Omron Xpectia-FZ3 Series Quick Manual

Vision system
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Cat.No. Q29E-EN-01
Xpectia-FZ3 Series
Vision System
SHORT OPERATION MANUAL

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Summary of Contents for Omron Xpectia-FZ3 Series

  • Page 1 Cat.No. Q29E-EN-01 Xpectia-FZ3 Series Vision System SHORT OPERATION MANUAL...
  • Page 3 Vision System Xpectia-FZ3 Series Short Operation Manual...
  • Page 5: Table Of Contents

    Basic Configuration of FZ3 Series........
  • Page 6 SECTION 5 Output result ........
  • Page 7: Before Operation

    This product is a vision sensor for performing image processing measurement through a controller of objects photographed using a camera.By connecting an external device such as a PC, measurement commands can be input and measurement results can be output from the external device.
  • Page 8: Preparing Controllers And Cameras

    When using an auto-focus camera or an intelligent camera, focus and the iris can be automatically adjusted. Note If a camera is used together with a lens, turn the focus ring of the lens to adjust the focus. The light intensity of an intelligent camera can be adjusted from the controller.
  • Page 9: Software Overview

    Software Overview Section 1-3 Software Overview Application-oriented measurement can be configured by combining process- ing items or changing the settings of processing items.
  • Page 10 Software Overview Section 1-3...
  • Page 11: Basic Operation

    Basic Operation What is a Scene A combination of processing items is called a „scene“ and scenes can be eas- ily created by combining processing items that are suited to the measurement purpose from the list of processing items provided.
  • Page 12: Scene Examples

    1. Tap „Scene switch“ in the toolbar on the Main screen. The Switch Scene window is displayed. Note The same operation is available by tapping [Scene] menu - [Scene switch]. 2. Tap [ ] to select the scene to switch.
  • Page 13: Create A Scene

    Section 2-2 Create a Scene In the Edit Flow window, editing buttons in the window can be used to change the order of processing units within the scene or to delete processing units. Specifying the position for a processing unit...
  • Page 14: Property Window Of Processing Items

    Create a Scene Section 2-2 2-2-1 Property window of Processing items This window is used for detailed setting of measurement parameters and judgement conditions for processing items. All of Processing items have simi- lar layout. a) Item Tab Area Displays the settings items for the processing unit currently being set.
  • Page 15: Processing Item Guideline

    Define and perform measurement with display of the results. 1. Tap [Edit flow] in Toolbar. The Edit Flow window is displayed. 2. Select a processing item to be added from the processing item tree. 3. Tap [Append]. 4. To continue to add processing units. Repeat step 3.
  • Page 16 Processing Item Guideline Section 2-3 5. Either tap the icon of the processing unit to be set or tap the Set button. The property setting window is displayed.Set detailed conditions. The dis- played contents vary depending on the processing item.
  • Page 17: Position Compensation

    Processing Item Guideline Section 2-3 2-3-1 Position Compensation...
  • Page 18: Locating (Measurement Objects Not Inclined)

    Processing Item Guideline Section 2-3 2-3-2 Locating (Measurement Objects Not Inclined)
  • Page 19: Locating (Measurement Objects Inclined)

    Processing Item Guideline Section 2-3 2-3-3 Locating (Measurement Objects Inclined) 2-3-4 Internal and External Inspection...
  • Page 20: Presence Inspection

    Processing Item Guideline Section 2-3 2-3-5 Presence Inspection 2-3-6 Dimension Inspection/Measurement...
  • Page 21: Burr Inspection

    Processing Item Guideline Section 2-3 2-3-7 Burr Inspection 2-3-8 Text Comparison/Inspection...
  • Page 22: Defect/Contamination Inspection

    Processing Item Guideline Section 2-3 2-3-9 Defect/Contamination Inspection 2-3-10 Quantity Inspection/Measurement...
  • Page 23: Inspection For Presence Of Different Objects

    2-3-12 Hole Position Measurement 2-3-13 Selecting Measurement Processing Items According to the Measurement Method and Purpose This section describes methods for selecting processing items appropriate to different measurement objectives such as counting quantities, checking for deformation, and checking for contamination.
  • Page 24 Processing Item Guideline Section 2-3...
  • Page 25: Processing Item Overview

    Search Register the feature sections of the measurement object as an image pattern (model), then find the most similar part to these models from the input images to detect the position. The correlation value showing the degree of similarity, measurement object position, and inclination can be output.
  • Page 26: Flexible Search

    Model Registration (Flexible Search) Register the parts to measure as the model. A total of 5 models, 0 through 4, can be registered, with no restriction on the size. If a model has different printing qualities and shapes, more than one models should be registered.
  • Page 27: Sensitive Search

    Sensitive Search The registered models are automatically finely divided and matched in detail.Of the divided models, the one with the lowest correlation is output. Sensitive search is suitable when the difference between the model image and measurement image is small and regular searches do not produce differ- ences in correlation.
  • Page 28: Ecm Search

    (model), and measures its correlation value (similarity) and position. In a normal search, image pattern models are used that look at the color and light/dark information, but in an ECM search, models are used that look at the profile information.Therefore, this processing assures a reliable search even...
  • Page 29: Ec Circle Search

    (model), and measures its circle evalu- ated value (similarity) and position.In a normal search, image pattern models are used that look at the color and light/dark information. In EC Circle Search, however, models are used that look at the profile.Therefore, this processing assures a reliable search even for low-contrast or noisy images.It is also pos-...
  • Page 30: Classification

    Model Registration (Classification) Pre-register as models the sections to be used as reference for classification. Models can be registered with any of 36 indexes, from 0 to 35, and up to 5 models can be registered for each index. When there is variation among the model print quality and shapes, pre-regis-...
  • Page 31: Edge Position

    Using a Expression, the width of a measurement object can be calculated from the difference between two edge positions. • The edge is scanned from the start point of the area toward the end point. When setting up the measurement region, pay attention to the detection di- rection of the edge.
  • Page 32: Edge Pitch

    Edge Pitch Section 3-8 Edge Pitch Finds and counts the edges by measuring the color change within the mea- surement region. • When calculating number of pins of IC or connectors • To calculate the pin width and the distance (pitch) between mid-points between two pins •...
  • Page 33: Scan Edge Position

    • Detailed information, such as the closest point or furthest point from the measurement start point, can be calculated. • The inclination or degree of unevenness of the measured object can be calculated.
  • Page 34: Judgment Conditions (Scan Edge Position)

    Scan Edge Position Section 3-9 3-9-1 Judgment Conditions (Scan Edge Position)
  • Page 35: Scan Edge Width

    Scan Edge Width Section 3-10 3-10 Scan Edge Width This processing item detects the position of the measurement object by using the change in color within the measurement region.By dividing the measure- ment region, you can get the following values.
  • Page 36: Color Data

    Section 3-11 3-11 Color Data Inspect by finding the average color of the measurement region and using its difference from the registered reference color and the color variation in the measurement area.Alternatively, you can only detect the color tone while neglect the effect of image brightness.
  • Page 37: Gravity And Area

    3-12 Gravity and Area Inspect using the area of the specified color. Used in the Following Case • Label deviation measurement • Detection of defects, contamination, and stains of measurement objects whose appearance is not defined Setting item Set value...
  • Page 38: Labeling

    Labeling Section 3-13 3-13 Labeling You can count the number of labels with a specified color or find the area and center of gravity of a specified label number. Used in the Following Case • Label count inspection...
  • Page 39 Outside trimming • Checked This option can be used only when there is a section of the • [Unchecked] designated color in the mea- surement region that does not need to be measured. When „Checked“ is set, the...
  • Page 40: Label Data

    You can specify a desired label number and obtain measurement values for that label stored by other processing units. The processing items that can be set up as reference objects are the following items that perform the labeling processing. • Labeling Used in the Following Case •...
  • Page 41: Defect

    3-15 Defect Detect defects and contamination using color variation within the measure- ment region. This is real color processing, so even if defect and contamination colors change or the background color changes, stable inspection is possible. Used in the Following Case •...
  • Page 42: Region Setting (Defect)

    Description Wide line Selected when detecting defects and burrs of the measure- ment objects. Wide circle, wide arc Selected when detecting defects and burrs of the circle measurement objects. Rectangle, ellipse Selected when detecting the overall defects of specified zones (circle), polygon and measurement objects.
  • Page 43 Defect judgement 0 to 999 [100] Specify the upper limit for defect judgement. (The lower limit is fixed at 0.) When „30“ is set, the OK value should be within the range of 0 to 30. Area judgement 0 to A_MAX Specify the maximum defect area.
  • Page 44: Precise Defect

    Defects and contamination on plain measurement objects can be detected with high precision by performing differential processing on the image.By changing the size of elements used for detection, comparison intervals, etc., fine customization of speed and precision is possible. Setting item...
  • Page 45 For example, if the sam- pling interval Y is set to 4 and the comparing interval Y is set to 2, comparison is with sepa- rate elements of 4 x 2 = 8 pixels along the Y axis. Direction • X (circumferential) Set the direction for detecting defects.
  • Page 46: Fine Matching

    Fine Matching Section 3-17 3-17 Fine Matching Differences can be detected in a fast and highly precise way by overlapping registered fine images with input images (matching). Used in the Following Case • To precisely detect trivial defects at the edges of text and patterns...
  • Page 47: Circle Angle

    Circle Angle Section 3-18 3-18 Circle Angle • To correct the tilting of circle measurement objects • When drawing the measurement region, the featured part should lie on the circumference.
  • Page 48: Model Dictionary

    • To create the dictionary to be used for Character Inspection and Date Verification 3-19-1 Model Automatic Registration (Model Dictionary) This method encloses a character string, cuts out one character at a time from it and registers them as models. 1. In the Item Tab area, tap [Auto registration].
  • Page 49: Character Inspection

    Character Inspection Section 3-20 3-20 Character Inspection Using model images registered in a [Model Dictionary], this processing item performs character recognition by correlation searches. • When identifying standard character data (check of product model name) Setting item Set value [Factory default]...
  • Page 50: Date Verification

    Date Verification Section 3-21 3-21 Date Verification This processing item creates a target string from the current date/time and compares it with read-in strings. • When inspecting date of manufacture Label Description 0 to 9 Normal numeric value input A to Z Normal alphabet input ‘...
  • Page 51 The last two digits of the year after a set period of time vYYYY Four digits of the year after a set period of time Two digits of the year after a set period of time in the Japanese Heisei calendar Month after a set period of time...
  • Page 52 Date Verification Section 3-21...
  • Page 53: Support Measurement Functions

    This enables preparation of logging conditions using an expression and is more flexible than the system image logging conditions settings. However, the settings of this unit are enabled if „None“ is set on the [Logging setting] of the main screen [Measure] menu.
  • Page 54 Image Logging Section 4-1...
  • Page 55: Output Result

    PC with the no-order mode via the serial interface. 5-1-1 Settings (Data Output) Set up the output contents with the expression. Up to 8 expressions including 0 to 7 can be set in each unit. Set value Description [factory default]...
  • Page 56 Data Output Section 5-1...
  • Page 57: Compensate Image

    • Even with different positions for the same measurement object, correct measurement can still be performed by correcting the position of the input image.There is no need to reposition the measurement object itself.
  • Page 58: Revision History

    Revision history A manual revision code appears as a suffix to the catalog number on the front cover of the manual. Cat. No. Q29E-EN-01 Revision code The following table outlines the changes made to the manual during each revision. Page numbers refer to the previous version.

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