • Page 60: Load Correction

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module to all test frequencies by using the interpolation calculation method. Move the cursor to the Short field, and use the soft key [Meas Short] to execute the full frequency short-circuit correction. The fixed frequency point is the same as the open-circuit correction.
  • Page 61: Cable

    ST2840 Series Automatic Transformer Test System Description of the LCR Function Module 3.8.3.1 Load Type When performing load correction, the reference value of the standard device must be input in advance. The test parameters of the reference value should be consistent with the set load correction measurement function.
  • Page 62: System And File

    – USBCDC USB Device USBTMC Note: The Sourcetronic GPIB option must be installed to support the GPIB mode. When using the RS485 or GPIB interface, the bus address under the RS232 setting will be used as the local address. v1.1...
  • Page 63: User Setup

    ST2840 Series Automatic Transformer Test System System and File 4.1.2 User Setup 4.1.2.1 Key Sound Parameter Type: select from list Setting Options: ON/OFF 4.1.2.2 Pass Sound Parameter Type: select from list This parameter is used to control and display the sound mode when the measurement comparison result of the instrument is qualified.
  • Page 64: Rs232

    ST2840 Series Automatic Transformer Test System System and File 4.1.2.5 Password Parameter Type: select from list type + input type This parameter shows the current password protection mode. Setting Options: • OFF: Turn off password protection • Lock System: Activate password protection, including file protection •...
  • Page 65: Lan

    ST2840 Series Automatic Transformer Test System System and File 4.1.3.3 Cmd Mode Parameter Type: select from list This parameter is used to set the command mode with SCPI command and modbus command protocol. Setting Options: • SCPI: Adopt general ASCII string command protocol •...
  • Page 66: Tools

    The real-time clock date and time are not allowed to be cleared or initialized. 4.1.5.2 Update This function is used for software version upgrade and maintenance. ST2840 series instruments are designed with multiple CPUs. For your convenience, a one-key option to update firmware is provided. After the one- key update, you need to wait only about 2 minutes (refer to the prompts on the screen).
  • Page 67 ST2840 Series Automatic Transformer Test System System and File The update menu is shown in Figure 4-2: Figure 4-2 Update Menu The dynamic prompt window of the one-click upgrade is shown in Figure 4-3: Figure 4-3 Update Pending Prompt v1.1...
  • Page 68: File

    ST2840 Series Automatic Transformer Test System System and File 4.2 <File> As your instrument is equipped with an embedded file system, it can be very convenient to store the custom- set parameters as a file, either in the system's internal drive or on an external USB drive. This way you won't have to re-configure the parameters next time if you want to use the same settings again;...
  • Page 69: Introduction To The Save/Load Function

    ST2840 Series Automatic Transformer Test System System and File 4.2.2 Introduction to the Save/Load Function Using the save/load function, you can save configuration information either to the device's own internal drive or to an external USB flash drive, and in turn load files from there.
  • Page 70: Operation Steps For File Management (Save/Load)

    ST2840 Series Automatic Transformer Test System System and File Copy to E:\ When the cursor is on an internally stored file or folder, this will copy it to the USB root directory. Note: If you are copying a single file, it will overwrite any file of the same name in the USB path; if you are copying a folder, please make sure that there is no folder with the same name in the USB root directory, otherwise it will cause the error message "Copy Failed".
  • Page 71 ST2840 Series Automatic Transformer Test System System and File 4.2.4.1 Load File When you move the cursor to a loadable file in the file list or directly enter the file number of a loadable file, this option will be displayed.
  • Page 72: Execute Lcr Measurement And Some Examples

    ST2840 Series Automatic Transformer Test System Execute LCR Measurement and Some Examples 5 Execute LCR Measurement and Some Examples 5.1 Corrections You can select one of two correction modes (applied to the entire list via sweep mode or applied to one specific frequency point) to execute an open-circuit or short-circuit correction;...
  • Page 73: Correct Connection Of Dut

    ST2840 Series Automatic Transformer Test System Execute LCR Measurement and Some Examples • Press the key to input the specified frequency size of 5.5k. The frequency area will be changed to 5.5000kHz (the same as the measurement frequency). • Keep the test fixture open and press [Meas Open] to execute an open-circuit correction.
  • Page 74: Eliminate The Influence Of Stray Impedance

    ST2840 Series Automatic Transformer Test System Execute LCR Measurement and Some Examples • Contact resistance must be reduced to a minimum. • Short-circuit and open-circuit must be available between contact points. Open-circuit and short-circuit correction can easily reduce the influence of distribution impedance of the test fixture on measurement.
  • Page 75: Example: Testing Inductance

    ST2840 Series Automatic Transformer Test System Execute LCR Measurement and Some Examples Shielding Ground Shielding Plate Test Terminal Metal Conductor Figure 5-2 Influence of Stray Impedance (Solution) When the DUT has high impedance (such as small capacitance), the influence of stray capacitance cannot be ignored.
  • Page 76: Operation Steps

    ST2840 Series Automatic Transformer Test System Execute LCR Measurement and Some Examples 5.4.2 Operation Steps • Turn on the instrument. • Set basic parameters. • Press [DISP] to enter into the <Meas Display> page. • Move the cursor to the Parameter area, the optional parameters are in the soft key area on the right side of the screen.
  • Page 77: Example: Testing Capacitance By Multi-Frequency List Sweep

    ST2840 Series Automatic Transformer Test System Execute LCR Measurement and Some Examples If the measurement result is obviously incorrect, please check the following items. Check the tested inductance is in good connection with the test fixture or not. Check the test fixture is in good connection with the test terminals of the instrument or not.
  • Page 78 ST2840 Series Automatic Transformer Test System Execute LCR Measurement and Some Examples Sound Setup: • Press [SYSTEM] to enter into the <System Setup> page. • Move the cursor to the Fail Sound zone to select [High Long]. • Mount the test fixture (ST26005) to the test terminals of the tester.
  • Page 79: Example: Load Correction

    ST2840 Series Automatic Transformer Test System Execute LCR Measurement and Some Examples 5.6 Example: Load Correction 5.6.1 Operation Steps Assume the following measurement conditions: Frequency: 100kHz. Cp Standard Value: 11nF D Standard Value: 0.0005 • Press [CAL], the instrument will display the <User Corr> page.
  • Page 80: Transformer Single-Machine Test

    ST2840 Series Automatic Transformer Test System Transformer Single-Machine Test 6 Transformer Single-Machine Test 6.1 Circuit for Transformer Single-Machine Test 6.1.1 Some Transformer Parameters 6.1.2 Transformer Single Test Circuit and TURN Test SEC+ SEC- ST2818 Nsp = U2 / U1 On ST2840X, TURN test has 4 display modes: •...
  • Page 81: Transformer Leakage Inductance Test

    ST2840 Series Automatic Transformer Test System Transformer Single-Machine Test We recommend you put the winding group with more turns in primary winding rate; the reasons are as follows: Due to the influence of output internal resistance (30, 100), when the primary inductance is too small, the distributed voltage signal is small and the transformer gets weak energy.
  • Page 82: Transformer Single Setup

    ST2840 Series Automatic Transformer Test System Transformer Single-Machine Test 6.2 <Transformer Single Setup> Press the shortcut key [HOME] to enter the function selection interface, as shown in Figure 6-1-1. Figure 6-1 Single Setup Move the cursor to the Single Setup area or directly touch the single group setting area to access the <Single Setup>...
  • Page 83: R Sou

    ST2840 Series Automatic Transformer Test System Transformer Single-Machine Test 6.2.4 R Move the cursor to the R area; the menu area on the right side of the screen will display [100Ω] and [30Ω]. • If you press [100Ω], the internal resistance area will display 100Ω, which means the output impedance of the instrument is 100 Ω.
  • Page 84: Parameter Setup

    ST2840 Series Automatic Transformer Test System Transformer Single-Machine Test 6.2.7 Parameter Setup The parameter setting area is shown in Figure 6-1, with 12 rows and 11 columns. Each row corresponds to a parameter, and up to 12 parameters can be selected for measurement; each column corresponds to a setting item of the corresponding parameter.
  • Page 85: Single Display

    ST2840 Series Automatic Transformer Test System Transformer Single-Machine Test • The four columns of Deviation, Nominal Value, Lower Limit and Upper Limit constitute the sorting settings of the parameters. The three options are Deviation Mode, Δ and Δ%, which respectively represent data read-only mode, absolute deviation mode, and percentage deviation mode.
  • Page 86: Save The Measurement Results Of A Single Set Of Transformers On The Usb Flash Drive

    ST2840 Series Automatic Transformer Test System Transformer Single-Machine Test 6.3.1 Save the Measurement Results of a Single Set of Transformers on the USB Flash Drive Use the USB flash drive to save the measurement results. The measurement results and formats that can be saved are as follows: •...
  • Page 87: Transformer Auto Scanning Test

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7 Transformer Auto Scanning Test 7.1 Introduction to the Scan Measurement Function ST2840NX can rely on an internal scan board or use an external ST1901/ST1806/ST1831 transformer scan box to form a transformer automatic test system; ST2840AX/ST2840BX can only use an external scan box to form a test system (no internal scan board).
  • Page 88: Install And Connect The Scanning Test System

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.2 Install and Connect the Scanning Test System Automatic transformer test system is the connection of ST1901/ST1806/ST2831 and ST2840X, and the connection steps are as follows: Use 36PIN double-headed cable (ST26016 transformer test control cable) to connect the SCANNER socket on the rear panel of ST1901/ST1806/ST2831 and the SCANNER socket on the rear panel of ST2840X as shown in the following figure.
  • Page 89: Front Panel Of Scanning Box

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test Test Fixture Scanning Box 6-Terminal Scanning Box Connect the scanning test cable to ST2840X. 7.3 Front Panel of Scanning Box ST1901A TRANSFORMER TEST FIXTURE GOOD 2 3 4 5 6 7 8 9 WARNING:...
  • Page 90 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test Cylinder This is the main driving force for ST1901A; For ST1901B/ST1831, the motive force is from a manual push rod. RESET Button When pressing this button, all tests will be terminated and the instrument will recover to the original preparing test state.
  • Page 91: Rear Panel Of Scanning Box

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.4 Rear Panel of Scanning Box TEST LINE CYLINDER FOOT.C SCANNER HANDLER GO NG S R 7.4.1 Introduction to Each Number on the Rear Panel Test Line Inlet port of the test cable, ST1901L 6-terminal test box is connected to inner part of ST1901A/B through this line.
  • Page 92: Handler Interface

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.5 Handler Interface Timing diagram of the Handler signal: 7.5.1 Distribution and Connection Diagram for Handler The distribution and external circuit of Handler signal pin: v1.1...
  • Page 93: Example Of Transformer

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.6 Example of Transformer In order to understand the operation of a transformer scanning test, the setting figures listed in the following chapters are based on the sample below. STB1001 More detailed information will be described in later sections.
  • Page 94: Transformer Id

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.8 <Transformer ID> When the instrument function is Trans Scan, press the [SETUP] button above the knob to enter the <Trans ID> page. 7.8.1 Transformer ID You can input the transformer ID to be tested in this area. The setting method is as follows: Press the menu function [Input], select the desired character in the soft keyboard, press [ESC] to cancel, press [ENTER] to apply the entered transformer ID.
  • Page 95: Secondary Nums

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.8.3 Secondary Nums You can input the number of transformer secondary groups in this area. The secondary numbers range from 1~9. 7.8.4 Rescan Interval In this area, you can enter the interval time for automatic continuous measuring.
  • Page 96: Ignore Nom

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.8.8 Ignore Nom This area overlaps 2 functions, one is to ignore the nominal value for measuring, and the other is the deviation deduction limit. All are related to the nominal value. They are as follows: •...
  • Page 97: Scan Box Mode

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.8.11 Scan Box Mode This area is used to set the test fixture used when the instrument scans. • Internal: This means that the internal scanning board of the instrument is used in the test, which is only equipped with ST2840NX.
  • Page 98: Trans Pin To Fixture

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.9 Trans Pin to Fixture On the <Trans ID> page, press the menu key [Trans Pin], it will jump to the <Trans Pin To Fixture> page. This page is used to connect the pin of the transformer to the pin of the test fixture, and to convert the pin number into a custom pin label.
  • Page 99: Pin Label Setup

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.9.2 Pin Label Setup The transformer pin label function can convert a transformer pin that was originally only represented by numbers into a transformer pin represented by custom numbers or letters, as shown below: After setting the transformer pin label and related measurement conditions, it can be displayed in the PIN (pin) column in the transformer measurement interface as a custom transformer pin label (to be updated).
  • Page 100: Pin Setup

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.10 Pin Setup Press the function key [Pin Setup] on the <Trans ID> page, and it will go to the <Trans Pin> page. This page is used to set the pins of each winding of the transformer, connect the pins in series, and connect in parallel.
  • Page 101: Series Pins Setup

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test The following is the pin setting screen of PRI: A2 (PRI: A2 is used for Np2 as the primary winding): 7.10.2 Series Pins Setup Before setting the transformer series pin, you need to confirm the parameters of the series test. For example, the Lx inductance needs to set the series pin.
  • Page 102: Parallel Pins Setup

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test Below is the short-circuit pin setting when series transformers Ns1 and Ns2 test TURN. 7.10.3 Parallel Pins Setup Before setting the transformer parallel pins, you need to confirm the parameters for parallel measuring. For example, the TURN ratio needs to set the parallel pins.
  • Page 103: Trans Condition

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11 <Trans Condition> This page contains two tables: The upper table is the parameter test condition table, which is mainly used to set the parameters and measurement conditions of the transformer under test. The parameters that can be measured are: •...
  • Page 104: Frequency, Voltage, Switch And Scanning Sequence

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.1 Frequency, Voltage, Switch and Scanning Sequence There are multiple parameter variables corresponding to each parameter: frequency, level, deviation, average, delay, equivalence, scan sequence and switch. Touch or move the cursor to the corresponding setting area and modify the corresponding parameters according to the menu prompts to meet user needs.
  • Page 105: Turn Measurement Conditions Setup

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.2 TURN Measurement Conditions Setup On the <Trans Conditions> page, touch or move the cursor to the Turn column of the test condition table to set the Turn parameters. 7.11.2.1 Turn Mode When touching the TURN setting area or moving the cursor to the TURN setting area, the TURN mode can be set in the menu on the right.
  • Page 106 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test If the primary signal is forcibly enlarged, then the voltage generated by secondary multi-winding will be high and it may be over the range of the instrument and thus further affect the test accuracy.
  • Page 107 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.2.3 Turn Phase Setup When setting the limit of the number of turns, you can set the secondary winding phase for sorting; "+" means the same direction, and "–" means the opposite direction.
  • Page 108 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.2.4 Turn Ratio Short Pins When setting the turn ratio short pins, you can use soft keys . and ~ to input multiple pins; the maximum number of pins can be saved here is 48.
  • Page 109: Lx Measurement Conditions Setup

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.3 Lx Measurement Conditions Setup On the <Trans Condition> page, touch or move the cursor to the Lx column of the test condition table to set the Lx parameters. 7.11.3.1 Lx Limit Setup The Lx limit setting table is used to set the Lx standard value, upper and lower limits, bias, multi-frequency, multi-level, Q standard value and Q upper and lower limits of each transformer winding.
  • Page 110 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.3.2 Add DC Bias to Lx The instrument can use a built-in DC bias source of 100mA or 2A. When setting the current value, you can set a maximum value of 2A for the sake of compatibility of storage files.
  • Page 111 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.3.4 Lx Multi-Level Setup If you need to use different levels to test different Lx pins of the transformer, in the transformer Lx limit setting table, touch or move the cursor to the Lx level area. After inputting the level in this area, the test will automatically use this.
  • Page 112: Lk Measurement Conditions Setup

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.4 Lk Measurement Conditions Setup On the <Trans Condition> page, touch or move the cursor to the Lk column of the test condition table to set the Lk parameters. 7.11.4.1 Lk Limit Setup The Lk limit setting table is used to set the Lk standard value, upper and lower limits, multi-frequency, multi- level, and short-circuit pins of each winding of the transformer.
  • Page 113 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.4.2 Lk Multi-Frequency Setup If you need to use different frequencies to test different Lk pins of the transformer, in the transformer Lk limit setting table, touch or move the cursor to the frequency area of Lk. After inputting the frequency in this area, the frequency here will be automatically used during the test.
  • Page 114 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.4.4 Lk Turn-Ratio Short Pins When setting the leakage inductance short pins, you can use the soft keys . and ~ to input multiple pins; the maximum number of pins can be saved here is 48.
  • Page 115: Cx Measurement Conditions Setup

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.5 Cx Measurement Conditions Setup On the <Trans Condition> page, touch or move the cursor to the Cx column of the test condition table to set the Cx parameters. 7.11.5.1 Cx Limit Setup The following figure shows the example transformer.
  • Page 116 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test Cx Pin(+), Pin(-) and Short Pins When setting the Cx short pins, you can use the soft key﹒and ~ to input multiple pins, where a maximum of 24 pins can be saved.
  • Page 117 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.5.2 Cx Multi-Frequency Setup If you need to use different frequencies to test different Cx pins of the transformer, in the transformer Cx limit setting table, touch or move the cursor to the frequency area of Cx. After inputting the frequency in this area, the frequency here will be used automatically during the test.
  • Page 118 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test v1.1...
  • Page 119: Zx Measurement Conditions Setup

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.5.4 D Limit Setup In the transformer Cx limit setting table, touch or move the cursor to D-Std, D-Low and D-High of Cx to set. Note: The D value test switch is set at the Cx switch.
  • Page 120 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.6.1 Zx Limit Setup The Zx limit setting table is used to set the Zx standard value, upper and lower limit, bias, multi-frequency and multi-level. Touch the Zx limit setting table, or move the cursor to the Zx limit setting area, and use the numeric keys, corresponding magnification or [ENTER] key to set.
  • Page 121 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.6.3 Zx Multi-Frequency Setup If you need to use different frequencies to test different Zx pins of the transformer, in the transformer Zx limit setting table, touch or move the cursor to the frequency area of Zx. After inputting the frequency in this area, the frequency here will be used automatically during the test.
  • Page 122: Acr Measurement Conditions Setup

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.7 ACR Measurement Conditions Setup On the <Trans Condition> page of the transformer scan, touch or move the cursor to a column of ACR in the test condition table to set the ACR parameters.
  • Page 123 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.7.2 ACR Multi-Frequency Setup If you need to use different frequencies to test different ACR pins of the transformer, in the transformer ACR limit setting table, touch or move the cursor to the frequency area of ACR. After inputting the frequency in this area, the frequency here will be used automatically during the test.
  • Page 124: Dcr Measurement Conditions Setup

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.8 DCR Measurement Conditions Setup On the <Trans Condition> page of the transformer scan, touch or move the cursor to a column of DCR in the test condition table to set DCR parameters.
  • Page 125: Ps Measurement Conditions Setup

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.9 PS Measurement Conditions Setup On the <Trans Condition> page of the transformer scan, touch or move the cursor to a column of PS in the test condition table to set PS parameters.
  • Page 126 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.9.2 PS Test Pin Setup This page is used to set the shorted pins. In the process of auto scanning test, the instrument will test DCR of each set pin and make comparison with the PS low limit set on PS limit setup page.
  • Page 127: Bal Measurement Conditions Setup

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.10 BAL Measurement Conditions Setup On the <Trans Condition> page of the transformer scan, touch or move the cursor to a column of BAL in the test condition table to set BAL parameters.
  • Page 128 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.10.2 BAL Absolute Value Setup In the equation used to judge the balance of the two windings, to set whether the final result is compared with the absolute value. For example, for the equation Lx1–Lx2: •...
  • Page 129: Handler Mode Function

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test • DCR1–DCR2 • DCR1–DCR2 • DCR1–DCR2 • DCR1–DCR2 When the absolute value switch is changed, it will affect the final result of this equation. 7.11.11 Handler Mode Function After a scan test, the Handler outputs the final sorting signal according to the settings here.
  • Page 130 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test v1.1...
  • Page 131: Parameter Copy Function

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.11.12 Parameter Copy Function After setting the setting parameters of the transformer A board, such as Pin-to-Fixture, Transformer Pins and measurement conditions, use the parameter copy function to automatically copy the parameters of the A board to the B~L boards.
  • Page 132: Trans Scan

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.12 <Trans Scan> After all settings are completed, directly press the [DISP] key to enter the <Trans Scan> page. Before starting the test, it is usually best to press the [FILE] key to enter the <File Management> page, and save the settings for future use.
  • Page 133: Function Keys Under This Page

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.12.2 Function Keys under This Page • [TRIGGER] is used to start the instrument for scan measuring. • [RESET] is used to interrupt an ongoing scan test. • [KEYLOCK] locks the keyboard. After locking the keyboard, the user can also perform other operations such as scan test, but the parameter settings cannot be modified.
  • Page 134: Pri Page-Turning Function

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.12.3 PRI Page-Turning Function In the transformer scan measurement test interface, after measuring a transformer with multiple primary windings, you can switch the primary (PRI) page with the knob to view the measurement results, and the untested pages will be ignored directly.
  • Page 135: Bal Balance Parameter Display

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.12.5 BAL Balance Parameter Display After the scan is over, press the [DISP] key to switch to display the result value between the two windings of the BAL. 7.13 <File> Page of Transformer Scan...
  • Page 136: Transformer Scan Setup File (*.T40)

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.13.1 Transformer Scan Setup File (*.t40) The internal space of the instrument can save a certain number of scan settings files (*.t40 files); the number is determined by the remaining internal storage space. The scan settings files can also be displayed/operated through an external storage USB flash drive, and supports large-capacity USB flash drives (FAT32 format) read and write functions.
  • Page 137: Transformer Deviation-Deduction

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test • Copy to E:\ • Rename • Delete • New folder • Select Save.t40 to save the settings file. • After pressing the save soft key, the screen will display the soft keyboard.
  • Page 138 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test • Put standard transformer to test fixture and lock it, press [START] in scan box several times to get a stable test value; • Press [Deviation] to enter the <Trans Deviation> page.
  • Page 139: Focus

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test If you need to save the deduction value, press the soft key [FILE] to enter the file management page, and follow the on-screen prompts to save the file so that the same transformer can be measured after the next restart.
  • Page 140 ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test Click the parameter title to focus scan the parameter selected; Click [Pin] to focus scan all the data to be tested on a page. v1.1...
  • Page 141: Split

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.15 Split When there are few transformer test parameters, and multiple transformers need to be tested at the same time, the split function can be modified to meet the test requirements.
  • Page 142: Frequently Asked Questions And Answers On Transformer Scans

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.16 Frequently Asked Questions and Answers on Transformer Scans 7.16.1 High and Low Limits During measuring, you find the test value of transformer is obviously and seriously unqualified, but the judge table still displays that the parameter is qualified.
  • Page 143: Poor Lk Accuracy

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.16.5 Poor Lk Accuracy If the sheet metal is oxygenized, torn or deformed, or the lead resistance of a user-made test fixture is too large, it will cause Lk deviation.
  • Page 144: User-Made Test Fixture

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.17 User-Made Test Fixture There are many kinds of transformers, which means our company can’t offer a test fixture to each transformer. This requires the user to make a test fixture based on some specific principles.
  • Page 145: Example Of Using St1801-Ext11A(5.0)-B Pin Signal

    ST2840 Series Automatic Transformer Test System Transformer Auto Scanning Test 7.17.2 Example of Using ST1801-EXT11A(5.0)-B Pin Signal v1.1...
  • Page 146: Performance And Test

    ST2840 Series Automatic Transformer Test System Performance and Test 8 Performance and Test 8.1 Measurement Function 8.1.1 Parameter and Symbol 8.1.1.1 LCR Module Parameter Parameter Parameter Meaning Parameter Meaning Name Name Equivalent Parallel Capacitance Equivalent Series Capacitance Equivalent Parallel Inductance...
  • Page 147: Measurement Combination

    ST2840 Series Automatic Transformer Test System Performance and Test 8.1.2 Measurement Combination Four parameters can be selected freely, regardless of primary and secondary parameters. 8.1.3 Mathematical Operation Operation between the measurement value and the programmable nominal value: • Absolute Deviation ∆ABS •...
  • Page 148: Measurement Speed

    ST2840 Series Automatic Transformer Test System Performance and Test 8.1.9 Measurement Speed • Fast+: about 1800 measurements/s (0.55ms/measurement) • Fast: about 300 measurements/s (3.3ms/measurement) • Medium: about 11 measurements/s (90ms/measurement) • Slow: about 4 measurements/s (240ms/measurement) The fast+, fast and medium speed will slow down when the frequency is below 10kHz.
  • Page 149: Output Impedance

    ST2840 Series Automatic Transformer Test System Performance and Test 8.2.4 Output Impedance Choose between 30Ω±4% or 100Ω ±2%. 8.2.5 Monitor for Measurement Signal Level Frequency Range Accuracy ≤1MHz ~20V ± (3% × reading + 0.5mV) Voltage >1MHz ~15V ± (6% × reading + 0.5mV) ≤1MHz...
  • Page 150: Bias Current Source

    ST2840 Series Automatic Transformer Test System Performance and Test 8.2.8 2A Bias Current Source Range Resolution Accuracy (I > 5mA) 0-2A ± (2% × set value + 2mA) 8.3 Measurement Accuracy Measurement accuracy includes: • Stability • Temperature Coefficient •...
  • Page 151: D Accuracy

    ST2840 Series Automatic Transformer Test System Performance and Test When D ≥ 0.1, the accuracy factor A of L, C, X, B is to be multiplied by When Q ≥ 0.1, the accuracy factor A of R, G is to be multiplied by 8.3.2 D Accuracy...
  • Page 152: Rp Accuracy

    ST2840 Series Automatic Transformer Test System Performance and Test • is the value of the tested L with the unit [H]; • is the accuracy of D; • F is the measurement frequency. 8.3.6 Rp Accuracy When D (value of the tested D) ≤ 0.1, the accuracy of R is defined as: ...
  • Page 153: Lk Accuracy

    ST2840 Series Automatic Transformer Test System Performance and Test 8.3.9 Lk Accuracy Inductance L accuracy + 0.2% 8.3.10 Turns Ratio Accuracy ± A × A (1 + 1Ω / Z + 1 / Q) [%] ± 0.002 At medium and slow measurement speed, A = 0.25...
  • Page 154: Accuracy Factor

    ST2840 Series Automatic Transformer Test System Performance and Test 8.3.11 Accuracy Factor Figure 8-1 Basic Measurement Accuracy Factor A The basic accuracy A can be read from the diagram as follows: Determine the intersection point of the straight line corresponding to the expected measured value with the measuring frequency.
  • Page 155 ST2840 Series Automatic Transformer Test System Performance and Test 2.5×50mV 500mV Figure 8-2 shows the correction factor A described in the table above in a visual format: Figure 8-2 Correction Factor A Curve v1.1...
  • Page 156 ST2840 Series Automatic Transformer Test System Performance and Test Table 8-2 Impedance Rate Factors K and K Speed Frequency −  −  1 )( ≤ 1.2kHz −  1 )( 1.2 kHz < f ≤ 8kHz −  Medium...
  • Page 157 ST2840 Series Automatic Transformer Test System Performance and Test Note: At the same time, when the cable length is extended, K should be multiplied the following value. Table 8-4 Multiplied Values to Kb Based on Cable Length Cable Length L [m] ≤...
  • Page 158: Safety Requirements

    18~28 28~40 8.4 Safety Requirements The devices of the ST2840 series correspond to protection class I. 8.4.1 Insulation Resistance Under normal operating conditions, the insulation resistance between the power terminal and the device housing must not be less than 50MΩ.
  • Page 159: Used Instruments And Devices

    ST2840 Series Automatic Transformer Test System Performance and Test 8.5.2 Used Instruments and Devices Instrument/Device Specification 100pF 1000pF 10000pF 0.02% Standard Capacitor D is known 10nF 0.1uF 10Ω 100Ω Standard Resistor AC 1kΩ 0.02% 10kΩ 100kΩ 0.1Ω 1Ω 10Ω Standard Resistor DC 100Ω...
  • Page 160: Test The Signal Level

    ST2840 Series Automatic Transformer Test System Performance and Test 8.5.4 Test the Signal Level Connect a multimeter in the AC voltage setting between Hcur and the ground. Set the measurement level to 10mV, 20mV, 100mV, 200mV, 1V, 2V, 10V and 20V, and check that the reading is within the limits given in this chapter.
  • Page 161 ST2840 Series Automatic Transformer Test System Performance and Test 8.5.6.3 Accuracy of Z Measurement Frequency Function Level Range Bias Speed (test each respectively) 100Hz • 1kHz • Z-θ AUTO Slow 10kHz • 100kHz • Open- and short-circuit correction should be performed before measurement. Connect your AC standard resistors of 10Ω, 100Ω, 1kΩ, 10kΩ...
  • Page 162: Command Reference

    ST2840 Series Automatic Transformer Test System Command Reference 9 Command Reference 9.1 GPIB Common Commands *RST *TRG *IDN *TST • • • • *SRE *ESR *STB • • • *ESE • *OPC *CLS • • The *RST command resets the instrument.
  • Page 163 ST2840 Series Automatic Transformer Test System Command Reference Data will be returned after all points have been tested. The data Sequence format is the same as above. Clike index, parameter 1 result, parameter 2 result, parameter 3 Single- result, parameter 4 result,...
  • Page 164: Scpi Command

    ST2840 Series Automatic Transformer Test System Command Reference 9.2 SCPI Command SCPI (Standard Command for Programmable Instruments) is an ASCII-based instrument command language used in test and measurement instruments. SCPI commands are based on a hierarchical structure (also known as a tree system).
  • Page 165: Display Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference • NR2: fix-point number, e.g.: 12.3 • NR3: floating-point number, e.g.: 12.3E+5 • NL: carriage key, integer: 10 • ˆEND: EOI signal in IEEE-488 Subsystem commands of this series of instruments: •...
  • Page 166 ST2840 Series Automatic Transformer Test System Command Reference Page Name Meaning Query Return Content MEASurement MEASurement Measurement Display LIST LIST List Display TSMEas Trace Sweep Display TSMEas MSETup MSETup Measurement Setup LTABle LTABle Limit Setup LSETup LSETup List Setup TSSEtup...
  • Page 167: Frequency Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference Example: :DISP:PAGE MEAS Enter the measurement display page; :DISP:PAGE MSET Enter the measurement setup page; :DISP:PAGE? Return the currently displayed page, please refer to the table above. 9.2.2 FREQuency Subsystem Commands Used to set the measurement frequency of the instrument.
  • Page 168: Current Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference Example: :VOLT 1.2 Set the AC voltage to 1.2V; :VOLT? Return the current AC voltage; 9.2.3.2 DC Voltage Used to set the DC voltage of the instrument. Command Syntax: :VOLT:DC? :VOLT:DC < float | MIN | MAX>...
  • Page 169: Amplitude Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference 9.2.5 AMPLitude Subsystem Commands Used to set the measurement speed and average times of the instrument. Command Syntax: :APER? :APER <FAST+ | FAST | MED | SLOW>[,int] Parameter: FAST+ Fast+ FAST Fast...
  • Page 170: Bias Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference :OUTP:HPOW EXT Set the external bias source :OUTP:HPOW? Return the bias source mode 9.2.6.2 DC Isolation Used to set the DC isolation function switch of the instrument Command Syntax: :OUTP:DC:ISOL? :OUTP:DC:ISOL <0|1 | ON|OFF >...
  • Page 171 ST2840 Series Automatic Transformer Test System Command Reference 9.2.7.2 Bias Voltage Set the internal bias voltage of the instrument Command Syntax: :BIAS:VOLT? :BIAS:VOLT <float | MIN | MAX> Parameter: float Represents the floating-point data Set the minimum possible value Set the maximum possible value Example: :BIAS:VOLT 1.2...
  • Page 172: Trigger Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference Parameter: 0|AUTO AUTO 1|FIX Example: :BIAS:POL:AUTO 0 Set the bias polarity to AUTO :BIAS:POL:AUTO 1 Set the bias polarity to FIX :BIAS:POL:AUTO? Return bias polarity status 9.2.8 TRIGger Subsystem Commands 9.2.8.1 Trigger Command Used to trigger a singular measurement.
  • Page 173: Amplitude Auto Level Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference 9.2.8.3 Trigger Delay Used to set the trigger delay time of the instrument. Command Syntax: :TRIG:DEL? :TRIG:DEL<float | MIN | MAX> Parameter: float Represents the floating-point data Set the minimum possible value...
  • Page 174: Output Resister Internal Resistance Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference 9.2.10 Output RESister Internal Resistance Subsystem Commands Used to set the output resistance mode of the instrument. Command Syntax: :ORES? :ORES<100|30> Parameter: Set the output resistance of the instrument to 100Ω Set the output resistance of the instrument to 30Ω...
  • Page 175 ST2840 Series Automatic Transformer Test System Command Reference Parameter Parameter Parameter Meaning Parameter Meaning Name Name Equivalent Parallel Capacitance Equivalent Series Capacitance Equivalent Parallel Inductance Equivalent Series Inductance Equivalent Parallel Resistance Equivalent Series Resistance Conductance Susceptance Absolute Value of Impedance...
  • Page 176 ST2840 Series Automatic Transformer Test System Command Reference 9.2.11.2 AC Range Used to set the AC range of the instrument. Command Syntax: :FUNC:IMP:RANG? :FUNC:IMP:RANG <float> Parameter: float Indicates the floating point number, refer to the value of the equivalent resistance of the DUT...
  • Page 177 ST2840 Series Automatic Transformer Test System Command Reference float Indicates the floating point number, refer to the value of the equivalent resistance of the DUT Example: :FUNC:DCR:RANG 1k Select the best range for 1kΩDCR :FUNC:DCR:RANG 1000 Select the best range for 1kΩDCR :FUNC:DCR:RANG 1200 Select the best range for 1.2kΩDCR...
  • Page 178 ST2840 Series Automatic Transformer Test System Command Reference Example: :FUNC:SMON:IAC 0 Turn OFF current monitoring :FUNC:SMON:IAC 1 Turn ON current monitoring :FUNC:SMON:IAC? Return the current monitoring switch status 9.2.11.7 Deviation and Reference Used to set the deviation measurement mode of the instrument.
  • Page 179: Comparator Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference Example: :FUNC:DEV1:REF 10 Set the deviation reference of parameter 1 to 10 :FUNC:DEV2:REF:FILL Measure once, the result of parameter 2 is used as the deviation reference value :FUNC:DEV4:REF? Return the deviation reference value of parameter 4...
  • Page 180 ST2840 Series Automatic Transformer Test System Command Reference Example: :COMP 0 Turn OFF the comparison function :COMP 1 Turn ON the comparison function :COMP? Return the comparison function status 9.2.12.2 COUNt Counting Function Used to turn on/off the comparison counting function of the instrument.
  • Page 181 ST2840 Series Automatic Transformer Test System Command Reference 9.2.12.5 Limit Mode Used to set the instrument's comparison limit mode. Command Syntax: :COMP:MODE? :COMP:MODE<TOL|SEQ> Parameter: Tolerance mode Sequential mode Example: :COMP:MODE TOL Set the comparison limit to tolerance mode :COMP:MODE SEQ...
  • Page 182 ST2840 Series Automatic Transformer Test System Command Reference 9.2.12.7 Sequential mode Limit Values Used to set the upper and lower limit data of the sequential mode of the comparison function (this function is accessible when the limit mode is set to sequential mode).
  • Page 183: List Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference Command Syntax: :COMP:BIN<n>:SW? :COMP:BIN:SW<0|1 | ON|OFF > Parameter: BIN number index, the value is 1~10 0 | OFF 1 | ON Example: :COMP:BIN1:SW 0 Turn OFF the comparison function of BIN 1...
  • Page 184 ST2840 Series Automatic Transformer Test System Command Reference STEP Single-Step Example: :LIST:MODE SEQ Set to Sequential mode :LIST:MODE STEP Set to Single-Step Mode :LIST:MODE? Return the list sweep mode 9.2.13.3 Clear Used to clear the setting data of all sweep points.
  • Page 185 ST2840 Series Automatic Transformer Test System Command Reference Example: :LIST:FREQ 20,30,40 Set the frequency of the first 3 points; :LIST:FREQ1 20,30,40,1k,2k Set the frequency of the first 5 points; :LIST:FREQ6 20, 30, 40, 1k, 2k Set the frequency of 6~10 points;...
  • Page 186 ST2840 Series Automatic Transformer Test System Command Reference Parameter: Start from the n point Represents the floating-point number of sweep point n Represents the floating-point number of sweep point n+1 f... Represents the floating-point number of sweep point n… Example: :LIST:CURR 1m, 2m, 3m, 4m, 2m Set the current of the first 5 points;...
  • Page 187 ST2840 Series Automatic Transformer Test System Command Reference 9.2.13.8 Bias Current Used to set the sweep point bias current / set the bias current of several points starting from the n point. Command Syntax: :LIST:BIAS:CURR[n]? :LIST:BIAS:CURR[n] <fn>[,fn+1][,fn+2]… Parameter: Start from the n...
  • Page 188 ST2840 Series Automatic Transformer Test System Command Reference Parameter Parameter Parameter Meaning Parameter Meaning Name Name Equivalent Parallel Capacitance Equivalent Series Capacitance Equivalent Parallel Inductance Equivalent Series Inductance Equivalent Parallel Resistance Equivalent Series Resistance Conductance Susceptance Absolute Value of Impedance...
  • Page 189 ST2840 Series Automatic Transformer Test System Command Reference Example: :LIST:FUNC:IMPA CP,CS,LP Set the parameter function of point 1~3 of the first parameter :LIST:FUNC:IMPB5 CP,CS Set the parameter function of point 5~6 of the second parameter :LIST:FUNC:IMPC? Return all point parameter functions of the third parameter...
  • Page 190: Trace Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference Example: :LIST:BAND1 OFF Clear the limit data of the 4parameters of point 1 :LIST:BAND2 A,1,2 Set the function of point 5~201 of the second parameter to CP :LIST:BAND201 D,1.1,2.2 Set the function of point 3~15of the 4th parameter to LP :LIST:BAND9? Return the upper and lower limits of the 4 parameters of point 9, loA, hiA…...
  • Page 191 ST2840 Series Automatic Transformer Test System Command Reference Parameter: …means scanning 51 points …means scanning 101 points …means scanning 201 points …means scanning 401 points …means scanning 801 points Example: :TSSE:POINT 51 Set LCR to scan 51 points :TSSE:POINT 101...
  • Page 192 ST2840 Series Automatic Transformer Test System Command Reference 9.2.14.3 Sweep Range Used to set the LCR sweep range (start and stop points). Command Syntax: :TSSE:SWEEP? :TSSE:SWEEP <float,float> Parameter: float Represents floating-point string format data, such as "3.14159"; Example: :TSSE:SWEEP 1,100...
  • Page 193 ST2840 Series Automatic Transformer Test System Command Reference Example: :TSSE:FORM LIN Set the LCR sweep coordinate as linear coordinates :TSSE:FORM LOGX Set the LCR sweep coordinate as the X axis logarithm :TSSE:FORM? Return the LCR sweep coordinate mode 9.2.14.6 Max-Min Used to turn on/off the LCR curve max-min function.
  • Page 194: Handler Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference Parameter Parameter Parameter Meaning Parameter Meaning Name Name Equivalent Parallel Capacitance Equivalent Series Capacitance Equivalent Parallel Inductance Equivalent Series Inductance Equivalent Parallel Resistance Equivalent Series Resistance Conductance Susceptance Absolute Value of Impedance...
  • Page 195 ST2840 Series Automatic Transformer Test System Command Reference Parameter: 0 | OFF …means default 1 | ON …means custom 2 | BUS …means bus control Example: :HAND:STAT 0 Set the Handler Mode to default; :HAND:STAT OFF Set the Handler Mode to default;...
  • Page 196: Fetch? Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference 9.2.15.3 Bus Output Used to control the LCR Handler bus output. Command Syntax: :HAND:OUTP:LVHI <…> :HAND:OUTP:LVLO <…> Parameter: <…> is a list format, such as 1, 2, 4, 7, 14, 24, etc., corresponding to the table position displayed by the instrument.
  • Page 197 ST2840 Series Automatic Transformer Test System Command Reference Comparison Results Description No Comparison PASS Other FAIL Clike index, parameter 1 result, parameter 2 result, parameter 3 result, Trace parameter 4 result, Sweep Example: 2,1.12345E2,1.23456E-2,1.11023E2,-1.12345E2 Serial number index, parameter name, parameter result comparison result, Example: 2,lx,1.12345E2,1...
  • Page 198: Correction Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference 9.2.16.4 Query Trace Sweep Results Command Syntax: :FETCh:TRACE:X[1~801]? Return the abscissa of the trace sweep :FETCh:TRACE:Y<1|2|3|4>? Return the measurement result of the specified curve (all points) :FETCh:TRACE:PT<1~801>? Return the result of the specified point (x,y1,y2,y3,y4)
  • Page 199 ST2840 Series Automatic Transformer Test System Command Reference Example: :CORR:OPEN Perform the open-circuit correction on the preset point, no return :CORR:OPEN ACK Perform the open-circuit correction on the preset point Return 1 for success and 0 for failure. 9.2.17.2 Open-Circuit Correction Function Used to turn on/off the open-circuit correction function.
  • Page 200 ST2840 Series Automatic Transformer Test System Command Reference Parameter: 0 | OFF 1 | ON Example: :CORR:SHOR:STAT 0 Turn OFF the short-circuit correction function :CORR:SHOR:STAT 1 Turn ON the short-circuit correction function :CORR:SHOR:STAT? Return the short-circuit correction function status 9.2.17.5 Load Correction Function Used to turn on/off the load correction function.
  • Page 201 ST2840 Series Automatic Transformer Test System Command Reference Example: :CORR:LOAD:TYPR LSRS Set the load type to LS-RS :CORR:LOAD:TYPR LSQ Set the load type to LS-Q :CORR:LOAD:TYPR CPD Set the load type to CP-D :CORR:LOAD:TYPR? Return the load type 9.2.17.7 Cable Length Used to set the correction cable length of the instrument.
  • Page 202 ST2840 Series Automatic Transformer Test System Command Reference 9.2.17.9 Query the User Correction Data Command Syntax: :CORR[:USE]:DATA[n]? Parameter: The value is 1~10, which indicates the index of n of dot frequency clearing point Example: :CORR:DATA? Return the open circuit value, short circuit value, load correction value of all set points <open1 A>,<open1 B>,<short1 A>,<short1 B>,<load1 A>,<load1 B>,<open2 A>,<open2 B>,<short2...
  • Page 203 ST2840 Series Automatic Transformer Test System Command Reference 9.2.17.10 Query the Operation Time of User Correction Command Syntax: :CORR:DATE <LAST|OPEN|SHORT|DCR|DCROPEN|DCRSHORT> :CORR:DATE<n> <OPEN|SHORT|LOAD> Parameter: DATE<n> n indicates the n frequency point LAST Indicates the time of the last clearing operation OPEN/SHORT/LOAD...
  • Page 204 ST2840 Series Automatic Transformer Test System Command Reference Parameter: Subscript of frequency point index, value 1~10 0 | OFF 1 | ON Example: :CORR:SPOT1:STAT 0 Turn OFF frequency point 1 :CORR:SPOT3:STAT 1 Turn ON frequency point 3 :CORR:SPOT10:STAT? Return the status of frequency point 10 9.2.17.12 Measurement Frequency...
  • Page 205 ST2840 Series Automatic Transformer Test System Command Reference 9.2.17.14 Short-Circuit Correction at Specific Frequency Used to execute a short-circuit correction at specific frequency points (frequency 1, frequency 2, etc.). Command Syntax: :CORR:SPOT<n>:SHOR Example: :CORR:SPOT1:SHOR Perform short-circuit correction at frequency point 1...
  • Page 206: Mass Memory Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference 9.2.18 Mass MEMory Subsystem Commands The Mass MEMory subsystem commands are used to save and load files. 9.2.18.1 Load Used to load saved files. Command Syntax: :MMEM:LOAD? :MMEM:LOAD <file> Parameter: file Specifies the path of the file to be loaded, relatively complete file path or the index number of the internal file fixed file, ranging from 1 to 50;...
  • Page 207: Tran Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference The corresponding relationship between the index number and the default file is as follows: Transformer Index No. LCR Mode Transformer Scan Mode Single-Group Mode LCR.sda/LCR2.sda… in the TRT.trt/TRT2.trt… in the root ST2840.t40/ST28402.t40… in...
  • Page 208 ST2840 Series Automatic Transformer Test System Command Reference 9.2.19.2 Single-Group Comparison Function Used to turn on/off the single-group comparison function Command Syntax: :TRT:COMP? :TRT:COMP <OFF|0|ON|1> Parameter: OFF | 0 ON | 1 Example: :TRT:COMP 0 Turn OFF the comparison function...
  • Page 209 ST2840 Series Automatic Transformer Test System Command Reference Example: :TRT:FUNC1 CP Set the CP function parameter of point 1 :TRT:FUNC5 NS Set the NS function parameter of point 5 :TRT:FUNC12NSNP Set the NSNP function parameter of point 12 :TRT:FUNC1? Return the function parameters of point 1 9.2.19.4 Frequency...
  • Page 210 ST2840 Series Automatic Transformer Test System Command Reference 9.2.19.6 Bias Voltage Used to set the bias voltage of the sweep point. Command Syntax: :TRT:BIAS:VOLT<n>? :TRT:BIAS:VOLT<n><fn> Parameter: Specifies the index of the sweep point, ranging from 1 to 12 Represents the floating-point number of sweep point n Example: :TRT:BIAS:VOLT1 1.2...
  • Page 211 ST2840 Series Automatic Transformer Test System Command Reference Parameter: Specifies the index of the sweep point, ranging from 1 to 12 Represents the floating-point number of sweep point n Example: :TRT:TURN1 1 Set the relative reference value of point 1 to 1 turn;...
  • Page 212 ST2840 Series Automatic Transformer Test System Command Reference Example: :TRT:NOM1 10.2 Set the comparison nominal value of point 1 to 10.2 :TRT:NOM2 2.3 Set the comparison nominal value of point 2 to 2.3 :TRT:NOM3 62.5 Turn OFF the comparison nominal value of point 3 to 62.5 :TRT:NOM2? Return the comparison nominal value of point 2.
  • Page 213 ST2840 Series Automatic Transformer Test System Command Reference 9.2.19.13 Average Set the average number of sweep points Command Syntax: :TRT:AVG[n]? :TRT:AVG[n] <int> Parameter: Specifies the index of the sweep point, ranging from 1 to 12 The average number of sweep points n, ranging from 1 to 255...
  • Page 214: System Subsystem Commands

    ST2840 Series Automatic Transformer Test System Command Reference 9.2.19.15 Include/Exclude Sweep Point Used to turn on/off measurement of any particular sweep point. Command Syntax: :TRT:STAT[n]? :TRT:STAT[n] <OFF|0|ON|1> Parameter: Specifies the index of the sweep point, ranging from 1 to 12...
  • Page 215 ST2840 Series Automatic Transformer Test System Command Reference 9.2.20.2 Key Sound Used to turn on/off the keypress sound Command Syntax: :SYST:BEEP? :SYST:BEEP <OFF|ON|0|1> Parameter: 0 | OFF 1 | ON Example: :SYST:BEEP? Return the current key sound setup :SYST:BEEP 0...
  • Page 216 ST2840 Series Automatic Transformer Test System Command Reference 9.2.20.4 FAIL Sound Used to set the FAIL sound effect. Command Syntax: :SYST:BEEP:FAIL? :SYST:BEEP:FAIL <OFF|TwoShort|LowLong|HighShort|HighLong> Parameter: Others correspond respectively to two short, low long, high short, high long. Example: :SYST:BEEP:FAIL? Return the currently selected FAIL sound effect...
  • Page 217 ST2840 Series Automatic Transformer Test System Command Reference Example: :SYST:RS232:BAUD? Return RS232 baud rate :SYST:RS232:BAUD 4800 Set the RS232 baud rate to 4800 :SYST:RS232:BAUD 9600 Set the RS232 baud rate to 9600 :SYST:RS232:BAUD 19200 Set the RS232 baud rate to 19200...
  • Page 218 ST2840 Series Automatic Transformer Test System Command Reference 9.2.20.8 LAN Configuration: Port Number Used to set the LAN port number. Command Syntax: :SYST:LAN:PORT? :SYST:LAN:PORT<int> Parameter: Value Range: consult the network management, recommended 1~65536; the factory default value is 45454. Example:...
  • Page 219 ST2840 Series Automatic Transformer Test System Command Reference Example: :SYST:LAN:GAT? Return LAN port gateway address :SYST:LAN:GAT 192.168.22.1 Set the LAN port gateway address 9.2.20.12 LAN Configuration: Subnet Mask Address Used to set the subnet mask address of the LAN port.
  • Page 220: Modbus Commands

    ST2840 Series Automatic Transformer Test System Command Reference 9.2.20.15 Update Command Used to update the system firmware. Command Syntax: :SYST:UPDATE APP Example: :SYST:UPDATE APP Call the default file in the USB flash drive to upgrade Note: In addition, we have the software for the host computer to control the firmware update of the instrument, which can directly send the update file from the host computer and perform the update without the need for a USB flash drive.
  • Page 221: Reading The Command

    ST2840 Series Automatic Transformer Test System Command Reference High Registers and Low Registers: This indicates that the number of registers written in this operation and the size of each register is 2 bytes. Total Number of Bytes: This represents the total number of bytes written in this operation.
  • Page 222: Crc16 Calculation Method - Look-Up Table Method

    ST2840 Series Automatic Transformer Test System Command Reference To read the test value of the voltage in the current mode, the storage address is 0x00A0, the instrument number is 8. Then the command is: 0x08 0x03 0x00 0xA0 0x00 0x02...
  • Page 223 ST2840 Series Automatic Transformer Test System Command Reference Low Byte Value Table: const BYTE chCRCLTalbe[] = 0x00, 0xC0, 0xC1, 0x01, 0xC3, 0x03, 0x02, 0xC2, 0xC6, 0x06, 0x07, 0xC7, 0x05, 0xC5, 0xC4, 0x04, 0xCC, 0x0C, 0x0D, 0xCD, 0x0F, 0xCF, 0xCE, 0x0E,...
  • Page 224: Command Function Comparison Table

    ST2840 Series Automatic Transformer Test System Command Reference 9.3.4 Command Function Comparison Table Instrument Function Command Number of Data Data byte bus address code address data bytes Number Instruction function meaning Read/ The value Instrument Data write High+low High+low corresponding...
  • Page 225 ST2840 Series Automatic Transformer Test System Command Reference Current monitoring 0x0009 0x0001 0x000A 0x0005 float+char AC Level float+0/1(v/i) 0x000B 0x0001 0~14 AC range 0x000C 0x0005 float+char DC Bias float+0/1(v/i) 0x000D – – – – 0x000E 0x0001 1~256 Average BIAS polarity...
  • Page 226 ST2840 Series Automatic Transformer Test System Command Reference Deviation 3 0x1000 0x0001 Deviation 4 0x1001 0x0001 0x1002 0x0004 float Reference 3 0x1003 0x0004 float Reference 4 Reference value, set 1~4 reference values The value of n is 1~4, that is,...
  • Page 227 ST2840 Series Automatic Transformer Test System Command Reference 0x0025 0x0004 float BIN 5 Low 0x0026 0x0004 float BIN 5 High 0x0027 0x0004 float BIN 6 Low 0x0028 0x0004 float BIN 6 High 0x0029 0x0004 float BIN 7 Low 0x002A 0x0004...
  • Page 228 ST2840 Series Automatic Transformer Test System Command Reference Short-circuit correction 0x0032 0x0001 Meas Short DCR correction 0x0033 0x0001 Load correction function 0x0034 0x0001 Cable length 0x0035 – – – – 0x0036 0x0001 Calibration point 0x0037 0x0004 float Frequency setup Point switch...
  • Page 229 ST2840 Series Automatic Transformer Test System Command Reference Page switching; the value range of the parameter is as follows: Meas List Meas Trace Setup Limit List Setup Setup Trace System Setup Setup File User Corr Handler Single Single 0x0043 0x0001...
  • Page 230 ST2840 Series Automatic Transformer Test System Command Reference Fail Sound Two short 0x0045 0x0001 Two long High short High long Language 0x0045 0x0001 English Chinese Bias Source 100mA 0x004E 0x0001 External ST1778 0x0050 0x0001 1~201 List sweep point List sweep mode...
  • Page 231 ST2840 Series Automatic Transformer Test System Command Reference 0x005C 0x0004 float Step delay Low limit Byte meaning: 0x1006 0x0006 point index 0~200 abcd index 0~3 char+ float is the value char+ High Limit float Byte meaning: 0x1007 0x0006 point index 0~200...
  • Page 232: Description For Handler

    Description for Handler 10 Description for Handler ST2840 series instruments provide users with a Handler interface, which is mainly used for the output of sorting results. When the automatic component sorting test system is used, this interface provides the communication signal with the system, as well as the sorting result output signal.
  • Page 233 ST2840 Series Automatic Transformer Test System Description for Handler 10.1.1.2 Input Signal Optoelectronic isolation. Table 10-2 Input Signals Signal Overview /KEY_LOCK Key lock (locks the front panel keyboard, including the touch screen) /EXT_TRIG External Trigger: pulsewidth ≥ 1μS 10.1.1.3 Signal Line Description The Handler interface has 3 signals: comparison output, control output and control input.
  • Page 234 Output Factory measurement signal, please do not connect. External Trigger: When the trigger mode is set to Single, /EXT.TRIG Input your ST2840 instrument will be triggered by the positive- edge in this pin. External DC Voltage 2: EXT.DCV2 Input The DC provider pin for the optoelectronic coupling signal (/EXT_TRIG, /KeyLock, /ALARM, /INDEX, /EOM).
  • Page 235 Description for Handler When this single is effective, all the front panel function /KEY LOCK Input keys and touch screen of ST2840 are locked and no longer work. The External DC Voltage 1: The pull-up DC power provider pin for optoelectronic EXT.DCV1...
  • Page 236 ST2840 Series Automatic Transformer Test System Description for Handler delay measurement comparison display time time time time Time Minimum Maximum T1: trigger pulse-width T2: delay time 200us Display time + 200us T3: the trigger waiting time after /EOM output For the measurement time, please refer to section 8.1.9;...
  • Page 237: Electrical Features

    ST2840 Series Automatic Transformer Test System Description for Handler 10.1.2 Electrical Features As it is shown above, the signal definition for the comparison and the list sweep comparison are different. But the electrical feature is same. So the description can be applied to BIN comparison and list sweep comparison.
  • Page 238 ST2840 Series Automatic Transformer Test System Description for Handler Figure 10-4 Control Signal Output Circuit Figure 10-5 Comparison Result Signal Output Circuit v1.1...
  • Page 239: Handler Wiring Instructions Of Bin Sorting

    The factory default of ST2840 series instruments is external power supply. That is, pins 2 and 3 of JP500 are short-circuited, pins 2 and 3 of JP502 are short-circuited, JP501 is open, and JP503 is open. Therefore, be sure to connect the power supply to the external power supply pin when using it.
  • Page 240 ST2840 Series Automatic Transformer Test System Description for Handler If you need to use the internal power supply of the instrument, you need to change the jumper mode of JP500~JP503; please consult customer service for further information. Warning! 16, 17, and 18 are the 5V power supply inside the instrument and cannot be connected to any external power supply, otherwise the instrument will get damaged.
  • Page 241 ST2840 Series Automatic Transformer Test System Description for Handler Figure 10-7 PLC Wiring Diagram Where Handler Interface and Input Circuit Are Common Anode EXT.DCV1 and EXT.DCV2 can use the same set of external power supplies, or they can use different sets of power supplies.
  • Page 242: Using Operations

    ST2840 Series Automatic Transformer Test System Description for Handler Figure 10-8 PLC Wiring Diagram Where Handler Interface and Input Circuit Are Common Cathode 10.1.4 Using Operations After the Handler Interface is correctly wired to the PLC, set the limit list to use the comparison function. Then set the Handler Interface accordingly so that it can output/input signal.
  • Page 243: List Sweep

    ST2840 Series Automatic Transformer Test System Description for Handler 10.1.4.1 Comparison Function Setting Procedure The following operation steps are the steps of the comparison function using the Handler Interface (only for the functions of the automatic component analyzer). • Press the [SETUP] key, select <Limit Setup> in the menu on the right side of the display, and enter the limit setup page.
  • Page 244: Technical Description

    ST2840 Series Automatic Transformer Test System Description for Handler 10.2.2 Technical Description 10.2.2.1 List Sweep Output Signal Active low, open collector, optoelectronic isolation Table 10-5 Output Signals Signal Overview /BIN1~/BIN10 Result output PASS, FAIL /INDEX "Analog Measurement End" signal /EOM "End of All Measurements"...
  • Page 245 UNKNOWN test /INDEX Output terminal of the ST2840 can be connected to the next device under test (DUT). However, the comparison result signal does not register until the /EOM signal (see Figure 10-10).
  • Page 246 ST2840 Series Automatic Transformer Test System Description for Handler STEP: The /INDEX signal is asserted valid after the analog measurement of each sweep point is completed. However, the comparison result signal does not register until the /EOM signal (see Figure 10-10).
  • Page 247 ST2840 Series Automatic Transformer Test System Description for Handler Figure 10-9 Signal Area of the List Sweep Comparison Figure 10-10 Timing Chart (Sequential Mode) Figure 10-11 Timing Chart (Single-Step Mode) Note: • The setting time includes the correction ON/OFF time.
  • Page 248: Electrical Features

    ST2840 Series Automatic Transformer Test System Description for Handler 10.2.3 Electrical Features The meanings of some signals in the list sweep comparison function and the BIN sorting function are different. However, the electrical characteristics of these signals are the same in both operations, so refer to 10.1.2 for a description of the electrical characteristics of the list sweep sorting function.
  • Page 249: Technical Description

    ST2840 Series Automatic Transformer Test System Description for Handler 10.3.2 Technical Description 10.3.2.1 Output Signal Active low, open collector, optoelectronic isolation. Table 10-7 Output Signals Signal Overview /FAIL1~/FAIL12, Result output /PASS, /FAIL /INDEX "Analog Measurement End" signal /EOM "End of All Measurements" signal...
  • Page 250 / FAIL10 / FAIL11 External Trigger: /EXT.TRIG Input When the trigger mode is set to single, the ST2840 is triggered by a falling edge pulse signal applied to this pin. External DC Voltage 2: /EXT.DCV2 Input The DC provider pin for the optoelectronic coupling signal...
  • Page 251: Electrical Feature

    Factory measurement signal, please do not connect. With this signal, all the front panel function keys and touch /KEY LOCK Input screen of ST2840 are locked and no longer work. The External DC Voltage 1: EXT.DCV1 Input The pull-up DC power provider pin for optoelectronic coupling signal (/BIN1~/BIN10, /PASS, /FAIL).
  • Page 252: Wiring Instructions For Transformer Single-Group Measurement

    ST2840 Series Automatic Transformer Test System Description for Handler Table 10-10 Electric Features of the DC Isolation Output Output Rated Voltage Reference Ground for the Output Signal Maximum Current Circuit HIGH Comparison Signal: Internal Pull-Up Voltage: • /FAIL1~/FAIL12 ≤ 0.5V...
  • Page 253: Transformer Scan Handler Description

    ST2840 Series Automatic Transformer Test System Description for Handler The first parameter of the single group setting page corresponds to /FAIL1, the second parameter corresponds to /FAIL2, and so on; the twelfth parameter corresponds to /FAIL12. You can select ON in the comparison item on the single group setting page.
  • Page 254 ST2840 Series Automatic Transformer Test System Description for Handler 10.4.1.3 Signal Line Definition The Handler Interface of transformer scan uses three signals: compare output, control input, and control output. The following are the signal definitions of the Handler Interface when using this function: Comparison Output Signals: •...
  • Page 255 ST2840 Series Automatic Transformer Test System Description for Handler /GND Output – 24V- Output Cathode of cylinder power supply /EXT_GND Input The reference ground for external power EXT_VCC 24V+ Output Anode of cylinder power supply External DC Voltage: /EXT_VCC Input...
  • Page 256: Electrical Features

    ST2840 Series Automatic Transformer Test System Description for Handler /NS25 /NS26 /NS27 /NS28 /NS29 /NS30 The Internal Power +5V: It is not recommended to use the internal power! If you do, please Output ensure that the current is lower than 0.3A and the signal line is far from the disturbance source.
  • Page 257 ST2840 Series Automatic Transformer Test System Description for Handler Control Signal Internal Pull-Up Voltage: ST2840 GND ≤ 0.5V +5V~+24V 50mA • /TEST External Voltage: GND_EXT v1.1...
  • Page 258 ST2840 Series Automatic Transformer Test System Description for Handler Figure 10-12 Comparison Result Signal Output Circuit v1.1...
  • Page 259 ST2840 Series Automatic Transformer Test System Description for Handler Figure 10-13 Control Signal Output Circuit 10.4.2.2 DC Isolation Input Signal DC isolation input signals include EXT_RESET and EXT_START signals. The EXT_RESET signal (pin 22 of the Trans Handler) is input to the optocoupler LED (on the cathode side).
  • Page 260: Wiring Instructions For The Transformer Scan

    Figure 10-17. The factory default of ST2840 series instrument is external power supply. That is, pins 2 and 3 of J307 are short-circuited, pins 2 and 3 of J310 are short-circuited, JP501 is open, and JP503 is open. Therefore, be sure to connect the power supply to the external power supply pin when using it.
  • Page 261 ST2840 Series Automatic Transformer Test System Description for Handler Figure 10-15 PLC Wiring Diagram Where Handler Interface and Input Circuit Are Common Anode v1.1...
  • Page 262 ST2840 Series Automatic Transformer Test System Description for Handler Figure 10-16 PLC Wiring Diagram Where Handler Interface and Input Circuit Are Common Anode The wiring method provided in this figure is a typical connection method, and it needs to be flexibly applied according to the actual situation in practical application.
  • Page 263 ST2840 Series Automatic Transformer Test System Description for Handler Figure 10-17 PLC Wiring Diagram Where Handler Interface and Input Circuit Are Common Cathode v1.1...
  • Page 264: Using The Transformer Scan Function

    There are also pin definitions corresponding to the different handler modes on this page. 10.5 Sorting of Scanning Fixtures ST2840AX, ST2840BX and ST2840NX are compatible with ST1901, ST1831, ST1806 series scan boxes. The ST1831 scan box pin definition is exactly the same as the Handler definition of the ST2840 built-in scan board. v1.1...
  • Page 265 SOURCETRONIC GMBH Fahrenheitstrasse 1 28359 Bremen Germany T +49 421 2 77 99 99 F +49 421 2 77 99 98 info@sourcetronic.com www.sourcetronic.com www.sourcetronic.com...

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