Connecting The Test Equipment To The Ied; Releasing The Function To Be Tested - Hitachi RER670 Commissioning Manual

Section 9
Testing IED operation
currents are restored and any re-energizing transients are given a chance to decay before the trip
circuits are restored. When the latches are released, the handle can be completely withdrawn from
the test switch, restoring the trip circuits to the protection IED.
If a test switch is not used, perform measurement according to the provided circuit diagrams.
9.4

Connecting the test equipment to the IED

Connect the test equipment according to the IED specific connection diagram and the needed input
and output signals for the function under test. An example of a connection is shown in figure 9.
Connect the current and voltage terminals. Pay attention to the current polarity. Make sure that the
connection of input and output current terminals and the connection of the residual current conductor
is correct. Check that the input and output logical signals in the logic diagram for the function under
test are connected to the corresponding binary inputs and outputs of the IED under test.
IEC09000652 V1 EN-US
Figure 9:
9.5

Releasing the function to be tested

Release or unblock the function to be tested. This is done to ensure that only the function or the
chain of functions to be tested are in operation and that other functions are prevented from operating.
Release the tested function(s) by setting the corresponding Blocked parameter under Function test
modes to No in the local HMI .
58
Never disconnect the secondary connection of a current transformer circuit without
first short-circuiting the transformer's secondary winding. Operating a current
transformer with the secondary winding open will cause a massive potential build up
that may damage the transformer and cause personal injury.
To ensure correct results, make sure that the IED as well as the test equipment are
properly earthed before testing.
IL1
IL2
IL3
IN
UL1
UL2
UL3
UN
IEC 61850
Connection example of the test equipment to the IED when test equipment is
connected to the transformer input module
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IL1
IL2
IL3
IN (I4,I5)
UL1
UL2
UL3
UN
UN (U4,U5)
TRIP L1
TRIP L2
TRIP L3
IEC09000652-1-en.vsd
1MRK 506 377-UEN Rev. L
M11744-2 v9
M11413-2 v8
Railway application RER670
Commissioning manual